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1Conference
Authors: Lee, F.M., Tseng, P. H., Lin, Y. Y., Lin, Y. H., Weng, W. L., Lin, N. C., Sung, P. J., Yang, C. C., Wu, W. F., Shen, C. H., Chen, P. H., Lee, Y. H., Lee, M. H., Wang, K. C., Lu, C. Y.
Source: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Relation: 2023 International Electron Devices Meeting (IEDM)
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2Report
Authors: Cuomo, V., Morelli, L., Aguerri, J. A. L., Corsini, E. M., Debattista, V. P., Coccato, L., Pizzella, A., Boselli, A., Buttitta, C., de Lorenzo-Cáceres, A., Ferrarese, L., Gasparri, D., Lee, Y. H., Mendez-Abreu, J., Roediger, J., Zarattini, S.
Subject Terms: Astrophysics - Astrophysics of Galaxies
Access URL: http://arxiv.org/abs/2312.14017
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3Conference
Authors: Alagiasundaram, S., Lee, K.Y., Lim, E.H., Chee, P.S., Lee, Y.-H.
Source: 2021 IEEE Asia-Pacific Conference on Applied Electromagnetics (APACE) Applied Electromagnetics (APACE), 2021 IEEE Asia-Pacific Conference on. :1-4 Dec, 2021
Relation: 2021 IEEE Asia-Pacific Conference on Applied Electromagnetics (APACE)
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4Academic Journal
Authors: Lee, Y.-H. a, Lai, Y.-C. a, Hsu, M.-Y. a, Tsai, C.-Y. b, Yeh, T.-S. b, Chen, C.-M. a, ⁎
Source: In Clinical Radiology January 2025 80
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5Conference
Authors: Hung, S.C., Chen, S.C., Chien, P.S., Cho, Y.S., Lee, Y.-H., Hung, W.S.
Source: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021
Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)
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6Conference
Authors: Truna, M. N., Mat, D.A.A., Lee, Y. H., Zaidel, Dyg N. A., Kho, L.C., Annie, J., Kuryati, K.
Source: 2020 13th International UNIMAS Engineering Conference (EnCon) Engineering Conference (EnCon), 2020 13th International UNIMAS. :1-4 Oct, 2020
Relation: 2020 13th International UNIMAS Engineering Conference (EnCon)
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7Report
Authors: Cuomo, V., Corsini, E. M., Morelli, L., Aguerri, J. A. L., Lee, Y. H., Coccato, L., Pizzella, A., Buttitta, C., Gasparri, D.
Subject Terms: Astrophysics - Astrophysics of Galaxies
Access URL: http://arxiv.org/abs/2206.06548
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8Conference
Authors: Huang, Y-H., Liao, P. J., Lee, Y-H., Chen, M. J., Ho, T.Y., Chang, Lucy
Source: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018
Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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9Conference
Authors: Jang, H. G., Jung, D. Y., Kim, M., Park, J., Park, J.M., Lee, Y. H.
Source: 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) Circuits/Systems, Computers and Communications (ITC-CSCC), 2019 34th International Technical Conference on. :1-3 Jun, 2019
Relation: 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
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10Report
Authors: Arzoumanian, D., Furuya, R., Hasegawa, T., Tahani, M., Sadavoy, S., Hull, C. L. H., Johnstone, D., Koch, P. M., Inutsuka, S. -i., Doi, Y., Hoang, T., Onaka, T., Iwasaki, K., Shimajiri, Y., Inoue, T., Peretto, N., André, P., Bastien, P., Berry, D., Chen, H. -R. V., Di Francesco, J., Eswaraiah, C., Fanciullo, L., Fissel, L. M., Hwang, J., Kang, J. -h., Kim, G., Kim, K. -T., Kirchschlager, F., Kwon, W., Lee, C. W., Liu, H. -L., Lyo, A. -R., Pattle, K., Soam, A., Tang, X., Whitworth, A., Ching, T. -C., Coudé, S., Wang, J. -W., Ward-Thompson, D., Lai, S. -P., Qiu, K., Bourke, T. L., Byun, D. -Y., Chen, M., Chen, Z., Chen, W. P., Cho, J., Choi, Y., Choi, M., Chrysostomou, A., Chung, E. J., Dai, S., Diep, P. N., Duan, H. -Y., Duan, Y., Eden, D., Fiege, J., Franzmann, E., Friberg, P., Fuller, G., Gledhill, T., Graves, S., Greaves, J., Griffin, M., Gu, Q., Han, I., Hatchell, J., Hayashi, S., Houde, M., Jeong, I. -G., Kang, M., Kang, S. -j., Kataoka, A., Kawabata, K., Kemper, F., Kim, M. -R., Kim, K. H., Kim, J., Kim, S., Kirk, J., Kobayashi, M. I. N., Konyves, V., Kusune, T., Kwon, J., Lacaille, K., Law, C. -Y., Lee, C. -F., Lee, Y. -H., Lee, S. -S., Lee, H., Lee, J. -E., Li, H. -b., Li, D., Liu, J., Liu, T., Liu, S. -Y., Lu, X., Mairs, S., Matsumura, M., Matthews, B., Moriarty-Schieven, G., Nagata, T., Nakamura, F., Nakanishi, H., Ngoc, N. B., Ohashi, N., Park, G., Parsons, H., Pyo, T. -S., Qian, L., Rao, R., Rawlings, J., Rawlings, M., Retter, B., Richer, J., Rigby, A., Saito, H., Savini, G., Scaife, A., Seta, M., Shinnaga, H., Tamura, M., Tang, Y. -W., Tomisaka, K., Tram, L. N., Tsukamoto, Y., Viti, S., Wang, H., Xie, J., Yen, H. -W., Yoo, H., Yuan, J., Yun, H. -S., Zenko, T., Zhang, G., Zhang, C. -P., Zhang, Y., Zhou, J., Zhu, L., de Looze, I., Dowell, C. D., Eyres, S., Falle, S., Friesen, R., Robitaille, J. -F., van Loo, S.
