The Design and Construction of the Chips Water Cherenkov Neutrino Detector

Authors: Rancurel, B. Alonso, Angelides, N., Augustoni, G., Bash, S., Bergmann, B., Bertschinger, N., Bizouard, P., Campbell, M., Cao, S., Carroll, T. J., Castellan, R., Catano-Mur, E., Cesar, J. P., Coelho, J. A. B., Dills, P., Dodwell, T., Edmondson, J., van Eijk, D., Fetterly, Q., Garbal, Z., Germani, S., Gilpin, T., Giraudo, A., Habig, A., Hanuska, D., Hausner, H., Hernandez, W. Y., Holin, A., Huang, J., Jones, S. B., Karle, A., Kileff, G., Jenkins, K. R., Kooijman, P., Kreymer, A., Loving, D. A., LaFond, G. M., Lang, K., Lazar, J. P., Li, R., Liu, K., Mánek, P., Marshak, M. L., Meier, J. R., Miller, W., Nelson, J. K., Ng, C., Nichol, R. J., Paolone, V., Perch, A., Pfützner, M. M., Radovic, A., Rawlins, K., Roedl, P., Rogers, L., Safa, I., Sousa, A., Tingey, J., Thomas, J., Trokan-Tenorio, J., Vahle, P., Wade, R., Wendt, C., Wendt, D., Whitehead, L. H., Wolcott, S., Yuan, T.

Subject Terms: Physics - Instrumentation and Detectors, High Energy Physics - Experiment

Access URL: http://arxiv.org/abs/2401.11728

Electron mobility in thin In0.53Ga0.47As channel

Authors: Cartier, E., Majumdar, A., Lee, K.-T., Ando, T., Frank, M. M., Rozen, J., Jenkins, K. A., Liang, C., Cheng, C.-W., Bruley, J., Hopstaken, M., Kerber, P., Yau, J.-B., Sun, X., Mo, R. T., Yeh, C.-C., Leobandung, E., Narayanan, V.

Source: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :292-295 Sep, 2017

Relation: ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

Interlaminar Insulation Faults Detection and Quality Assessment of Magnetic Cores Using Flux Injection Probe

Authors: Hamzehbahmani, H., Anderson, P., Jenkins, K.

Source: IEEE Transactions on Power Delivery IEEE Trans. Power Delivery Power Delivery, IEEE Transactions on. 30(5):2205-2214 Oct, 2015

On-chip circuit for measuring multi-GHz clock signal waveforms

Authors: Jenkins, K. A, Restle, P., Wang, P. Z., Hogenmiller, D., Boerstler, D., Bucelot, T.

Source: 2013 IEEE 31st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2013 IEEE 31st. :1-4 Apr, 2013

Relation: 2013 IEEE 31st VLSI Test Symposium (VTS)

The impact of 10-valent pneumococcal vaccine introduction on invasive disease in Fiji

Authors: Reyburn, R., Tuivaga, E.J., Ratu, F.T., Dunne, E.M., Nand, D., Kado, J., Jenkins, K., Tikoduadua, L., Jenney, A., Howden, B.P., Ballard, S.A., Fox, K., Devi, R., Satzke, C., Rafai, E., Kama, M., Flasche, S., Mulholland, E.K., Russell, F.M.

Source: In The Lancet Regional Health - Western Pacific March 2022 20

ANALYSIS OF THE STATE OF THE ART IN KNOWLEDGE ECONOMICS
Institute of Industrial and Systems Engineers Annual conference, IISE

Authors: Jenkins, K., Beruvides, M.

Source: Industrial and systems engineering conference. 1:388-392

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN606808019&indx=1&recIds=ETOCCN606808019

Electrical characterization of 3D Through-Silicon-Vias

Authors: Liu, F., Gu, X., Jenkins, K. A., Cartier, E. A., Liu, Y., Song, P., Koester, S. J.

Source: 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th. :1100-1105 Jun, 2010

Relation: 2010 IEEE 60th Electronic Components and Technology Conference (ECTC 2010)

The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking

Authors: Fluhr, E. J., Baumgartner, S., Boerstler, D., Bulzacchelli, J. F., Diemoz, T., Dreps, D., English, G., Friedrich, J., Gattiker, A., Gloekler, T., Gonzalez, C., Hibbeler, J. D., Jenkins, K. A., Kim, Y., Muench, P., Nett, R., Paredes, J., Pille, J., Plass, D., Restle, P., Robertazzi, R., Shan, D., Siljenberg, D., Sperling, M., Stawiasz, K., Still, G., Toprak-Deniz, Z., Warnock, J., Wiedemeier, G., Zyuban, V.

Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 50(1):10-23 Jan, 2015

Performance comparison and channel length scaling of strained Si FETs on SiGe-on-insulator (SGOI)

Authors: Cai, J., Rim, K., Bryant, A., Jenkins, K., Ouyang, C., Singh, D., Ren, Z., Lee, K., Yin, H., Hergenrother, J., Kanarsky, T., Kumar, A., Wang, X., Bedell, S., Reznicek, A., Hovel, H., Sadana, D., Uriarte, D., Mitchell, R., Ott, J., Mocuta, D., O'Neil, P., Mocuta, A., Leobandung, E., Miller, R., Haensch, W., Leong, M.

Source: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :165-168 2004

Relation: 2004 International Electron Devices Meeting

Characterization of TSV-Induced Loss and Substrate Noise Coupling in Advanced Three-Dimensional CMOS SOI Technology

Authors: Gu, X., Silberman, J. A., Young, A. M., Jenkins, K. A., Dang, B., Liu, Y., Duan, X., Gordin, R., Shlafman, S., Goren, D.

Source: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 3(11):1917-1925 Nov, 2013

Vertical SiGe-base bipolar transistors on CMOS-compatible SOI substrate

Authors: Jin Cai, Kumar, M., Steigerwalt, M., Ho, H., Schonenberg, K., Stein, K., Huajie Chen, Jenkins, K., Qiqing Ouyang, Oldiges, P., Tak Ning

Source: 2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 2003. Proceedings of the. :215-218 2003

Relation: Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting

High-performance and area-efficient stacked transformers for RF CMOS integrated circuits

Authors: Fong, N., Plouchart, J.-O., Zamdmer, N., Jonghae Kim, Jenkins, K., Plett, C., Tarr, G.

Source: IEEE MTT-S International Microwave Symposium Digest, 2003 Microwave symposium digest Microwave Symposium Digest, 2003 IEEE MTT-S International. 2:967-970 vol.2 2003

Relation: IEEE MTT-S International Microwave Symposium - IMS 2003

Effect of HCI degradation on the variability of MOSFETS

Authors: Zhou, C., Jenkins, K. A., Chuang, P.I., Vezyrtzis, C.

Source: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :P-RT.1-1-P-RT.1-4 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

Comparative analysis of neural network filters and adaptive Volterra filters

Authors: Krusienski, D.J., Jenkins, K.

Source: Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257) Midwest symposium on circuits and systems Circuits and Systems, 2001. MWSCAS 2001. Proceedings of the 44th IEEE 2001 Midwest Symposium on. 1:49-52 vol.1 2001

Relation: Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001

A gossip protocol for subgroup multicast

Authors: Jenkins, K., Hopkinson, K., Birman, K.

Source: Proceedings 21st International Conference on Distributed Computing Systems Workshops Distributed computing systems workshops Distributed Computing Systems Workshop, 2001 International Conference on. :25-30 2001

Relation: Proceedings 21st International Conference on Distributed Computing Systems Workshops

Logarithmic Harary graphs

Authors: Jenkins, K., Demers, A.

Source: Proceedings 21st International Conference on Distributed Computing Systems Workshops Distributed computing systems workshops Distributed Computing Systems Workshop, 2001 International Conference on. :43-48 2001

Relation: Proceedings 21st International Conference on Distributed Computing Systems Workshops

A Comparison of Magnetic Domain Images Using a Modified Bitter Pattern Technique and the Kerr Method on Grain-Oriented Electrical Steel

Authors: Xu, X. T., Moses, A. J., Hall, J. P., Williams, P. I., Jenkins, K.

Source: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 47(10):3531-3534 Oct, 2011

RF potential of a 0.18-/spl mu/m CMOS logic technology

Authors: Burghartz, J.N., Hargrove, M., Webster, C., Groves, R., Keenes, M., Jenkins, K., Edelstein, D., Logan, R., Nowak, E.

Source: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :853-856 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry

Authors: Rao, R., Jenkins, K. A., Kim, J.-J.

Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 44(9):2616-2623 Sep, 2009

An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process

Authors: Mukhopadhyay, S., Kim, K., Jenkins, K. A., Chuang, C.-T., Roy, K.

Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 43(9):1951-1963 Sep, 2008