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1Conference
Authors: Kim, Kwangsoo, Lim, Suhwan, Woo, Jongho, Lim, Junyeong, Yoo, Sijung, Kim, Hyoseok, Park, Jaewoo, Jun, Haeyeon, Kim, Seunghyun, Woo, Myunghun, Kim, Taeyoung, Park, Sanghyun, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Baek, Jongyeon, Kim, Jisung, Lee, Kiheun, Park, Sam, Choe, Dukhyun, Jung, Moonyoung, Yon, Gukhyon, Lee, Suhyeong, Kim, Hyung Joon, Kim, Kijoon, Hong, Sungduk, Park, Kwangmin, Kuh, Bong Jin, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk
Source: 2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024
Relation: 2024 IEEE International Electron Devices Meeting (IEDM)
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2Report
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3Report
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4Report
Authors: Carrière, Mathieu, Kim, Seunghyun, Kim, Woojin
Access URL: http://arxiv.org/abs/2412.05900
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5Report
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6Report
Authors: Shin, Sangwoo, Kim, Seunghyun, Jang, Youngsoo, Lee, Moontae, Woo, Honguk
Subject Terms: Computer Science - Artificial Intelligence
Access URL: http://arxiv.org/abs/2408.01024
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7Conference
Authors: Lim, Suhwan, Kim, Taeyoung, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Kim, Juhyung, Jung, Dongjin, Kim, Kwangsoo, Yoo, Sijung, Lee, Hyun Jae, Nam, Seung-Geol, Kim, Ji-Sung, Park, Jaewoo, Kim, Chaeho, Kim, Seunghyun, Kim, Hyoseok, Heo, Jinseong, Park, Kwangmin, Jeon, Sanghun, Kim, Wanki, Ha, Daewon, Shin, Yu Gyun, Song, Jaihyuk
Source: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Relation: 2023 International Electron Devices Meeting (IEDM)
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8Conference
Authors: Lee, Juho, Kim, Seunghyun, Kim, Hyoseok, Hong, Sungduk, Kim, Sung Jin, Sin Kim, Dae, Woo, Myung Hun, Heon Kang, Joo, Park, Hyun-Mog, Ha, Daewon
Source: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2023 International Conference on. :197-200 Sep, 2023
Relation: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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9Conference
Authors: Kim, Seunghyun, Lee, Kunyoung, Lee, Eui Chul
Source: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :6034-6041 Jun, 2023
Relation: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
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10Conference
Authors: Myeong, Ilho, Lim, Suhwan, Kim, Taeyoung, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Munkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Jisung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoon, Ilyounz, Kim, Jaeho, Kim, Kwangsoo, Park, Kwangmin, Kuh, Bong Jin, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Heo, Jinseong
Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :9B.3-1-9B.3-6 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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11Conference
Authors: Kim, Taeyoung, Lim, Suhwan, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Ji-sung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Yoon, Ilyoung, Kim, Chaeho, Kim, Kwanzsoo, Park, Kwanzmin, Kuh, Bong Jin, Heo, Jinseong, Kim, Wanki, Ha, Daewon, Song, Jaihyuk
Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P6.EM-1-P6.EM-4 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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12Conference
Authors: Kim, Seunghyun, Madden, Liam, Dall'Anese, Emiliano
Source: 2022 IEEE 61st Conference on Decision and Control (CDC) Decision and Control (CDC), 2022 IEEE 61st Conference on. :3499-3506 Dec, 2022
Relation: 2022 IEEE 61st Conference on Decision and Control (CDC)
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13Report
Authors: Kim, SeungHyun, Kim, Hyunsu, Yun, EungGu, Lee, Hwangrae, Lee, Jaehun, Lee, Juho
Access URL: http://arxiv.org/abs/2308.06738
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14Report
Authors: Prakash, Ritesh, Lee, Jinseok, Moon, Youngkwang, Pradhan, Diva, Kim, Seunghyun, Lee, Ho-Yong, Lee, Jinkee
Subject Terms: Physics - Fluid Dynamics
Access URL: http://arxiv.org/abs/2301.08971
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15Academic Journal
Authors: Kim, Doheon a, Shin, Dongmin a, Kim, Dohyeong b, Kwon, Boyeon c, Min, Choongki c, Geevarghese, Gloria b, Kim, Seunghyun d, Hwang, Jungho a, ⁎, Seo, SungChul c, ⁎
Source: In Building and Environment 15 February 2025 270
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16Academic Journal
Authors: Lee, Junho a, c, Park, Gitae a, Oh, Chang Young a, Son, Youngho a, Kim, Seunghyun b, Bahn, Chi Bum c, ⁎
Source: In Journal of Nuclear Materials February 2025 606
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17Academic Journal
Authors: Trinh, Ha Bich a, Son, Taehun a, Kim, Seunghyun a, Lee, Jaeryeong a, ⁎, Anh Nguyen, Thi Le b
Source: In Journal of Industrial and Engineering Chemistry March 2025
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18Academic Journal
Authors: Zhao, Bin a, 1, Huang, Xiaozhen b, 1, Chung, Sein c, 1, Zhang, Min d, Zhong, Yufei f, Liang, Anhai a, Zhao, Zhenmin a, Zhu, Chaofeng a, Zhao, Jingjing a, Kim, Seunghyun c, Kim, Jimin c, Wang, Ming a, Chen, Shilin a, Cho, Kilwon c, ⁎, Wang, Yang b, ⁎, Kan, Zhipeng a, e, ⁎
Source: In eScience January 2025 5(1)
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19Conference
Authors: Sung, Hyeon Ah, Kim, Seunghyun, Lee, Eui Chul
Source: Lecture notes in computer science. 13741:154-159
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20Conference
Authors: Lee, Chaewon, Kim, Seunghyun, Lee, Eui Chul
Source: Lecture notes in computer science. 13741:348-353