On the Role of NBTI and PBTI Induced Mobility Degradation for Compact Modeling in Metal-Gate/High-k FETs

Authors: Bogner, Christian, Reisinger, Hans, Lahbib, Insaf, Martin, Andreas, Gustin, Wolfgang, Grasser, Tibor, Schlunder, Christian

Source: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-7 Oct, 2023

Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

RF SPST Switch Based on Innovative Heterogeneous GaN/SOI Integration Technique

Authors: Drillet, Frederic, Loraine, Jerome, Saleh, Hassan, Lahbib, Imene, Grandchamp, Brice, Iogna-Prat, Lucas, Lahbib, Insaf, Sow, Ousmane, Uren, Gregory

Source: 2020 15th European Microwave Integrated Circuits Conference (EuMIC) Microwave Integrated Circuits Conference (EuMIC), 2020 15th European. :117-120 Jan, 2021

Relation: 2020 15th European Microwave Integrated Circuits Conference (EuMIC)

Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits

Authors: Lange, Andre, Gonzalez, Fabio A. Velarde, Lahbib, Insaf, Crocoll, Sonja

Source: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2019 49th European. :186-189 Sep, 2019

Relation: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)

Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism

Authors: Lahbib, Insaf, Doukkali, Aziz, Martin, Patrick, Descamps, Philippe, Imbert, Guy

Source: IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society Industrial Electronics Society , IECON 2017 - 43rd Annual Conference of the IEEE. :7969-7973 Oct, 2017

Relation: IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society

Reliability analysis of low noise amplifiers for wireless applications under high RF power stressing

Authors: Doukkali, Aziz, Lahbib, Insaf, Gamand, Patrice, Martin, Patrick, Lesenechal, Dominique, Descamps, Philippe

Source: 2017 International Conference on Advanced Technologies for Communications (ATC) Advanced Technologies for Communications (ATC), 2017 International Conference on. :132-135 Oct, 2017

Relation: 2017 International Conference on Advanced Technologies for Communications (ATC)

Reliability analysis of BiCMOS SiGe:C technology under aggressive conditions for emerging RF and mm-Wave applications

Authors: Lahbib, Insaf, Wane, Sidina, Lesenechal, Dominique, Doukkali, Aziz, Dinh, Thanh Vinh, Leyssenne, Laurent, Germanicus, Rosine Coq, Bezerra, Franqoise, Rolland, Guy, Andrei, Cristian, Imbert, Guy, Martin, Patrick, Descamps, Philippe, Boguszewski, Guillaume, Bajon, Damienne

Source: 2017 12th European Microwave Integrated Circuits Conference (EuMIC) Microwave Integrated Circuits Conference (EuMIC), 2017 12th European. :147-150 Oct, 2017

Relation: 2017 12th European Microwave Integrated Circuits Conference (EuMIC)

Hot carrier injection and negative bias temperature instability induced NMOS and PMOS degradation on CMOS Ring Oscillator

Authors: Lahbib, Insaf, Doukkali, Mohamed Aziz, Martin, Patrick, Imbert, Guy

Source: 2016 Annual Reliability and Maintainability Symposium (RAMS) Reliability and Maintainability Symposium (RAMS), 2016 Annual. :1-7 Jan, 2016

Relation: 2016 Annual Reliability and Maintainability Symposium (RAMS)

Hot carrier injection effect on threshold voltage of NMOSFETs

Authors: Lahbib, Insaf, Doukkali, Aziz, Martin, Patrick, Imbert, Guy, Raoulx, Denis

Source: 2015 11th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) Ph.D. Research in Microelectronics and Electronics (PRIME), 2015 11th Conference on. :164-167 Jun, 2015

Relation: 2015 11th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)

Performance analysis of a lead-acid battery/supercapacitors hybrid and a battery stand-alone under pulsed loads

Authors: Lahbib, Insaf, Lahyani, Amine, Sari, Ali, Venet, Pascal

Source: 2014 First International Conference on Green Energy ICGE 2014 Green Energy, 2014 International Conference on. :273-278 Mar, 2014

Relation: 2014 International Conference on Green Energy

Optimal hybridization and amortized cost study of battery/supercapacitors system under pulsed loads

Authors: Lahyani, Amine, Sari, Ali, Lahbib, Insaf, Venet, Pascal

Source: In Journal of Energy Storage May 2016 6:222-231

RF Small and large signal characterization of a 3D integrated GaN/RF-SOI SPST switch.

Authors: Drillet, Frédéric, Loraine, Jérôme, Saleh, Hassan, Lahbib, Imene, Grandchamp, Brice, Iogna-Prat, Lucas, Lahbib, Insaf, Sow, Ousmane, Kumar, Albert, U'Ren, Gregory

Source: International Journal of Microwave & Wireless Technologies; Jul2021, Vol. 13 Issue 6, p517-522, 6p

Subject Terms: RADIO frequency, GALLIUM nitride, COPLANAR waveguides, WAVEGUIDES, MAGNETIC coupling

8 - Simulation of Degradation Phenomena in Semiconductor Components in order to Ensure the Reliability of Integrated Circuits

Authors: Lahbib, Insaf, Doukkali, Aziz, Martin, Patrick, Imbert, Guy, Descamps, Philippe, Defossez, Dominique

Source: In Reliability of High-Power Mechatronic Systems 1 2017:143-185

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Reliability analysis of BiCMOS SiGe:C technology under aggressive conditions for emerging RF and mm-wave applications: proposal of reliability-aware circuit design methodology.

Authors: Kallfass, Ingmar, Vossiek, Martin, A. Hein, Matthias, Lahbib, Insaf, Wane, Sidina, Doukkali, Aziz, Lesénéchal, Dominique, Dinh, Thanh Vinh, Leyssenne, Laurent, Germanicus, Rosine Coq, Bezerra, Françoise, Rolland, Guy, Andrei, Cristian, Imbert, Guy, Martin, Patrick, Descamps, Philippe, Boguszewski, Guillaume, Bajon, Damienne

Source: International Journal of Microwave & Wireless Technologies; Jun2018, Vol. 10 Issue 5/6, p690-699, 10p

List of Authors

Authors: Aoues, Younes, Defossez, Dominique, Delaux, David, Descamps, Philippe, Doukkali, Aziz, El Hami, Adbelkhalak, Fouchereau, Rémy, Grzeskowiak, Henri, Imbert, Guy, Jannoun, Mayssam, Lahbib, Insaf, Larivoire, Claire, Lhommeau, Tony, Makhloufi, Abderahman, Mathevet, Agnès, Martin, Patrick, Marty, Fabien, Meuret, Régis, Pagnacco, Emmanuel, Pierrat, Lambert, Pougnet, Philippe, Radi, Bouchaib, Rouland, Eric, Trias, Daniel, Yon, Sébastien

Source: In Reliability of High-Power Mechatronic Systems 1 2017:279-280