Modelling the influence of plasticity induced softening on the low cycle fatigue and crack propagation behaviour of a nickel-based superalloy

Authors: Engel, B., Lavie, W.J., Rouse, J.P., Whittaker, M.T., Jones, J.P., Lancaster, R., Stekovic, S., Pattison, S.J., Hyde, C.J.

Source: In Computational Materials Science 5 January 2024 231

Nanometer-Scale Strain Measurements in AlGaN/GaN High-Electron Mobility Transistors During Pulsed Operation

Authors: Rosenberger, M.R., Jones, J.P., Heller, E.R., Graham, S., King, W.P.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(7):2742-2748 Jul, 2016

A holistic approach to Thermo-Mechanical Fatigue phase angle effects for an aerospace nickel superalloy

Authors: Gray, V., Jones, J.P., Whittaker, M.T., Lancaster, R.J., Pretty, C.J., Williams, S.J.

Source: In International Journal of Fatigue March 2022 156

Impact of a high-performance communication network on cluster-based parallel iterative reconstruction

Authors: Jones, J.P., Jones, W.F., Everman, J., Panin, V., Michel, C., Kehren, F., Jun Bao, Young, J., Casey, M.E.

Source: IEEE Nuclear Science Symposium Conference Record, 2005 Nuclear Science Symposium Nuclear Science Symposium Conference Record, 2005 IEEE. 4:2273-2277 2005

Relation: 2005 IEEE Nuclear Science Symposium Conference Record

OSEM-3D reconstruction strategies for the ECAT HRRT

Authors: Comtat, C., Bataille, F., Michel, C., Jones, J.P., Sibomana, M., Janeiro, L., Trebossen, R.

Source: IEEE Symposium Conference Record Nuclear Science 2004. Nuclear science symposium Nuclear Science Symposium Conference Record, 2004 IEEE. 6:3492-3496 Vol. 6 2004

Relation: 2004 IEEE Nuclear Science Symposium Conference Record

Clinical time OSEM3D: infrastructure issues

Authors: Jones, J.P., Jones, W.F., Kehren, F., Burbar, Z., Reed, J.H., Lenox, M.W., Baker, K., Byars, L.G., Michel, C., Casey, M.E.

Source: 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) Nuclear science symposium Nuclear Science Symposium Conference Record, 2003 IEEE. 4:2635-2639 Vol.4 2003

Relation: 2003 IEEE Nuclear Science Symposium. Conference Record

SPMD cluster-based parallel 3D OSEM

Authors: Jones, J.P., Jones, W.F., Kehren, F., Newport, D.F., Reed, J.H., Lenox, M.W., Byars, L.G., Baker, K., Michel, C., Casey, M.E.

Source: 2002 IEEE Nuclear Science Symposium Conference Record Nuclear science symposium Nuclear Science Symposium Conference Record, 2002 IEEE. 3:1495-1499 vol.3 2002

Relation: 2002 IEEE Nuclear Science Symposium Conference Record

An exploration of physical ageing in electrically-stressed polymeric insulating films using the quartz crystal shear wave sensor technique

Authors: Connor, P., Jones, J.P., Llewellyn, J.P., Lewis, T.J.

Source: ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Solid dielectrics Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on. :39-42 2001

Relation: ICSD'01. Proceedings of the 2001 IEEE 7th International Conference on Solid Dielectrics

The prediction of crack propagation in coarse grain RR1000 using a unified modelling approach

Authors: Engel, B., Rouse, J.P., Hyde, C.J., Lavie, W., Leidermark, D., Stekovic, S., Williams, S.J., Pattison, S.J., Grant, B., Whittaker, M.T., Jones, J.P., Lancaster, R.J., Li, H.Y

Source: In International Journal of Fatigue August 2020 137

A viscoelastic – viscoplastic material model for superalloy applications

Authors: Rouse, J.P., Engel, B., Hyde, C.J., Pattison, S.J., Whittaker, M.T., Jones, J.P., Cockings, B., Barnard, N.C.

Source: In International Journal of Fatigue July 2020 136

The Mondo Chip-A CMOS integrated circuit for the PHENIX electromagnetic calorimeter

Authors: Wintenberg, A.L., Belikov, S., Ericson, M.N., Frank, S.S., Jackson, R.G., Jones, J.P., Jr., Simpson, M.L., Stankus, P.W., Young, G.R.

Source: 1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255) Nuclear science and medical imaging Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE. 1:29-34 vol.1 1998

Relation: 1998 IEEE Nuclear Science Symposium Conference Record

Front-end readout system for PHENIX RICH

Authors: Tanaka, Y., Hara, H., Ebisu, K., Hibino, M., Matsumoto, T., Kikuchi, J., Wintenberg, A.L., Walker, J.W., Frank, S., Moscone, C., Jones, J.P., Young, G.R., Oyama, K., Hamagaki, H.

Source: 1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255) Nuclear science and medical imaging Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE. 1:346-352 vol.1 1998

Relation: 1998 IEEE Nuclear Science Symposium Conference Record

The RICH Chip-a CMOS integrated circuit for the PHENIX Ring Imaging Cherenkov detector

Authors: Wintenberg, A.L., Frank, S.S., Moscone, C.G., Jackson, R.G., Jones, J.P., Young, G.R.

Source: 1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255) Nuclear science and medical imaging Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE. 1:473-476 vol.1 1998

Relation: 1998 IEEE Nuclear Science Symposium Conference Record

A mechanical origin for electrical ageing and breakdown in polymeric insulation

Authors: Conner, P., Jones, J.P., Llewellyn, J.P., Lewis, T.J.

Source: ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Conduction and breakdown in solid dielectrics Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on. :434-438 1998

Relation: ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics

Electric field-induced viscoelastic changes in insulating polymer films

Authors: Connor, P., Jones, J.P., Llewellyn, J.P., Lewis, T.J.

Source: 1998 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.98CH36257) Electrical insulation and dielectric phenomena Electrical Insulation and Dielectric Phenomena, 1998. Annual Report. Conference on. 1:27-30 vol. 1 1998

Relation: 1998 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

Rapid world modelling from a mobile platform

Authors: Barry, R.E., Jones, J.P., Little, C.Q., Wilson, C.W.

Source: Proceedings of International Conference on Robotics and Automation Robotics and automation Robotics and Automation, 1997. Proceedings., 1997 IEEE International Conference on. 1:72-77 vol.1 1997

Relation: Proceedings of International Conference on Robotics and Automation

The contribution of field-induced morphological change to the electrical aging and breakdown of polyethylene

Authors: Jones, J.P., Llewellyn, J.P., Lewis, T.J.

Source: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 12(5):951-966 Oct, 2005

Acoustic response of cartilage during laser-mediated stress relaxation

Authors: Slater, J.G., Protsenko, D.E., Carbone, N., Jones, J.P., Wong, B.J.F.

Source: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 11(4):846-853 Aug, 2005

Real-time construction of three-dimensional occupancy maps

Authors: Jones, J.P.

Source: [1993] Proceedings IEEE International Conference on Robotics and Automation Robotics and Automation, 1993. Proceedings., 1993 IEEE International Conference on. :52-57 vol.1 1993

Relation: Proceedings of 1993 IEEE International Conference on Robotics and Automation

SPMD cluster-based parallel 3D OSEM

Authors: Jones, J.P., Jones, W.F., Kehren, F., Newport, D.F., Reed, J.H., Lenox, M.W., Baker, K., Byars, L.G., Michel, C., Casey, M.E.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 50(5):1498-1502 Oct, 2003