Trace element and OH content of quartz grains in the Amazon river: Potential application in provenance analysis

Authors: Stalder, R. ^{a, ⁎}, Jaeger, D. ^a, Andò, S. ^b, Garzanti, E. ^b, Chiessi, C.M. ^c, Sawakuchi, A.O. ^d, Ludwig, T. ^e, Strasser, M. ^a

Source: In Sedimentary Geology 15 April 2025 480

COGNITION: a prospective precision oncology trial for patients with early breast cancer at high risk following neoadjuvant chemotherapy

Authors: Pixberg, C., Zapatka, M., Hlevnjak, M., Benedetto, S., Suppelna, J.P., Heil, J., Smetanay, K., Michel, L., Fremd, C., Körber, V., Rübsam, M., Buschhorn, L., Heublein, S., Schäfgen, B., Golatta, M., Gomez, C., von Au, A., Wallwiener, M., Wolf, S., Dikow, N., Schaaf, C., Gutjahr, E., Allgäuer, M., Stenzinger, A., Pfütze, K., Kirsten, R., Hübschmann, D., Sinn, H.-P., Jäger, D., Trumpp, A., Schlenk, R., Höfer, T., Thewes, V., Schneeweiss, A., Lichter, P.

Source: In ESMO Open December 2022 7(6)

Acute effect of Sit-up versus Curl-up on the interrecti distance: A cross-sectional study in parous women

Authors: Djivoh, Y.S., De Jaeger, D.

Source: Progrès en urologie. 32(11):776-783

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100170828927.0x000001&indx=1&recIds=ETOCvdc_100170828927.0x000001

The effects of an increased step frequency on running economy and injury risk factors during downhill running

Authors: Dewolf, A.H., Mesquita, R.M., De Jaeger, D.

Source: Science et sports. 37(5-6):446-453

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100169861411.0x000001&indx=1&recIds=ETOCvdc_100169861411.0x000001

Phase II multicohort study of atezolizumab monotherapy in multiple advanced solid cancers

Authors: Tabernero, J., Andre, F., Blay, J.-Y., Bustillos, A., Fear, S., Ganta, S., Jaeger, D., Maio, M., Mileshkin, L., Melero, I.

Source: In ESMO Open April 2022 7(2)

Artificial intelligence for detection of microsatellite instability in colorectal cancer—a multicentric analysis of a pre-screening tool for clinical application

Authors: Echle, A., Ghaffari Laleh, N., Quirke, P., Grabsch, H.I., Muti, H.S., Saldanha, O.L., Brockmoeller, S.F., van den Brandt, P.A., Hutchins, G.G.A., Richman, S.D., Horisberger, K., Galata, C., Ebert, M.P., Eckardt, M., Boutros, M., Horst, D., Reissfelder, C., Alwers, E., Brinker, T.J., Langer, R., Jenniskens, J.C.A., Offermans, K., Mueller, W., Gray, R., Gruber, S.B., Greenson, J.K., Rennert, G., Bonner, J.D., Schmolze, D., Chang-Claude, J., Brenner, H., Trautwein, C., Boor, P., Jaeger, D., Gaisa, N.T., Hoffmeister, M., West, N.P., Kather, J.N.

Source: In ESMO Open April 2022 7(2)

Atomically-precise three-dimensional top down fabrication

Authors: Ballard, J. B., Owen, J. H. G., Fuchs, E., McDonnell, S., Dick, D., Mordi, G., Azcatl, A., Seitz, O., Campbell, P., Veyan, J. F., Chabal, Y., Wallace, R. M., Bischof, M., Jaeger, D., Reidy, R., Sarkar, N., Randall, J. N.

Source: 2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII) Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on. :764-767 Jun, 2013

Relation: 2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII)

Rationale and design of the CRAFT (Continuous ReAssessment with Flexible ExTension in Rare Malignancies) multicenter phase II trial

Authors: Heilig, C.E., Horak, P., Kreutzfeldt, S., Teleanu, V., Mock, A., Renner, M., Bhatti, I.A., Hutter, B., Hüllein, J., Fröhlich, M., Uhrig, S., Süße, H., Heiligenthal, L., Ochsenreither, S., Illert, A.L., Vogel, A., Desuki, A., Heinemann, V., Heidegger, S., Bitzer, M., Scheytt, M., Brors, B., Hübschmann, D., Baretton, G., Stenzinger, A., Steindorf, K., Benner, A., Jäger, D., Heining, C., Glimm, H., Fröhling, S., Schlenk, R.F.