Source: A&A 647, A78 (2021)
Subject Terms: Astrophysics - Astrophysics of Galaxies
Access URL: http://arxiv.org/abs/2012.13060
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11Report
Authors: Aggarwal, Nancy, Schnabel, Allard, Voigt, Jens, Brown, Alex, Long, Josh C, Trahms, L., Fang, A., Geraci, Andrew, Kapitulnik, A., Kim, D., Kim, Y., Lee, I., Lee, Y. H., Liu, C. Y., Lohmeyer, C., Reid, A., Semertzidis, Y., Shin, Y., Shortino, J., Smith, E., Snow, W. M., Weisman, E.
Access URL: http://arxiv.org/abs/2011.12617
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12Report
Authors: Eden, D. J., Moore, T. J. T., Currie, M. J., Rigby, A. J., Rosolowsky, E., Su, Y., Kim, Kee-Tae, Parsons, H., Morata, O., Chen, H. -R., Minamidani, T., Park, Geumsook, Ragan, S. E., Urquhart, J. S., Rani, R., Tahani, K., Billington, S. J., Deb, S., Figura, C., Fujiyoshi, T., Joncas, G., Liao, L. W., Liu, T., Ma, H., Tuan-Anh, P., Yun, Hyeong-Sik, Zhang, S., Zhu, M., Henshaw, J. D., Longmore, S. N., Kobayashi, M. I. N., Thompson, M. A., Ao, Y., Campbell-White, J., Ching, T. -C., Chung, E. J., Duarte-Cabral, A., Fich, M., Gao, Y., Graves, S. F., Jiang, X. -J., Kemper, F., Kuan, Y. -J., Kwon, W., Lee, C. W., Lee, J. -E., Liu, M., Penaloza, C. H., Peretto, N., Phuong, N. T., Pineda, J. E., Plume, R., Puspitaningrum, E., Samal, M. R., Soam, A., Sun, Y., Tang, X. D., Traficante, A., White, G. J., Yan, C. -H., Yang, A., Yuan, J., Yue, N., Bemis, A., Brunt, C. M., Chen, Z., Cho, J., Clark, P. C., Cyganowski, C. J., Friberg, P., Fuller, G. A., Han, I., Hoare, M. G., Izumi, N., Kim, H. -J., Kim, J., Kim, S., Koch, E. W., Kuno, N., Lacialle, K. M., Lai, S. -P., Lee, H. Lee Y. -H., Li, D. L., Liu, S. -Y., Mairs, S., Oka, T., Pan, Z., Qian, L., Scicluna, P., Shi, C. -S., Shi, H., Srinivasan, S., Tan, Q. -H., Thomas, H. S., Torii, K., Trejo, A., Umemoto, T., Violino, G., Wallstrom, S., Wang, B., Wu, Y., Yuan, L., Zhang, C., Zhang, M., Zhou, C., Zhou, J. J.
Subject Terms: Astrophysics - Astrophysics of Galaxies, Astrophysics - Solar and Stellar Astrophysics
Access URL: http://arxiv.org/abs/2009.05073
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13Conference
Authors: Liao, P.J., Chang, Y.K., Lee, Y.-H., Lin, Y.M., Yeong, S.H., Hwang, R.L., Hou, V., Nien, C.H., Lu, R., Lin, C.T.
Source: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Relation: 2021 Symposium on VLSI Technology
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14Conference
Authors: Wu, C. H., Lee, C. M., Chen, Y. S., Lee, H. Y., Ambrosi, E., Hsu, C. F., Vaziri, S., Chen, Y. Y., Nien, C. H., Hwang, R. L., Liao, P. J., Hou, D. H., Lee, Y.-H., Lee, T. Y., Chen, T. C., Chang, M. F., Wong, H.-S. P., Bao, X. Y.
Source: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Relation: 2021 Symposium on VLSI Technology
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15Conference
Authors: Lee, Y. H., Park, D. J., Jung, Y. I., Yoo, S. C., Kim, H. G.
Source: TMS annual meeting & exhibition. 151(2):1345-1351
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16Conference
Authors: Lee, Y.-H., Lee, J. H., Tsai, Y.S., Mukhopadhyay, S., Wang, Y.F.
Source: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2017 International Conference on. :85-88 Sep, 2017
Relation: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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17Conference
Authors: Lee, Y.-H., Liao, P. J., Joshi, K., Huang, D. S.
Source: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2017 IEEE 24th International Symposium on the. :1-7 Jul, 2017
Relation: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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18Conference
Authors: Song, Y.W., Lee, Y.-H.
Source: 2017 IEEE International Parallel and Distributed Processing Symposium (IPDPS) IPDPS Parallel and Distributed Processing Symposium (IPDPS), 2017 IEEE International. :387-396 May, 2017
Relation: 2017 IEEE International Parallel and Distributed Processing Symposium (IPDPS)
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19Periodical
Authors: Lee, Y.-H., Wang, S.-C., Li, C.-H., Chen, L.-H., Shen, T.-C., Liu, Y.-F., Wang, Y.-C., Tsai, C.-W., Hsia, T.-C., Bau, D.-T.
Source: Anticancer research. 43(8):3447-3454
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20Periodical
Authors: Chen, Y.-L., Lin, C.-C., Chen, J.-H., Lee, Y.-H., Tzang, S.-Y.
Source: Renewable energy. 202:1-16