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1Academic Journal
Authors: Zhu, H., Kapusta, R., Kim, Y.-B.
Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 62(7):1707-1715 Jul, 2015
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2Conference
Authors: Yu, Duck-Hyun, Wang, Ya-Xiong, Kim, Y. B.
Source: 2013 CACS International Automatic Control Conference (CACS) Automatic Control Conference (CACS), 2013 CACS International. :527-531 Dec, 2013
Relation: 2013 CACS International Automatic Control Conference (CACS)
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3Conference
Authors: Lim, S. W., Kim, J. S., Cho, C. H., Kim, Y. B., Katsuki, S., Jin, Y. S.
Source: 2013 19th IEEE Pulsed Power Conference (PPC) Pulsed Power Conference (PPC), 2013 19th IEEE. :1-4 Jun, 2013
Relation: 2013 IEEE Pulsed Power and Plasma Science Conference (PPPS 2013)
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4Report
Authors: Aczel, A. A., Cook, A. M., Williams, T. J., Calder, S., Christianson, A. D., Cao, G. -X., Mandrus, D., Kim, Y. B., Paramekanti, A.
Source: Phys. Rev. B 93, 214426 (2016)
Subject Terms: Condensed Matter - Strongly Correlated Electrons
Access URL: http://arxiv.org/abs/1604.08431
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5Academic Journal
Authors: Choi, S., Kim, H.-S., Jung, S., Sung, S.-D., Yuk, Y.-S., Yim, H.-S., Shin, Y., Cheon, J.-H., Ahn, C., Kim, T., Kim, Y. B., Cho, G.-H.
Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 61(11):3165-3174 Nov, 2014
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6Academic Journal
Authors: Wang, Y.-X., Yu, D.-H., Kim, Y.-B.
Source: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 61(9):4829-4837 Sep, 2014
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7Academic Journal
Authors: Wang, Y.-X., Kim, Y.-B.
Source: IEEE/ASME Transactions on Mechatronics IEEE/ASME Trans. Mechatron. Mechatronics, IEEE/ASME Transactions on. 19(3):852-861 Jun, 2014
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8Conference
Authors: Schiano, L., Momenzadeh, M., Zhang, F., Lee, Y.J., Kim, Y.-B., Lombardi, F., Meyer, F.J., Kane, T., Max, S., Perkins, P.
Source: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE. 3:2150-2155 Vol.3 2004
Relation: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference
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9Academic Journal
Authors: Chauhan, H., Choi, Y., Onabajo, M., Jung, I.-S., Kim, Y.-B.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 22(3):497-506 Mar, 2014
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10Report
Authors: Aczel, A. A., Cook, A. M., Williams, T. J., Calder, S., Christianson, A. D., Cao, G. -X., Mandrus, D., Kim, Y. B., Paramekanti, A.
Subject Terms: Condensed Matter - Strongly Correlated Electrons
Access URL: http://arxiv.org/abs/1507.07920
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11Conference
Authors: Fengming Zhang, Lee, Y.J., Kane, T., Schiano, L., Momenzadeh, M., Kim, Y.-B., Meyer, F.J., Lombardi, F., Max, S., Perkinson, P.
Source: Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on. :159-166 2003
Relation: Proceedings. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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12Academic Journal
Authors: Jin, Y. S., Kim, Y. B., Kim, J. S., Cho, C., Lim, S. W., Lee, B., Kim, S. H., An, S., Yoon, S. H., Koo, I. S.
Source: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 41(10):2671-2674 Oct, 2013
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13Academic Journal
Authors: Lim, S. W., Cho, C., Jin, Y. S., Kim, Y. B., Roh, Y.
Source: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 41(10):2946-2950 Oct, 2013
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14Academic Journal
Authors: Jin, J., Yuen, S. L., Lee, Y. H., Jun, C., Kim, Y. B., Lee, S., You, B.-J., Doh, N. L.
Source: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 60(9):3796-3805 Sep, 2013
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15Academic Journal
Authors: Lin, S., Kim, Y.-B., Lombardi, F.
Source: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 11(5):1019-1025 Sep, 2012
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16Academic Journal
Authors: Lin, S., Kim, Y.-B., Lombardi, F.
Source: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 12(1):68-77 Mar, 2012
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17Periodical
Authors: Kim, J.-H., Park, W. H., Suh, D. H., Kim, K., No, J. H., Kim, Y. B.
Source: Anticancer research. 41(6):2945-2952
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18Periodical
Authors: Lee, G. H., Park, J. W., Roh, J., Kim, Y. B., Lee, E., Lim, S. G., Shin, S. J., Lee, K. M., Noh, C.-K.
Source: Anticancer research. 41(1):459-466
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19Academic Journal
Authors: Jung, I.-S., Kim, Y.-B.
Source: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 59(2):1154-1160 Feb, 2012
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20Academic Journal
Authors: Kawai, H., Kim, Y.-B., Choi, Y.
Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 61(1):35-42 Jan, 2012