-
1Report
Authors: Pauls, Jan, Zimmer, Max, Kelly, Una M., Schwartz, Martin, Saatchi, Sassan, Ciais, Philippe, Pokutta, Sebastian, Brandt, Martin, Gieseke, Fabian
Subject Terms: Computer Science - Computer Vision and Pattern Recognition, Computer Science - Artificial Intelligence, Computer Science - Machine Learning
Access URL: http://arxiv.org/abs/2406.01076
-
2Conference
Authors: Kelly, Una M., Spreeuwers, Luuk, Veldhuis, Raymond
Source: 2022 IEEE International Joint Conference on Biometrics (IJCB) Biometrics (IJCB), 2022 IEEE International Joint Conference on. :1-7 Oct, 2022
Relation: 2022 IEEE International Joint Conference on Biometrics (IJCB)
-
3Report
Subject Terms: Computer Science - Computer Vision and Pattern Recognition
Access URL: http://arxiv.org/abs/2310.08371
-
4Conference
Authors: Wang, Shunxin, Kelly, Una M., Veldhuis, Raymond N.J.
Source: 2021 IEEE International Workshop on Biometrics and Forensics (IWBF) Biometrics and Forensics (IWBF), 2021 IEEE International Workshop on. :1-6 May, 2021
Relation: 2021 IEEE International Workshop on Biometrics and Forensics (IWBF)
-
5
-
6Academic Journal
This result is not displayed to guests.
Login for full access. -
7Academic Journal
Authors: Kelly, Una M., Richter, Sven, Redenbach, Claudia, Schladitz, Katja, Scheuerlein, Christian, Wolf, Felix, Ebermann, Patrick, Lackner, Friedrich, Schoerling, Daniel, Meinel, Dietmar
Source: IEEE Transactions on Applied Superconductivity; Jun2018, Vol. 28 Issue 4, p1-5, 5p
Subject Terms: X-ray absorption, ELECTROMAGNETIC wave absorption, CROSS-sectional method, X-ray diffraction, POWER transmission