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1Conference
Authors: Merkl, David, KrauBe, Markus, Wagner, Matthias F.
Source: 2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), 2022 IEEE International Workshop on. :343-348 Jun, 2022
Relation: 2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)