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  1. 1
    Academic Journal

    Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 62(7):1707-1715 Jul, 2015

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  2. 2
    Conference

    Source: 2013 CACS International Automatic Control Conference (CACS) Automatic Control Conference (CACS), 2013 CACS International. :527-531 Dec, 2013

    Relation: 2013 CACS International Automatic Control Conference (CACS)

  3. 3
    Conference

    Source: 2013 19th IEEE Pulsed Power Conference (PPC) Pulsed Power Conference (PPC), 2013 19th IEEE. :1-4 Jun, 2013

    Relation: 2013 IEEE Pulsed Power and Plasma Science Conference (PPPS 2013)

  4. 4
  5. 5
    Academic Journal

    Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 61(11):3165-3174 Nov, 2014

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  6. 6
    Academic Journal

    Source: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 61(9):4829-4837 Sep, 2014

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  7. 7
    Academic Journal

    Source: IEEE/ASME Transactions on Mechatronics IEEE/ASME Trans. Mechatron. Mechatronics, IEEE/ASME Transactions on. 19(3):852-861 Jun, 2014

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  8. 8
    Conference

    Source: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE. 3:2150-2155 Vol.3 2004

    Relation: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference

  9. 9
    Academic Journal

    Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 22(3):497-506 Mar, 2014

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    Conference

    Source: Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on. :159-166 2003

    Relation: Proceedings. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

  12. 12
    Academic Journal

    Source: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 41(10):2671-2674 Oct, 2013

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  13. 13
    Academic Journal

    Source: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 41(10):2946-2950 Oct, 2013

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  14. 14
    Academic Journal

    Source: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 60(9):3796-3805 Sep, 2013

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  15. 15
    Academic Journal

    Source: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 11(5):1019-1025 Sep, 2012

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  16. 16
    Academic Journal

    Source: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 12(1):68-77 Mar, 2012

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  19. 19
    Academic Journal

    Source: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 59(2):1154-1160 Feb, 2012

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  20. 20
    Academic Journal

    Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 61(1):35-42 Jan, 2012

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