Total dose degradation of low-dropout voltage regulators

Authors: Miyahira, T.F., Rax, B.G., Johnston, A.H.

Source: IEEE Radiation Effects Data Workshop, 2005. Radiation Effects Data Workshop Radiation Effects Data Workshop, 2005. IEEE. :127-131 2005

Relation: 2005 IEEE Radiation Effects Data Workshop

Total ionizing dose effects in bipolar and BiCMOS devices

Authors: Chavez, R.M., Rax, B.G., Scheick, L.Z., Johnston, A.H.

Source: IEEE Radiation Effects Data Workshop, 2005. Radiation Effects Data Workshop Radiation Effects Data Workshop, 2005. IEEE. :144-148 2005

Relation: 2005 IEEE Radiation Effects Data Workshop

Test results of total ionizing dose conducted at the Jet Propulsion Laboratory [bipolar and CMOS ICs]

Authors: Rivas, R.M., Johnston, A.H., Miyahira, T.F., Rax, B.G., Wiedeman, M.D.

Source: 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) Radiation effects data workshop Radiation Effects Data Workshop, 2004 IEEE. :36-41 2004

Relation: 2004 IEEE Radiation Effects Data Workshop

Displacement damage characterization of laser diodes

Authors: Johnston, A.H., Miyahira, T.F.

Source: Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on. :3-9 2003

Relation: Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.

Radiation effects predicted, observed, and compared for spacecraft systems

Authors: Pritchard, B.E., Swift, G.M., Johnston, A.H.

Source: IEEE Radiation Effects Data Workshop Radiation effects data workshop Radiation Effects Data Workshop, 2002 IEEE. :7-13 2002

Relation: 2002 Nuclear and Space Radiation Effects Conference

Low dose failures of hardened DC-DC power converters

Authors: Lehman, J., Yui, C., Rax, B.G., Miyahira, T.F., Wiedeman, M., Schrock, P., Swift, G.M., Johnston, A.H., Kayali, S.

Source: IEEE Radiation Effects Data Workshop Radiation effects data workshop Radiation Effects Data Workshop, 2002 IEEE. :109-114 2002

Relation: 2002 Nuclear and Space Radiation Effects Conference

Energy dependence of proton damage in optical emitters

Authors: Johnston, A.H., Miyahira, T.F.

Source: RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) Radiation and its effects on components and systems Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on. :172-178 2001

Relation: RADECS 2001. 2001 6th European Conference on Radiation and its Effects on Components and Systems

Latent reliability degradation of ultra-thin oxides after heavy ion and /spl gamma/-ray irradiation

Authors: Wang, B., Suehle, J.S., Vogel, E.M., Conley, J.R., Jr., Weintraub, C.E., Johnston, A.H., Bernstein, J.B.

Source: 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580) Integrated reliability workshop Integrated Reliability Workshop Final Report, 2001. 2001 IEEE International. :16-19 2001

Relation: 2001 IEEE International Integrated Reliability Workshop. Final Report

An updated data compendium of enhanced low dose rate sensitive (ELDRS) bipolar linear circuits

Authors: Pease, R.L., McClure, S., Johnston, A.H., Gorelick, J., Turflinger, T.L., Gehlhausen, M., Krieg, J., Carriere, T., Shaneyfelt, M.

Source: 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) Radiation effects data workshop Radiation Effects Data Workshop, 2001 IEEE. :127-133 2001

Relation: 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record

The effects of space radiation on linear integrated circuits

Authors: Johnston, A.H., Guertin, S.M.

Source: 2000 IEEE Aerospace Conference. Proceedings (Cat. No.00TH8484) Aerospace conference Aerospace Conference Proceedings, 2000 IEEE. 5:363-369 vol.5 2000

Relation: 2000 IEEE Aerospace Conference Proceedings

A roadmap for NASA's radiation effects research in emerging microelectronics and photonics

Authors: LaBel, K.A., Barnes, C.E., Marshall, P.W., Marshall, C.J., Johnston, A.H., Reed, R.A., Barth, J.L., Seidleck, C.M., Kayali, S.A., O'Bryan, M.V.

Source: 2000 IEEE Aerospace Conference. Proceedings (Cat. No.00TH8484) Aerospace conference Aerospace Conference Proceedings, 2000 IEEE. 5:535-545 vol.5 2000

Relation: 2000 IEEE Aerospace Conference Proceedings

A compendium of recent optocoupler radiation test data

Authors: LaBel, K.A., Kniffin, S.D., Reed, R.A., Kim, H.S., Wert, J.L., Oberg, D.L., Normand, E., Johnston, A.H., Lum, G.K., Koga, R., Crain, S., Schwank, J.R., Hash, G.L., Buchner, S., Mann, J., Simpkins, L., D'Ordine, M., Marshall, C.A., O'Bryan, M.V., Seidleck, C.M., Nguyen, L.X., Carts, M.A., Ladbury, R.L., Howard, J.W.

Source: 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) Radiation effects Radiation Effects Data Workshop, 2000. :123-146 2000

Relation: 2000 IEEE Radiation Effects Data Workshop. Workshop Record

Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators

Authors: McClure, S.S., Gorelick, J.L., Pease, R., Johnston, A.H.

Source: 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) Radiation effects Radiation Effects Data Workshop, 2000. :100-105 2000

Relation: 2000 IEEE Radiation Effects Data Workshop. Workshop Record

Proton damage in linear and digital optocouplers

Authors: Johnston, A.H., Rax, B.G.

Source: 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Radiation and its effects on components and systems Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on. :437-443 1999

Relation: 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99

Comparison of total dose effects on micropower op-amps: bipolar and CMOS

Authors: Lee, C.I., Johnston, A.H.

Source: 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) Radiation effects data workshop Radiation Effects Data Workshop, 1998. IEEE. :132-136 1998

Relation: 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

Total ionizing dose effects on flash memories

Authors: Nguyen, D.N., Lee, C.I., Johnston, A.H.

Source: 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) Radiation effects data workshop Radiation Effects Data Workshop, 1998. IEEE. :100-103 1998

Relation: 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

Total ionizing dose effects on voltage-to-frequency converters

Authors: Lee, C.I., Johnston, A.H., Rax, B.G.

Source: 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) Radiation effects data workshop Radiation Effects Data Workshop, 1998. IEEE. :117-120 1998

Relation: 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

Radiation effects in advanced microelectronics technologies

Authors: Johnston, A.H.

Source: RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Radiation and its effects on components and systems (RADECS) Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on. :1-16 1997

Relation: RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)

Comparison of total dose responses on high resolution analog-to-digital converter technologies

Authors: Lee, C.I., Johnston, A.H.

Source: RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Radiation and its effects on components and systems (RADECS) Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on. :245-250 1997

Relation: RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)

Common-source TLD and RADFET characterization of Co-60, Cs-137, and X-ray irradiation sources [bipolar linear ICs]

Authors: Simons, M., Pease, R.L., Fleetwood, D.M., Schwank, J.R., Krzesniak, M.F., Turflinger, T.L., Buaron, J., Riewe, L.C., Kemp, W.T., Duggan, P.W.C., Johnston, A.H., Wiedeman, M.C., Mills, R.E., Holmes-Siedle, A.G., Cohn, L.M., Doane, H.J., Lohmeier, W.L.

Source: 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Radiation effects Radiation Effects Data Workshop, 1997 IEEE. :28-34 1997

Relation: 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference