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1Academic Journal
Authors: Schearer, E. M., Liao, Y.-W., Perreault, E. J., Tresch, M. C., Memberg, W. D., Kirsch, R. F., Lynch, K. M.
Source: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 24(12):1405-1415 Dec, 2016
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2Report
Authors: Kirsch, R., Radcliffe, A. J.
Source: Discrete Mathematics, Volume 343, Issue 6, June 2020, 111803
Subject Terms: Mathematics - Combinatorics
Access URL: http://arxiv.org/abs/1712.07769
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3Report
Authors: Kirsch, R., Radcliffe, A. J.
Source: Electronic Journal of Combinatorics, Volume 26, Issue 2 (2019), P2.36
Subject Terms: Mathematics - Combinatorics
Access URL: http://arxiv.org/abs/1709.06163
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4Periodical
Authors: Wiebe, K., Kelley, S., Kirsch, R. E.
Source: Canadian Medical Association journal. :12-15
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5Academic Journal
Authors: Lambrecht, J. M., Kirsch, R. F.
Source: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 22(6):1138-1147 Nov, 2014
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6Academic Journal
Authors: Schearer, E. M., Liao, Y.-W., Perreault, E. J., Tresch, M. C., Memberg, W. D., Kirsch, R. F., Lynch, K. M.
Source: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 22(3):654-663 May, 2014
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7
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8Conference
Authors: Williams, M., Kirsch, R.
Source: The 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society Engineering in Medicine and biology Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE. 2:4803-4806 2004
Relation: Conference Proceedings. 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society
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9Academic Journal
Source: IEEE Transactions on Biomedical Engineering IEEE Trans. Biomed. Eng. Biomedical Engineering, IEEE Transactions on. 59(10):2755-2765 Oct, 2012
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10Academic Journal
Authors: Bokhorst, J.M., Blank, A., Lugli, A., Zlobec, I., Dawson, H., Vieth, M., Rijstenberg, L.L., Brockmoeller, S., Urbanowicz, M., Flejou, J.F., Kirsch, R., Ciompi, F., van der Laak, J.A.W.M., Nagtegaal, I.D.
Source: In Modern Pathology May 2020 33(5):825-833
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11Academic Journal
Authors: Nataraj, R., Audu, M. L., Kirsch, R. F., Triolo, R. J.
Source: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 18(6):646-657 Dec, 2010
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12Academic Journal
Authors: Polasek, K. H., Hoyen, H. A., Keith, M. W., Kirsch, R. F., Tyler, D. J.
Source: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 17(5):428-437 Oct, 2009
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13Academic Journal
Source: IEEE Transactions on Biomedical Engineering IEEE Trans. Biomed. Eng. Biomedical Engineering, IEEE Transactions on. 56(4):941-948 Apr, 2009
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14Academic Journal
Authors: Hincapie, J. G., Kirsch, R. F.
Source: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 17(1):80-90 Feb, 2009
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15Academic Journal
Authors: Williams, M. R., Kirsch, R. F.
Source: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 16(5):485-496 Oct, 2008
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16Academic Journal
Authors: Hincapie, J. G., Blana, D., Chadwick, E. K., Kirsch, R. F.
Source: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 16(3):255-263 Jun, 2008
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17Report
Authors: Brendel, L., Török, J., Kirsch, R., Bröckel, U.
Access URL: http://arxiv.org/abs/1101.5330
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18Academic Journal
Authors: Srivastava, A., Nguyen, H., Herrmann, T., Kirsch, R., Kini, R.M.
Source: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 29(4):299-305 Nov, 2016
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19Report
Authors: Dauvergne, D., Bräuning-Demian, A., Bosch, F., Bräuning, H., Chevallier, M., Cohen, C., Gumberidze, A., Hagmann, S., L'hoir, A., Kirsch, R., Kozhuharov, C., Liesen, D., Mokler, P. H., Poizat, J. -C., Ray, C., Rozet, J. -P., Stöhlker, Th., Toleikis, S., Toulemonde, M., Verma, P.
Source: Nuclear Instruments and Methods in Physics Research B 245 (2006) 47-51
Subject Terms: Physics - Atomic Physics
Access URL: http://arxiv.org/abs/physics/0509094
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20Report
Authors: Artru, X., Baier, V., Beloborodov, K., Bogdanov, A., Bukin, A., Burdin, S., Chehab, R., Chevallier, M., Cizeron, R., Dauvergne, D., Dimova, T., Druzhinin, V., Dubrovin, M., Gatignon, L., Goluev, V., Jejcic, A., Keppker, P., Kirsch, R., Kulibaba, V., Lautesse, P., Major, J., Poizat, J. -C., Potylitsin, A., Remillieux, J., Serednyakov, S., Shary, V., Strakhovenko, V., Sylvia, C.
Source: Nucl.Instrum.Meth. B240 (2005) 762-776
Access URL: http://arxiv.org/abs/physics/0506016