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1Academic Journal
Authors: Hazzab, A., Gouabi, H., Habbab, M., Rezkallah, M., Chandra, A., Ibrahim, H.
Source: IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 61(1):642-652 Jan, 2025
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2Academic Journal
Authors: Ibrahim H. Alzahrani (ORCID
0009-0000-7826-9761 ), Mohammad R. Alnufaie (ORCID0000-0003-0646-8539 )Source: TESL-EJ. 2024 28(2).
Peer Reviewed: Y
Page Count: 19
Descriptors: Self Management, Learning Strategies, English (Second Language), Second Language Learning, College Students, Males, Student Attitudes, Learning Processes, Socialization, Foreign Countries, Arabs
Geographic Terms: Saudi Arabia
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3Conference
Source: 2024 9th International Conference on Mechatronics Engineering (ICOM) Mechatronics Engineering (ICOM), 2024 9th International Conference on. :281-287 Aug, 2024
Relation: 2024 9th International Conference on Mechatronics Engineering (ICOM)
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4Conference
Authors: Aref, Mohamed Hisham Fouad, Aboughaleb, Ibrahim H., Abbass, Mohamed A., Hussein, Abdallah Abdelkader, El-Ghaffar, Sara Abd, Sabry, Yasser M.
Source: 2024 14th International Conference on Electrical Engineering (ICEENG) Electrical Engineering (ICEENG), 2024 14th International Conference on. :137-141 May, 2024
Relation: 2024 14th International Conference on Electrical Engineering (ICEENG)
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5Report
Authors: Qattan, I. A., Arrington, J., Aniol, K., Baker, O. K., Beams, R., Brash, E. J., Camsonne, A., Chen, J. -P., Christy, M. E., Dutta, D., Ent, R., Gaskell, D., Gayou, O., Gilman, R., Hansen, J. -O., Higinbotham, D. W., Holt, R. J., Huber, G. M., Ibrahim, H., Jisonna, L., Jones, M. K., Keppel, C. E., Kinney, E., Kumbartzki, G. J., Lung, A., McCormick, K., Meekins, D., Michaels, R., Monaghan, P., Pentchev, L., Ransome, R., Reinhold, J., Reitz, B., Sarty, A., Schulte, E. C., Slifer, K., Segel, R. E., Sulkosky, V., Yurov, M., Zheng, X.
Subject Terms: Nuclear Experiment
Access URL: http://arxiv.org/abs/2411.05201
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6Report
Authors: Abrams, D., Albataineh, H., Aljawrneh, B. S., Alsalmi, S., Androic, D., Aniol, K., Armstrong, W., Arrington, J., Atac, H., Averett, T., Gayoso, C. Ayerbe, Bai, X., Bane, J., Barcus, S., Beck, A., Bellini, V., Bhatt, H., Bhetuwal, D., Biswas, D., Blyth, D., Boeglin, W., Bulumulla, D., Butler, J., Camsonne, A., Carmignotto, M., Castellanos, J., Chen, J. -P., Cloët, I. C., Cohen, E. O., Covrig, S., Craycraft, K., Cruz-Torres, R., Dongwi, B., Duran, B., Dutta, D., Fomin, N., Fuchey, E., Gal, C., Gautam, T. N., Gilad, S., Gnanvo, K., Gogami, T., Gomez, J., Gu, C., Habarakada, A., Hague, T., Hansen, J. -O., Hattawy, M., Hauenstein, F., Higinbotham, D. W., Holt, R. J., Hughes, E. W., Hyde, C., Ibrahim, H., Jian, S., Joosten, S., Karki, A., Karki, B., Katramatou, A. T., Keith, C., Keppel, C., Khachatryan, M., Khachatryan, V., Khanal, A., Kievsky, A., King, D., King, P. M., Korover, I., Kulagin, S. A., Kumar, K. S., Kutz, T., Lashley-Colthirst, N., Li, S., Li, W., Liu, H., Liuti, S., Liyanage, N., Markowitz, P., McClellan, R. E., Meekins, D., Beck, S. Mey-Tal, Meziani, Z. -E., Michaels, R., Mihovilovic, M., Nelyubin, V., Nguyen, D., Nuruzzaman, Nycz, M., Obrecht, R., Olson, M., Owen, V. F., Pace, E., Pandey, B., Pandey, V., Paolone, M., Papadopoulou, A., Park, S., Paul, S., Petratos, G. G., Petti, R., Piasetzky, E., Pomatsalyuk, R., Premathilake, S., Puckett, A. J. R., Punjabi, V., Ransome, R. D., Rashad, M. N. H., Reimer, P. E., Riordan, S., Roche, J., Salmè, G., Santiesteban, N., Sawatzky, B., Scopetta, S., Schmidt, A., Schmookler, B., Segal, J., Segarra, E. P., Shahinyan, A., Širca, S., Sparveris, N., Su, T., Suleiman, R., Szumila-Vance, H., Tadepalli, A. S., Tang, L., Tireman, W., Tortorici, F., Urciuoli, G. M., Wojtsekhowski, B., Wood, S., Ye, Z. H., Ye, Z. Y., Zhang, J.