Source: In ESMO Open December 2021 6(6)

A 7nm CMOS technology platform for mobile and high performance compute application

Authors: Narasimha, S., Jagannathan, B., Ogino, A., Jaeger, D., Greene, B., Sheraw, C., Zhao, K., Haran, B., Kwon, U., Mahalingam, A. K. M., Kannan, B., Morganfeld, B., Dechene, J., Radens, C., Tessier, A., Hassan, A., Narisetty, H., Ahsan, I., Aminpur, M., An, C., Aquilino, M., Arya, A., Augur, R., Baliga, N., Bhelkar, R., Biery, G., Blauberg, A., Borjemscaia, N., Bryant, A., Cao, L., Chauhan, V., Chen, M., Cheng, L., Choo, J., Christiansen, C., Chu, T., Cohen, B., Coleman, R., Conklin, D., Crown, S., da Silva, A., Dechene, D., Derderian, G., Deshpande, S., Dilliway, G., Donegan, K., Eller, M., Fan, Y., Fang, Q., Gassaria, A., Gauthier, R., Ghosh, S., Gifford, G., Gordon, T., Gribelyuk, M., Han, G., Han, J.H., Han, K., Hasan, M., Higman, J., Holt, J., Hu, L., Huang, L., Huang, C., Hung, T., Jin, Y., Johnson, J., Johnson, S., Joshi, V., Joshi, M., Justison, P., Kalaga, S., Kim, T., Kim, W., Krishnan, R., Krishnan, B., Anil, K., Kumar, M., Lee, J., Lee, R., Lemon, J., Liew, S.L., Lindo, P., Lingalugari, M., Lipinski, M., Liu, P., Liu, J., Lucarini, S., Ma, W., Maciejewski, E., Madisetti, S., Malinowski, A., Mehta, J., Meng, C., Mitra, S., Montgomery, C., Nayfeh, H., Nigam, T., Northrop, G., Onishi, K., Ordonio, C., Ozbek, M., Pal, R., Parihar, S., Patterson, O., Ramanathan, E., Ramirez, I., Ranjan, R., Sarad, J., Sardesai, V., Saudari, S., Schiller, C., Senapati, B., Serrau, C., Shah, N., Shen, T., Sheng, H., Shepard, J., Shi, Y., Silvestre, M.C., Singh, D., Song, Z., Sporre, J., Srinivasan, P., Sun, Z., Sutton, A., Sweeney, R., Tabakman, K., Tan, M., Wang, X., Woodard, E., Xu, G., Xu, D., Xuan, T., Yan, Y., Yang, J., Yeap, K.B., Yu, M., Zainuddin, A., Zeng, J., Zhang, K., Zhao, M., Zhong, Y., Carter, R., Lin, C.-H., Grunow, S., Child, C., Lagus, M., Fox, R., Kaste, E., Gomba, G., Samavedam, S., Agnello, P., Sohn, D. K.

Source: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.5.1-29.5.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

Solid-state 8 GHz transient signal digitizer characterization

Authors: Ghis, A., Ouvrier-Buffet, P., Rolland, N., Benlarbi-Delai, A., Rolland, P.A., Glay, D., Jaeger, D.

Source: 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278) Microwave symposium digest Microwave Symposium Digest, 2002 IEEE MTT-S International. 3:1673-1676 vol.3 2002

Relation: Proceedings of 2002 International Microwave Symposium (MTT 2002)

Recommandations de pratiques professionnelles portant sur la gestion d'un appel pour suspicion d'arrêt cardiaque dans un centre d'appel d'urgence. (French)

Authors: Debaty, G., Baladi, N., Bois, G., Canon, V., Chouihed, T., Maluga, A., Derkenne, C., Dumas, F., Genbrugge, C., Gil-Jardiné, C., Heidet, M., Hubert, H., Jabre, P., Jaeger, D., Javaudin, F., Jost, D., Lamhaut, L., Perret, E., Quirin, L., Renard, A.

Source: Annales Françaises de Médecine d'Urgence; nov/dec2024, Vol. 14 Issue 6, p398-412, 15p

Subject Terms: MEDICAL protocols, CONSENSUS (Social sciences), HUMAN services programs, MEDICAL personnel, HEALTH policy, EMERGENCY medical services communication systems, CARDIAC arrest, CARDIOPULMONARY resuscitation, EXPERTISE, HEALTH care teams

Geographic Terms: FRANCE

Bottom-up assembly of metallic germanium

Authors: Scappucci, G., Klesse, W. M., Yeoh, L. A., Carter, D. J., Warschkow, O., Marks, N. A., Jaeger, D. L., Capellini, G., Simmons, M. Y., Hamilton, A. R.

Subject Terms: Condensed Matter - Materials Science

Access URL: http://arxiv.org/abs/1503.05994

A Novel Analytical Model as a Design Tool for Uni-Traveling-Carrier Traveling Wave Photo Detectors Approaching 1 THz

Authors: Madjar, A., Koka, N., Bloch, J., Yu, P. K. L., Stoehr, A., Jaeger, D. S.

