Showing 1 - 20 results of 126 Refine Results
  1. 1
    Conference

    Authors: Lin, Derek

    Source: 2022 IEEE International Conference on Big Data (Big Data) Big Data (Big Data), 2022 IEEE International Conference on. :4295-4302 Dec, 2022

    Relation: 2022 IEEE International Conference on Big Data (Big Data)

  2. 2
    Conference

    Source: 2020 IEEE International Conference on Big Data (Big Data) Big Data (Big Data), 2020 IEEE International Conference on. :2610-2618 Dec, 2020

    Relation: 2020 IEEE International Conference on Big Data (Big Data)

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  4. 4
    Conference

    Source: 2018 IEEE International Conference on Big Data (Big Data) Big Data (Big Data), 2018 IEEE International Conference on. :2972-2979 Dec, 2018

    Relation: 2018 IEEE International Conference on Big Data (Big Data)

  5. 5
    Conference

    Source: 2018 IEEE International Conference on Big Data (Big Data) Big Data (Big Data), 2018 IEEE International Conference on. :2980-2985 Dec, 2018

    Relation: 2018 IEEE International Conference on Big Data (Big Data)

  6. 6
    Conference

    Source: 2017 IEEE International Conference on Data Mining Workshops (ICDMW) ICDMW Data Mining Workshops (ICDMW), 2017 IEEE International Conference on. :797-803 Nov, 2017

    Relation: 2017 IEEE International Conference on Data Mining Workshops (ICDMW)

  7. 7
    Conference

    Source: 2017 IEEE International Conference on Data Mining Workshops (ICDMW) ICDMW Data Mining Workshops (ICDMW), 2017 IEEE International Conference on. :804-811 Nov, 2017

    Relation: 2017 IEEE International Conference on Data Mining Workshops (ICDMW)

  8. 8
    Conference

    Source: 2020 International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2020 International. :91-92 Oct, 2020

    Relation: 2020 International SoC Design Conference (ISOCC)

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  14. 14
    Conference

    Source: 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on. :89-90 Apr, 2008

    Relation: 2008 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)

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