Novel type of whisker-tip cantilever based on GaN microrods for atomic force microscopy

Authors: Gacka, Ewelina, Kunicki, Piotr, Łysik, Paulina, Gajewski, Krzysztof, Ciechanowicz, Paulina, Pucicki, Damian, Majchrzak, Dominika, Gotszalk, Teodor, Piasecki, Tomasz, Busani, Tito, Rangelow, Ivo W., Hommel, Detlef

Source: In Ultramicroscopy June 2023 248

Soft lithography processing of fresnel lens for on-chip applications

Authors: Marczak, Jacek, Slupski, Piotr, Kunicki, Piotr, Komorowska, Katarzyna

Source: 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) Nanotechnology (IEEE-NANO) , 2015 IEEE 15th International Conference on. :975-978 Jul, 2015

Relation: 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO)

Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy

Authors: Gacka, Ewelina, Kunicki, Piotr, Sikora, Andrzej, Bogdanowicz, Robert, Ficek, Mateusz, Gotszalk, Teodor, Rangelow, Ivo W., Kwoka, Krzysztof

Source: In Measurement January 2022 188

Quartz tuning fork mass change sensing for FIB/SEM technology

Authors: Kunicki, Piotr ^*, Moczała-Dusanowska, Magdalena, Jóźwiak, Grzegorz, Szymanowska, Paulina, Piasecki, Tomasz, Gotszalk, Teodor

Source: In Micron February 2020 129

High-resolution, spatially-resolved surface potential investigations of high-strength metallurgical graphene using scanning tunnelling potentiometry

Authors: Gajewski, Krzysztof, Kunicki, Piotr, Sierakowski, Andrzej, Szymański, Witold, Kaczorowski, Witold, Niedzielski, Piotr, Ramadan, Sami, Shaforost, Olena, Klein, Norbert, Hao, Ling, Gotszalk, Teodor

Source: In Microelectronic Engineering 1 May 2019 212:1-8

A method of magnetic field measurement in a scanning electron microscope using a microcantilever magnetometer

Authors: Orłowska Karolina, Mognaschi Maria E., Kwoka Krzysztof, Piasecki Tomasz, Kunicki Piotr, Sierakowski Andrzej, Majstrzyk Wojciech, Podgórni Arkadiusz, Pruchnik Bartosz, di Barba Paolo, Gotszalk Teodor

Source: Metrology and Measurement Systems, Vol 27, Iss 1, Pp 141-149 (2020)

Subject Terms: scanning electron microscope, magnetometry, microcantilever, Technology

File Description: electronic resource

Relation: http://journals.pan.pl/dlibra/publication/131710/edition/115041/content; https://doaj.org/toc/2300-1941

Access URL: https://doaj.org/article/bbf422e593e44c8595700c477141834f

Corrosion of nanocrystalline nickel coatings electrodeposited from choline chloride:ethylene glycol deep eutectic solvent exposed in 0.05 M NaCl solution

Authors: Winiarski, Juliusz, Cieślikowska, Beata, Tylus, Włodzimierz, Kunicki, Piotr, Szczygieł, Bogdan

Source: In Applied Surface Science 15 March 2019 470:331-339

New design of the cantilevers for radiation pressure investigations

Authors: Orłowska, Karolina, Majstrzyk, Wojciech, Kunicki, Piotr, Sierakowski, Andrzej, Pruchnik, Bartosz, Tomaszewski, Daniel, Prokaryn, Piotr, Grabiec, Piotr, Gotszalk, Teodor

Source: In Microelectronic Engineering 5 December 2018 201:10-15

Thermal nanometrology using piezoresistive SThM probes with metallic tips

Authors: Janus, Paweł, Sierakowski, Andrzej, Rudek, Maciej, Kunicki, Piotr, Dzierka, Andrzej, Biczysko, Paweł, Gotszalk, Teodor

Source: In Ultramicroscopy October 2018 193:104-110

Femtosecond laser-induced ripple patterns for homogenous nanostructuring of pyrolytic carbon heart valve implant

Authors: Stępak, Bogusz, Dzienny, Paulina, Franke, Volker, Kunicki, Piotr, Gotszalk, Teodor, Antończak, Arkadiusz

