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    Report

    Source: Journal of Cosmology and Astroparticle Physics, Volume 2021, August 2021

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    Conference

    Source: 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) Workshop on memory technology, design and testing Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on. :xxi-xxv 2005

    Relation: 2005 IEEE International Workshop on Memory Technology, Design and Testing

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    Academic Journal

    Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 61(8):2253-2261 Aug, 2012

    Linked Full Text
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    Conference

    Source: Proceedings of 13th Annual IEEE International ASIC/SOC Conference (Cat. No.00TH8541) ASIC/SOC conference ASIC/SOC Conference, 2000. Proceedings. 13th Annual IEEE International. :32-36 2000

    Relation: Proceedings 13th Annual IEEE International ASIC/SOC Conference

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