Showing 1 - 20 results of 37 Refine Results
  1. 1
    Academic Journal

    Giving Back: Contributions Congruent to Library Dependency Changes in a Software Ecosystem

    Authors: Wattanakriengkrai, S., Wang, D., Kula, R.G., Treude, C., Thongtanunam, P., Ishio, T., Matsumoto, K.

    Source: IEEE Transactions on Software Engineering IIEEE Trans. Software Eng. Software Engineering, IEEE Transactions on. 49(4):2566-2579 Apr, 2023

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  2. 2
    Academic Journal

    Characterizing and Mitigating Self-Admitted Technical Debt in Build Systems

    Authors: Xiao, T., Wang, D., McIntosh, S., Hata, H., Kula, R.G., Ishio, T., Matsumoto, K.

    Source: IEEE Transactions on Software Engineering IIEEE Trans. Software Eng. Software Engineering, IEEE Transactions on. 48(10):4214-4228 Oct, 2022

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  3. 3
    Conference

    Visualizing the Evolution of Systems and Their Library Dependencies

    Authors: Kula, R.G., De Roover, C., German, D., Ishio, T., Inoue, K.

    Source: 2014 Second IEEE Working Conference on Software Visualization Software Visualization (VISSOFT), 2014 Second IEEE Working Conference on. :127-136 Sep, 2014

    Relation: 2014 Second IEEE Working Conference on Software Visualization (VISSOFT)

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  4. 4
    Conference

    Extracting sequence diagram from execution trace of Java program

    Authors: Taniguchi, K., Ishio, T., Kamiya, T., Kusumoto, S., Inoue, K.

    Source: Eighth International Workshop on Principles of Software Evolution (IWPSE'05) Software Evolution Principles of Software Evolution, Eighth International Workshop on. :148-151 2005

    Relation: Proceedings. Eighth International Workshop on Principles of Software Evolution

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  5. 5
    Conference

    Web-service for finding cloned files using b-bit minwise hashing

    Authors: Ito, K., Ishio, T., Inoue, K.

    Source: 2017 IEEE 11th International Workshop on Software Clones (IWSC) Software Clones (IWSC), 2017 IEEE 11th International Workshop on. :1-2 Feb, 2017

    Relation: 2017 IEEE 11th International Workshop on Software Clones (IWSC)

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  6. 6
    Conference

    Debugging support for aspect-oriented program based on program slicing and call graph

    Authors: Ishio, T., Kusumoto, S., Inoue, K.

    Source: 20th IEEE International Conference on Software Maintenance, 2004. Proceedings. Software maintenance Software Maintenance, 2004. Proceedings. 20th IEEE International Conference on. :178-187 2004

    Relation: Proceedings. 20th IEEE International Conference on Software Maintenance

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  7. 7
    Conference

    Program slicing tool for effective software evolution using aspect-oriented technique

    Authors: Ishio, T., Kusumoto, S., Inoue, K.

    Source: Sixth International Workshop on Principles of Software Evolution, 2003. Proceedings. Principles of software evolution Software Evolution, 2003. Proceedings. Sixth International Workshop on Principles of. :3-12 2003

    Relation: Proceedings. Sixth International Workshop on Principles of Software Evolution

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  8. 8
    Conference

    Development of high density memory IC package by stacking IC chips

    Authors: Nakanishi, H., Maruyama, T., Miyata, K., Ishio, T., Sota, Y., Narai, A., Fukunaga, S., Toyosawa, K., Fujita, K., Kada, M.

    Source: 1995 Proceedings. 45th Electronic Components and Technology Conference Electronic components and technology Electronic Components and Technology Conference, 1995. Proceedings., 45th. :634-640 1995

    Relation: 1995 Proceedings. 45th Electronic Components and Technology Conference

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  9. 9
    Conference

    Development of 0.45 mm thick Ultra-Thin Small Outline Package (UTSOP)

    Authors: Omi, S., Maruyama, T., Ishio, T., Narai, A., Sota, Y., Toyosawa, K., Fujiita, K., Maeda, T.

    Source: 1994 Proceedings. 44th Electronic Components and Technology Conference Electronic components and technology Electronic Components and Technology Conference, 1994. Proceedings., 44th. :498-505 1994

    Relation: 1994 Proceedings. 44th Electronic Components and Technology Conference

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  10. 10
    Academic Journal

    Development of 0.45-mm thick ultra-thin small outline package

    Authors: Omi, S., Maruyama, T., Ishio, T., Narai, A., Sota, Y., Toyosawa, K., Fujita, K., Maeda, T.

    Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B IEEE Trans. Comp., Packag., Manufact. Technol. B Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on. 18(3):471-477 Aug, 1995

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  11. 11
    Conference

    Java program analysis projects in osaka university: aspect-based slicing system ADAS and ranked-component search system SPARS-J

    Authors: Yokomori, R., Ishio, T., Yamamoto, T., Matsushita, M., Kusumoto, S., Inoue, K.

    Source: 25th International Conference on Software Engineering, 2003. Proceedings. Software engineering Software Engineering, 2003. Proceedings. 25th International Conference on. :828-829 2003

    Relation: IEEE 25th International Conference on Software Engineering

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  12. 12
    Conference

    Aspect-oriented modularization of assertion crosscutting objects

    Authors: Ishio, T., Kamiya, T., Kusumoto, S., Inoue, K.

    Source: 12th Asia-Pacific Software Engineering Conference (APSEC'05) Asia-Pacific Software Engineering Conference Software Engineering Conference, 2005. APSEC '05. 12th Asia-Pacific. :8 pp. 2005

    Relation: Proceedings. 12th Asia-Pacific Software Engineering Conference

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  13. 13
    Academic Journal

    P559: HUMORAL RESPONSE TO MRNA‐BASED COVID‐19 VACCINE IN PATIENTS WITH MYELOID MALIGNANCIES.

    Authors: Mori, A., Onozawa, M., Tsukamoto, S., Ishio, T., Yokoyama, E., Izumiyama, K., Saito, M., Muraki, H., Morioka, M., Teshima, T., Kondo, T.

    Source: HemaSphere; 2022 Supplement 3, Vol. 6, p458-459, 2p

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  14. 14
    Conference

    Mining Coding Patterns to Detect Crosscutting Concerns in Java Programs.

    Authors: Ishio, T., Date, H., Miyake, T., Inoue, K.

    Source: 2008 15th Working Conference on Reverse Engineering; 2008, p123-132, 10p

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  15. 15
    Academic Journal

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  16. 16
    Academic Journal

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  17. 17
    Academic Journal

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  18. 18
    Academic Journal

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  19. 19
    Academic Journal

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  20. 20
    Academic Journal

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