Source: In Applied Surface Science 1 April 2018 436:682-689

Corrigendum to 'Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy'. [Measurement 188 (2022) 110373]

Authors: Gacka, Ewelina, Kunicki, Piotr, Sikora, Andrzej, Bogdanowicz, Robert, Ficek, Mateusz, Gotszalk, Teodor, Rangelow, Ivo W., Kwoka, Krzysztof

Source: Measurement. 191

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100156142358.0x000001&indx=1&recIds=ETOCvdc_100156142358.0x000001

Effective reactive pulsed magnetron sputtering of aluminium oxide – Properties of films deposited utilizing automated process stabilizer

Authors: Wiatrowski, Artur, Patela, Sergiusz, Kunicki, Piotr, Posadowski, Witold

Source: In Vacuum December 2016 134:54-62

Raman Spectroscopy and Kelvin Probe Force Microscopy characteristics of the CVD suspended graphene

Authors: Gajewski, Krzysztof, Goniszewski, Stefan, Szumska, Anna, Moczaɫa, Magdalena, Kunicki, Piotr, Gallop, John, Klein, Norbert, Hao, Ling, Gotszalk, Teodor

Source: In Diamond & Related Materials April 2016 64:27-33

Electrical, thermal and noise properties of platinum-carbon free-standing nanowires designed as nanoscale resistive thermal devices.

Authors: Piasecki, Tomasz, Kwoka, Krzysztof, Gacka, Ewelina, Kunicki, Piotr, Gotszalk, Teodor

Source: Nanotechnology; 3/11/2024, Vol. 35 Issue 11, p1-11, 11p

Subject Terms: NANOWIRES, THERMAL noise, ELECTRON beam deposition, THERMAL properties, ELECTRON beams

Closed-loop surface stress compensation with an electromagnetically actuated microcantilever

Authors: Kopiec, Daniel, Pałetko, Piotr, Nieradka, Konrad, Majstrzyk, Wojciech, Kunicki, Piotr, Sierakowski, Andrzej, Jóźwiak, Grzegorz, Gotszalk, Teodor

Source: In Sensors & Actuators: B. Chemical 5 July 2015 213:566-573

Light Intensity Fibre Optic Sensor for MEMS displacement and vibration metrology

Authors: Orłowska, Karolina ^a, Słupski, Piotr, Świątkowski, Michał, Kunicki, Piotr, Sankowska, Anna, Gotszalk, Teodor

Source: In Optics and Laser Technology January 2015 65:159-163

Electromagnetically Actuated Microcantilever for Chemical and Biochemical Sensing in Static Mode

Authors: Kopiec, Daniel, Pałetko, Piotr, Majstrzyk, Wojciech, Kunicki, Piotr, Sierakowski, Andrzej, Gotszalk, Teodor

Source: In Procedia Engineering 2014 87:955-958

FIB/SEM technology in NEMS/MEMS fabrication and investigation

Authors: Kunicki, Piotr, Kowalski, Zbigniew W., Gotszalk, Teodor

Source: Przegla̡d elektrotechniczny. 92(8):21-24

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN607511160&indx=1&recIds=ETOCRN607511160

Wide-Band Optical Fibre System for Investigation of MEMS and NEMS Deflection

Authors: Orłowska Karolina, Świątkowski Michał, Kunicki Piotr, Słupski Piotr, Sankowska Anna, Gotszalk Teodor

Source: Metrology and Measurement Systems, Vol 21, Iss 3, Pp 381-388 (2014)

Subject Terms: fibre optic sensors, amplitude detection, intensity detection, MEMS/NEMS deflection measurement, Technology

File Description: electronic resource

Relation: http://www.degruyter.com/view/j/mms.2014.21.issue-3/mms-2014-0032/mms-2014-0032.xml?format=INT; https://doaj.org/toc/2300-1941

Access URL: https://doaj.org/article/6f4fbeffac8e491ea9f1e8c2575ad601

Microscale surface potential gradient disturbances observed in bilayer graphene

Authors: Gajewski, Krzysztof, Ramadan, Sami, Kunicki, Piotr, Shaforost, Olena, Klein, Norbert, Gotszalk, Teodor

Source: Applied surface science. 510

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100099427107.0x000001&indx=1&recIds=ETOCvdc_100099427107.0x000001