A 10.23-Bit ENOB 1 kS/s Differential VCO-Based ADC With Resistive Input Stage in Low-Temperature Poly-Silicon TFT Technology

Authors: Lou, Y., Zhang, H., Li, J., Lin, C., Shao, L., Guo, X., Li, Y., Wang, G., Rokhani, F., Zhao, J.

Source: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 72(2):359-363 Feb, 2025

High Performance 6V and 64.2dB LTPS TFT Operational Amplifier for Integrated Read-Out in Large Area Sensing Arrays

Authors: Faramarzi, Seyed Mojtaba Sadati, Siskos, Aris, Papadopoulos, Nikolas, Genoe, Jan, Myny, Kris

Source: 2024 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2024 31st IEEE International Conference on. :1-4 Nov, 2024

Relation: 2024 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS)

A Fully LTPS-TFT-Based Bidirectional Biomedical Interface Circuit for Large-Area Healthcare Applications

Authors: Zhang, H., Lou, Y., Zhang, Z., Li, Y., Rokhani, F.Z., Wang, G., Zhao, J.

Source: IEEE Journal on Flexible Electronics IEEE Flex. Electron. Flexible Electronics, IEEE Journal on. 3(12):526-532 Dec, 2024

High-Reliability HfO2/ZrO2 Superlattice Ferroelectric Poly-Si FinFET Memory Device Utilizing Green Laser Crystallization

Authors: Wei, C., Fang, Y., Yao, Y., Yang, C., Hou, F., Chen, C., Wu, Y.

Source: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(12):2272-2275 Dec, 2024

Bottom-Gate Poly-Si Thin Film Transistors Fabricated by Blue Laser Diode Annealing and Their Reliability Under DC and AC Bias Stresses

Authors: Billah, M.M., Kang, S., Jang, J., Alathbah, M.

Source: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(12):2415-2418 Dec, 2024

Modeling the Transient Characteristics with Trap Behaviors in LTPS-TFTs

Authors: Li, Haolin, Zhou, Zheng, Liu, Xiaoyan

Source: 2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT), 2024 IEEE 17th International Conference on. :1-3 Oct, 2024

Relation: 2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

Analysis of Distinct Degradation Behavior in LTPS TFTs Under Hot Carrier Condition with Varying Gate Voltage

Authors: Tu, Hong-Yi, Chang, Ting-Chang, Tsai, Tsung-Ming, Sun, Li-Chan, Kuo, Chen-Wei, Wu, Chia-Chuan, Chien, Ya-Ting

Source: 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) the Physical and Failure Analysis of Integrated Circuits (IPFA), 2024 IEEE International Symposium on. :01-06 Jul, 2024

Relation: 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Degradation Comparison of P-type Thin Film Transistor under Dynamic Gate Pulsed Stress

Authors: Tan, Xiangxu, Wang, Huaisheng, Wang, Mingxiang, Zhang, Dongli, Lv, Nannan

Source: 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) the Physical and Failure Analysis of Integrated Circuits (IPFA), 2024 IEEE International Symposium on. :01-05 Jul, 2024

Relation: 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

A 2.5 kHz 50.57 dB Linearized VCO ADC Using 6 µm LTPS TFTs

Authors: Lu, Wangzilu, Huang, Jiajie, Wang, Chao, Zhou, Ting, Zhao, Yang, Zhao, Jian, Li, Yongfu

Source: 2024 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2024 IEEE International Symposium on. :1-5 May, 2024

Relation: 2024 IEEE International Symposium on Circuits and Systems (ISCAS)

A Large-Area LTPS-TFT-Based Bi-directional Biomedical Interface with Process-Invariant In-pixel Biopotential-to-Digital Converters

Authors: Zhang, Hanbo, Lou, Yuqing, Zhang, Zhihang, Li, Yongfu, Rokhani, Fakhrul, Wang, Guoxing, Zhao, Jian

Source: 2024 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2024 IEEE International Symposium on. :1-5 May, 2024

