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1Academic Journal
Authors: Michael E. Hoenk, April D. Jewell, Gillian Kyne, John Hennessy, Todd Jones, Charles Shapiro, Nathan Bush, Shouleh Nikzad, David Morris, Katherine Lawrie, Jesper Skottfelt
Source: Sensors, Vol 23, Iss 24, p 9857 (2023)
Subject Terms: CMOS image sensors, delta-doped CCD, radiation damage, stability, image sensor, delta-doped silicon, Chemical technology, TP1-1185
File Description: electronic resource
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2Dissertation/ Thesis
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3Academic Journal
Authors: Andrew Mills1, Katherine Lawrie1, Michael McFarlane1
Source: Photochemical & Photobiological Sciences. Mar2009, Vol. 8 Issue 3, p421-425. 5p.
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4Dissertation/ Thesis
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