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1Conference
Authors: Jiang, Chen Yu, Chen, Qiang, Lei, Baimao, He, Zhanyu
Source: 2024 6th International Conference on System Reliability and Safety Engineering (SRSE) System Reliability and Safety Engineering (SRSE), 2024 6th International Conference on. :26-31 Oct, 2024
Relation: 2024 6th International Conference on System Reliability and Safety Engineering (SRSE)
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2Conference
Authors: Li, Qian, Li, Yaqiu, Pan, Guangze, Zhu, JiaWei, Lei, Baimao, Li, Xiaobing
Source: 2018 12th International Conference on Reliability, Maintainability, and Safety (ICRMS) Reliability, Maintainability, and Safety (ICRMS), 2018 12th International Conference on. :413-418 Oct, 2018
Relation: 2018 12th International Conference on Reliability, Maintainability, and Safety (ICRMS)
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3Academic Journal
Authors: Li, Yaqiu a, d, Zhou, Qijie a, d, Fan, Ye b, Pan, Guangze a, c, ∗, Dai, Zongbei a, Lei, Baimao a
Source: In Heliyon 29 February 2024 10(4)
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4Academic Journal
Authors: Ye, Zhipeng, Zhu, Jiawei, Li, Qian, Mo, Bing, Lei, Baimao, Li, Yaqiu, Wang, Chunhui, Huang, Chuangmian
Source: In Microelectronics Reliability September 2018 88-90:1151-1156
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5Academic Journal
Authors: Jiang, Chenyu1,2 (AUTHOR), Chen, Qiang1,2 (AUTHOR), Lei, Baimao1,2 (AUTHOR) leibaimao@126.com
Source: Quality & Reliability Engineering International. Nov2024, p1. 20p. 13 Illustrations.
Subject Terms: *STATISTICAL reliability, *MARKOV processes, *ENGINEERING equipment, *STATISTICS, *INDUSTRIAL safety
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6Periodical
Authors: Li, Yaqiu, Zhu, Jiawei, Sun, Qiang, Yang, Linsen, Zhan, Qin, Lei, Baimao
Source: He ji shu. 41(11):110402-110402