Source: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 57(1):223-230 Jan, 2009

An interdigitated electrode detector for the identification of a single specific DNA molecule fragment

Authors: Fuller, L.F., Vega, R., Manley, R., Vee Chee Hwang, Jaeger, D., Pham, A., Wescott, N., Connolly, M.

Source: Proceedings of the 15th Biennial University/Government/ Industry Microelectronics Symposium (Cat. No.03CH37488) University/government/industry microelectronics symposium University/Government/Industry Microelectronics Symposium, 2003. Proceedings of the 15th Biennial. :200-202 2003

Relation: 15th Biennial University/Government/Industry Microelectronics Symposium

Boost of cable capacity by DVB-C2 considering realistic channel conditions

Authors: Hasse, P., Jaeger, D., Robert, J.

Source: 2010 Digest of Technical Papers International Conference on Consumer Electronics (ICCE) Consumer Electronics (ICCE), 2010 Digest of Technical Papers International Conference on. :19-20 Jan, 2010

Relation: 2010 IEEE International Conference on Consumer Electronics (ICCE)

High-κ/metal gate low power bulk technology - Performance evaluation of standard CMOS logic circuits, microprocessor critical path replicas, and SRAM for 45nm and beyond

Authors: Park, D.-G., Stein, K., Schruefer, K., Lee, Y., Han, J.-P., Li, W., Yin, H., Pacha, C., Kim, N., Ostermayr, M., Eller, M., Kim, S., Kim, K., Han, S., von Arnim, K., Moumen, N., Hatzistergos, M., Tang, T., Loesing, R., Chen, X., Jaeger, D., Zhuang, H., Chen, J., Yan, W., Kanarsky, T., Chowdhury, M., Haetty, Jens, Schepis, D., Chudzik, M., Theon, V.-Y., Samavedam, S., Narayanan, V., Sherony, M., Lindsay, R., Steegen, A., Divakaruni, R., Khare, M.

Source: 2009 International Symposium on VLSI Technology, Systems, and Applications VLSI Technology, Systems, and Applications, 2009. VLSI-TSA '09. International Symposium on. :90-92 Apr, 2009

Relation: 2009 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)

Stabilization of sputtered AlN/sapphire templates during high temperature annealing

Authors: Hagedorn, S., Walde, S., Mogilatenko, A., Weyers, M., Cancellara, L., Albrecht, M., Jaeger, D.

Source: In Journal of Crystal Growth 15 April 2019 512:142-146

Scaling of 32nm low power SRAM with high-K metal gate

Authors: Yang, H. S., Wong, R., Hasumi, R., Gao, Y., Kim, N.S., Lee, D. H., Badrudduza, S., Nair, D., Ostermayr, M., Kang, H., Zhuang, H., Li, J., Kang, L., Chen, X., Thean, A., Arnaud, F., Zhuang, L., Schiller, C., Sun, D. P., Teh, Y. W., Wallner, J., Takasu, Y., Stein, K., Samavedam, S., Jaeger, D., Baiocco, C.V., Sherony, M., Khare, M., Lage, C., Pape, J., Sudijono, J., Steegen, A.L., Stiffler, S.

Source: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)

A cost effective 32nm high-K/ metal gate CMOS technology for low power applications with single-metal/gate-first process

Authors: Chen, X., Samavedam, S., Narayanan, V., Stein, K., Hobbs, C., Baiocco, C., Li, W., Jaeger, D., Zaleski, M., Yang, H. S., Kim, N., Lee, Y., Zhang, D., Kang, L., Chen, J., Zhuang, H., Sheikh, A., Wallner, J., Aquilino, M., Han, J., Jin, Z., Li, J., Massey, G., Kalpat, S., Jha, R., Moumen, N., Mo, R., Kirshnan, S., Wang, X., Chudzik, M., Chowdhury, M., Nair, D., Reddy, C., Teh, Y. W., Kothandaraman, C., Coolbaugh, D., Pandey, S., Tekleab, D., Thean, A., Sherony, M., Lage, C., Sudijono, J., Lindsay, R., Ku, J. H., Khare, M., Steegen, A.

Source: 2008 Symposium on VLSI Technology VLSI Technology, 2008 Symposium on. :88-89 Jun, 2008

Relation: 2008 Symposium on VLSI Technology

Integrated InGaAs pin-diode on exactly oriented silicon (001) substrate suitable for 10 Gbit/s digital applications

Authors: Poloczek, A., Weiss, M., Fedderwitz, S., Stoehr, A., Prost, W., Jaeger, D., Tegude, F.-J.

Source: LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE. :180-181 Oct, 2007

Relation: LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings