A 900 MHz ISM band transceiver RF IC chip set and RF module

Authors: Chien-Kuang Lee, Chung-Chiang Ku, Keng-Li Su, Chao-Hui Lin, Kuang-Chung Tao

Source: 1998 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers (Cat. No.98CH36182) Radio frequency integrated circuits Radio Frequency Integrated Circuits (RFIC) Symposium, 1998 IEEE. :245-248 1998

Relation: 1998 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers

A 900 MHz ISM band transceiver RFIC chip set and RF module

Authors: Chien-Kuang Lee, Chung-Chiang Ku, Keng-Li Su, Chao-Hui Lin, Kuang-Chung Tao

Source: 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192) Microwave symposium Microwave Symposium Digest, 1998 IEEE MTT-S International. 1:77-80 vol.1 1998

Relation: 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192)

ReRAM-based 4T2R nonvolatile TCAM with 7x NVM-stress reduction, and 4x improvement in speed-wordlength-capacity for normally-off instant-on filter-based search engines used in big-data processing

Authors: Li-Yue Huang, Meng-Fan Chang, Ching-Hao Chuang, Chia-Chen Kuo, Chien-Fu Chen, Geng-Hau Yang, Hsiang-Jen Tsai, Tien-Fu Chen, Shyh-Shyuan Sheu, Keng-Li Su, Chen, Frederick T., Tzu-Kun Ku, Ming-Jinn Tsai, Ming-Jer Kao

Source: 2014 Symposium on VLSI Circuits Digest of Technical Papers VLSI Circuits Digest of Technical Papers, 2014 Symposium on. :1-2 Jun, 2014

Relation: 2014 IEEE Symposium on VLSI Circuits

Impact of resistance drift on multilevel PCM design.

Authors: Yi-Hsuan Chiu, Yi-Bo Liao, Meng-Hsueh Chiang, Chia-Long Lin, Wei-Chou Hsu, Pei-Chia Chiang, Yen-Ya Hsu, Wen-Hsing Liu, Shyh-Shyuan Sheu, Keng-Li Su, Ming-Jer Kao, Ming-Jinn Tsai

Source: 2010 IEEE International Conference on IC Design & Technology (ICICDT); 2010, p20-23, 4p

Design optimization in write speed of multi-level cell application for phase change memory.

Authors: Jun-Tin Lin, Yi-Bo Liao, Meng-Hsueh Chiang, I-Hsuan Chiu, Chia-Long Lin, Wei-Chou Hsu, Pei-Chia Chiang, Shyh-Shyuan Sheu, Yen-Ya Hsu, Wen-Hsing Liu, Keng-Li Su, Ming-Jer Kao, Ming-Jinn Tsai

Source: 2009 IEEE International Conference of Electron Devices & Solid-State Circuits (EDSSC); 2009, p525-528, 4p

4-Mb SPI Flash Compatible Phase-Change Memory.

Authors: Shyh-Shyuan Sheu, Lieh-Chiu Lin, Wen-Han Wang, Pei-Chia Chiang, Keng-Li Su, Ming-Jer Kao, Ming-Jinn Tsai

Source: 2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT); 2007, p1-4, 4p

An Electrical Testing Method for Blind Through Silicon Vias (TSVs) for 3D IC Integration.

Authors: Shyh-Shyuan Sheu, Zhe-Hui Lin, Jui-Feng Hung, Lau, John H., Peng-Shu Chen, Shih-Hsien Wu, Keng-Li Su, Chih-Sheng Lin, Shinn-Juh Lai, Kuo-Hsing Cheng, Tzu-Kun Ku, Wei-Chung Lo, Ming-Jer Kao

Source: Journal of Microelectronic & Electronic Packaging; 2011 4th Quarter, Vol. 8 Issue 4, p140-145, 6p

Subject Terms: INTEGRALS, HETEROGENEOUS catalysis, PARASITIC diseases, ELECTRICAL test equipment, BATTERY testers

A 4Mb embedded SLC resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability.

Authors: Shyh-Shyuan Sheu, Meng-Fan Chang, Ku-Feng Lin, Che-Wei Wu, Yu-Sheng Chen, Pi-Feng Chiu, Chia-Chen Kuo, Yih-Shan Yang, Pei-Chia Chiang, Wen-Pin Lin, Che-He Lin, Heng-Yuan Lee, Pei-Yi Gu, Sum-Min Wang, Chen, F.T., Keng-Li Su, Chen-Hsin Lien, Kuo-Hsing Cheng, Hsin-Tun Wu, Tzu-Kun Ku

Source: 2011 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC); 2011, p200-202, 3p

A low store energy, low VDDmin, nonvolatile 8T2R SRAM with 3D stacked RRAM devices for low power mobile applications.

Authors: Pi-Feng Chiu, Meng-Fan Chang, Shyh-Shyuan Sheu, Ku-Feng Lin, Pei-Chia Chiang, Che-Wei Wu, Wen-Pin Lin, Chih-He Lin, Ching-Chih Hsu, Chen, F.T., Keng-Li Su, Ming-Jer Kao, Ming-Jinn Tsai

Source: 2010 IEEE Symposium on VLSI Circuits (VLSIC); 2010, p229-230, 2p

Fast-Write Resistive RAM (RRAM) for Embedded Applications.

Authors: Shyh-Shyuan Sheu¹, sssheu@itri.org.tw, Kuo-Hsing Cheng¹, Meng-Fan Chang², Pei-Chia Chiang³, Wen-Pin Lin³, Heng-Yuan Lee³, Pang-Shiu Chen³, Yu-Sheng Chen³, Tai-Yuan Wu³, Chen, Frederick T.³, Keng-Li Su³, Ming-Jer Kao³, Ming-Jinn Tsai³

Source: IEEE Design & Test of Computers; 02/01/2011, Vol. 28 Issue 1, p64-71, 0p, 5 Diagrams, 2 Charts, 3 Graphs