[Poster Session: 2012 IEEE Workshop on Microelectronics and Electron Devices (WMED)]

Authors: Qin, S., McDaniel, T., Liu, L.J., Burke, R., Hu, Y.J., McTeer, A., Pun, B., Mitkova, M., Miranda, P., Zoller, R., Seibert, M., Latif, M.R., Ailavajhala, M.S., Chen, P., Butt, D.P., Olesky, D., Velo, Y.G., Barnaby, H., Salvador, P., Ostyn, M., Parke, S., Rowe, T., Pearlman, M., Browning, J.

Source: 2012 IEEE Workshop on Microelectronics and Electron Devices Microelectronics and Electron Devices (WMED), 2012 IEEE Workshop on. :1-2 Apr, 2012

Relation: 2012 IEEE Workshop on Microelectronics and Electron Devices (WMED)

Surface patterning in Ge[sbnd]Se amorphous layers

Authors: Csarnovics, I., Veres, M., Nemec, P., Latif, M.R., Hawlova, P., Molnar, S., Kokenyesi, S.

Source: In Journal of Non-Crystalline Solids 1 March 2017 459:51-56

Studies of silver photodiffusion dynamics in Ag/Ge~xS~1~-~x (x = 0.2 and 0.4) films using neutron reflectometry
Amorphous and nanocrystalline semiconductors; Selected papers from the 25th international conference, Toronto, Canada, 18-23 August 2013 =: Selection d'articles de la 25eme conference sur les semi-conducteurs amorphes et nanocristallins, Toronto, Canada, 18-23 aout 2013

Authors: Sakaguchi, Y., Asaoka, H., Uozumi, Y., Kawakita, Y., Ito, T., Kubota, M., Yamazaki, D., Soyama, K., Ailavajhala, M., Latif, M.R.

Source: CANADIAN JOURNAL OF PHYSICS. 92(7/8):654-658

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN088039712&indx=1&recIds=ETOCCN088039712

Photolithography-free Ge-Se based memristive arrays; materials characterization and device testing
Amorphous and nanocrystalline semiconductors; Selected papers from the 25th international conference, Toronto, Canada, 18-23 August 2013 =: Selection d'articles de la 25eme conference sur les semi-conducteurs amorphes et nanocristallins, Toronto, Canada, 18-23 aout 2013

Authors: Latif, M.R., Csarnovics, I., Kokenyesi, S., Csik, A., Mitkova, M.

Source: CANADIAN JOURNAL OF PHYSICS. 92(7/8):623-628

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN088039656&indx=1&recIds=ETOCCN088039656

Photolithography-free Ge-Se based memristive arrays; materials characterization and device testing¹.

Authors: Latif, M.R., Csarnovics, I.^1,2, Kökényesi, S.², Csik, A.³, Mitkova, M.¹

Source: Canadian Journal of Physics. Jul2014, Vol. 92 Issue 7/8, p623-628. 6p. 3 Diagrams, 4 Graphs.

Subject Terms: *PHOTOLITHOGRAPHY, *GERMANIUM, *LITHOGRAPHY, *SEMIMETALS, *SURFACE roughness

Studies of silver photodiffusion dynamics in Ag/Ge xS1− x ( x = 0.2 and 0.4) films using neutron reflectometry1.

Authors: Sakaguchi, Y., Asaoka, H.¹, Uozumi, Y.¹, Kawakita, Y.¹, Ito, T.², Kubota, M.¹, Yamazaki, D.¹, Soyama, K.¹, Ailavajhala, M.³, Latif, M.R.³, Mitkova, M.³

Source: Canadian Journal of Physics; Jul2014, Vol. 92 Issue 7/8, p654-658, 5p, 10 Graphs

Photolithography-free Ge-Se based memristive arrays; materials characterization and device testing¹.

Authors: Latif, M.R., Csarnovics, I.^1,2, Kökényesi, S.², Csik, A.³, Mitkova, M.¹

Source: Canadian Journal of Physics; Jul2014, Vol. 92 Issue 7/8, p623-628, 6p, 3 Diagrams, 4 Graphs

Studies of silver photodiffusion dynamics in Ag/Ge xS1− x ( x = 0.2 and 0.4) films using neutron reflectometry¹.

Authors: Sakaguchi, Y., Asaoka, H.¹, Uozumi, Y.¹, Kawakita, Y.¹, Ito, T.², Kubota, M.¹, Yamazaki, D.¹, Soyama, K.¹, Ailavajhala, M.³, Latif, M.R.³, Mitkova, M.³

Source: Canadian Journal of Physics; Jul2014, Vol. 92 Issue 7/8, p654-658, 5p, 10 Graphs

Photolithography-free Ge-Se based memristive arrays; materials characterization and device testing¹.

Authors: Latif, M.R., Csarnovics, I., Kökényesi, S., Csik, A., Mitkova, M.

Source: Canadian Journal of Physics; Jul2014, Vol. 92 Issue 7/8, p623-628, 6p, 3 Diagrams, 4 Graphs

Subject Terms: PHOTOLITHOGRAPHY, GERMANIUM, LITHOGRAPHY, SEMIMETALS, SURFACE roughness

Studies of silver photodiffusion dynamics in Ag/Ge xS1− x ( x = 0.2 and 0.4) films using neutron reflectometry¹.

Authors: Sakaguchi, Y., Asaoka, H., Uozumi, Y., Kawakita, Y., Ito, T., Kubota, M., Yamazaki, D., Soyama, K., Ailavajhala, M., Latif, M.R., Mitkova, M.

Source: Canadian Journal of Physics; Jul2014, Vol. 92 Issue 7/8, p654-658, 5p, 10 Graphs

Subject Terms: SILVER, DIFFUSION, SOLID solutions, TRANSITION metals, CHALCOGENIDES

Studies of silver photodiffusion dynamics in Ag/Ge xS1− x ( x = 0.2 and 0.4) films using neutron reflectometry¹.

Authors: Sakaguchi, Y., Asaoka, H.¹, Uozumi, Y.¹, Kawakita, Y.¹, Ito, T.², Kubota, M.¹, Yamazaki, D.¹, Soyama, K.¹, Ailavajhala, M.³, Latif, M.R.³, Mitkova, M.³

Source: Canadian Journal of Physics. Jul2014, Vol. 92 Issue 7/8, p654-658. 5p. 10 Graphs.

Subject Terms: *SILVER, *DIFFUSION, *SOLID solutions, *TRANSITION metals, *CHALCOGENIDES