Effectiveness of Timing-Aware Scan Tests in Targeting Marginal Failures and Silent Data Errors in a Data Center Processor

Authors: Natarajan, Suriyaprakash, Oak, Chaitali S., Kakollu, Vijay, Chaplot, Nipun, Roy, Soham, Lonkar, Apurva, Reyes, Gerardo J. Perfecto

Source: 2024 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2024 IEEE International. :253-260 Nov, 2024

Relation: 2024 IEEE International Test Conference (ITC)