Relation: 2024 IEEE International Symposium on Circuits and Systems (ISCAS)

Effects of Grain Size on Various Electrical Trap Extraction Methods in Low-Temperature Polysilicon Thin Films

Authors: Oh, J., Lee, W., Cha, M.G., Kim, H.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(10):6079-6084 Oct, 2024

Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED

Authors: Xia, Shiyu, Zhou, Longda, Wang, Kewei, Fan, Xiaobin, Xue, Yongkang, Shan, Qi, Wang, Hannian, Ren, Pengpeng, Ji, Zhigang, Huang, Ru

Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

Flexible TFT Read-Out Circuit Blocks for Large Area Sensor Array System Integration Measuring Photovoltaic Modules and Batteries

Authors: Mojtaba Sadati Faramarzi, S., Papadopoulos, N., Genoe, J., Myny, K.

Source: IEEE Journal on Flexible Electronics IEEE Flex. Electron. Flexible Electronics, IEEE Journal on. 3(7):334-340 Jul, 2024

The Characteristics and Reliability With Channel Length Dependent on the Deposited Sequence of SiO₂ and Si₃N₄ as PV in LTPS TFTs

Authors: Kuo, C., Tsai, T., Chang, T., Tu, H., Tsai, Y., Chen, J., Huang, I.

Source: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):268-274 Jun, 2024

Generalized Rapid TFT Modeling (GRTM) Framework for Agile Device Modeling With Thin-Film Transistors

Authors: Li, L., Li, J., Chen, C., Zhang, Y., Zhao, J., Li, Y., Guo, X.

Source: IEEE Journal on Flexible Electronics IEEE Flex. Electron. Flexible Electronics, IEEE Journal on. 3(5):190-196 May, 2024

An Active-Matrix Organic Light-Emitting Diode Display With Consistent Low-Luminance Levels Regardless of Temperature

Authors: Kim, N., Sim, D., Jeon, C., Choi, N., Hwang, H., Lee, S.

Source: IEEE Access Access, IEEE. 12:105346-105353 2024

Investigations on the Light-Induced Degradation of P-Channel Poly-Silicon Thin Film Transistors

Authors: Zhang, Yin, Wang, Huaisheng, Wang, Mingxiang, Zhang, Dongli, Lv, Nannan, Shan, Qi

Source: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-4 Jul, 2023

Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

An Active-Pixel Readout Circuit Technique towards all LTPS-TFT-on-foil Large-Area Imagers with Inherent Nonlinearity Compensation

Authors: Dandekar, Mohit, Myny, Kris, Dehaene, Wim

Source: 2023 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2023 IEEE International Symposium on. :1-5 May, 2023

Relation: 2023 IEEE International Symposium on Circuits and Systems (ISCAS)

Always-on Low Standby Power Active Pressure Sensor Pixel Based on LTPO Hybrid Thin Film Transistor Integration

Authors: Zhang, Chengrong, Ouyang, Bang, Deng, Li'ang, Guo, Xiaojun

Source: 2023 IEEE International Flexible Electronics Technology Conference (IFETC) Flexible Electronics Technology Conference (IFETC), 2023 IEEE International. :01-03 Aug, 2023

Relation: 2023 IEEE International Flexible Electronics Technology Conference (IFETC)

A 66.67kHz 4.953 nJ/Conv-Step 5b Fully Integrated Asynchronous SAR ADC Using $\mathbf{4} \boldsymbol{\mu}\mathbf{m}$ LTPS TFTs

Authors: Li, Hongtian, Liu, Jialong, Tang, Wenjun, Yang, Huazhong, Jiang, Chen, Zhang, Sheng, Li, Xueqing

Source: 2023 IEEE International Flexible Electronics Technology Conference (IFETC) Flexible Electronics Technology Conference (IFETC), 2023 IEEE International. :1-3 Aug, 2023

Relation: 2023 IEEE International Flexible Electronics Technology Conference (IFETC)