Subject Terms: Nuclear Experiment
Access URL: http://arxiv.org/abs/2410.12099
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7Conference
Authors: Omeed, Holan K., Alani, Ahmed O., Rasul, Ibrahim H., Ashir, Abubakar M., Mohammed, Sava Ahmed
Source: 2024 21st International Multi-Conference on Systems, Signals & Devices (SSD) Multi-Conference on Systems, Signals & Devices (SSD), 2024 21st International. :124-131 Apr, 2024
Relation: 2024 21st International Multi-Conference on Systems, Signals & Devices (SSD)
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8Academic Journal
Authors: Ko, W., Ramos-Ruiz, J.A., Huang, T., Kim, J., Ibrahim, H., Enjeti, P.N., Kumar, P.R., Xie, L.
Source: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 71(7):7106-7116 Jul, 2024
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9Academic Journal
Authors: Mohammad R. Alnufaie (ORCID
0000-0003-0646-8539 ), Ibrahim H. Alzahrani (ORCID0009-0000-7826-9761 )Source: TESL-EJ. 2024 27(4).
Peer Reviewed: Y
Page Count: 15
Descriptors: Learning Strategies, Grammar, Second Language Learning, Second Language Instruction, Arabic, Native Language, English (Second Language), Foreign Countries, Correlation, Metacognition, Student Attitudes, Measures (Individuals), College Preparation, Language Proficiency, Guidelines, Rating Scales, English for Academic Purposes, Arabs
Geographic Terms: Saudi Arabia, Europe
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10Academic Journal
Authors: Ibrahim, H., Debicki, M., Rahwan, T., Zaki, Y.
Source: IEEE Transactions on Computational Social Systems IEEE Trans. Comput. Soc. Syst. Computational Social Systems, IEEE Transactions on. 11(3):3741-3752 Jun, 2024
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11Conference
Source: 2023 14th International Renewable Energy Congress (IREC) Renewable Energy Congress (IREC), 2023 14th International. :1-6 Dec, 2023
Relation: 2023 14th International Renewable Energy Congress (IREC)
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12Conference
Authors: Gouabi, H., Hazzab, A., Rezkallah, M., Habbab, M., Ibrahim, H., Chandra, A.
Source: 2023 IEEE Industry Applications Society Annual Meeting (IAS) Industry Applications Society Annual Meeting (IAS), 2023 IEEE. :1-6 Oct, 2023
Relation: 2023 IEEE Industry Applications Society Annual Meeting (IAS)
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13Academic Journal
Authors: Ibrahim, H. I., Abdulrasheed, M., Hamza, J. A., Mohammed, S. A., Ibrahim, S., Babayo, C., Nicholas M. P.
Source: UMYU Journal of Microbiology Research, Vol 5, Iss 2 (2020)
Subject Terms: Microorganisms, microbiological quality, ready-to-eat foods, coliform group, faecal contamination, Microbiology, QR1-502
File Description: electronic resource
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14Academic Journal
Authors: Rahman, Z.U., Asaari, M.S.M., Ibrahim, H., Abidin, I.S.Z., Ishak, M.K.
Source: IEEE Access Access, IEEE. 12:179912-179943 2024
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15Academic Journal
Authors: Palaniappan, V., Ishak, I., Ibrahim, H., Sidi, F., Zukarnain, Z.A.
Source: IEEE Access Access, IEEE. 12:167471-167488 2024
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16Academic Journal
Authors: Rahman, M.T., Khan, R.R., Tian, Y., Ibrahim, H., Dong, L.
Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(17):18994-19001 Sep, 2023
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17Academic Journal
Authors: Jeffrey Radloff (ORCID
0000-0003-2625-6963 ), Dominick Fantacone, Ibrahim H. Yeter, Angela PaganoSource: Technology, Knowledge and Learning. 2024 29(2):997-1018.
Peer Reviewed: Y
Page Count: 22
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18Conference
Authors: Xie, Zerong, Radloff, Jeffrey, Wong, Gary K. W., Yeter, Ibrahim H.
Source: 2022 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE) TALE Teaching, Assessment and Learning for Engineering (TALE), 2022 IEEE International Conference on. :548-553 Dec, 2022
Relation: 2022 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)
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19Conference
Source: 2022 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE) TALE Teaching, Assessment and Learning for Engineering (TALE), 2022 IEEE International Conference on. :810-813 Dec, 2022
Relation: 2022 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)
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20Conference
Authors: Sourav, Sakib Ullah, Hou, Violetta Chunyu, Morsten, Sophia Linda, Diordieva, Cristina, Radloff, Jeffrey, Park, Mihwa, Yeter, Ibrahim H.
Source: 2022 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE) TALE Teaching, Assessment and Learning for Engineering (TALE), 2022 IEEE International Conference on. :740-743 Dec, 2022
Relation: 2022 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)