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1Conference
Authors: Yang, M.T., Yeh, T.J., Lin, W.C., Hsu, H.M., Ho, P.P.C., Wang, Y.J., Chia, Y.T., Tang, D.D.L.
Source: IEEE MTT-S International Microwave Symposium Digest, 2003 Microwave symposium digest Microwave Symposium Digest, 2003 IEEE MTT-S International. 2:1283-1286 vol.2 2003
Relation: IEEE MTT-S International Microwave Symposium - IMS 2003
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2Conference
Authors: Lin, J.C.H., Yeh, T.H., Lee, C.Y., Chen, C.H., Tsay, J.L., Chen, S.H., Hsu, H.M., Chen, C.W., Huang, C.F., Chiang, J.M., Chang, A., Chang, R.Y., Chang, C.L., Wang, S.H., Wu, C.C., Lin, C.Y., Chu, Y.L., Chen, S.M., Hsu, C.K., Liou, R.S., Wong, S.C., Tang, D., Sun, J.Y.C.
Source: Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 2002. Proceedings of the 2002. :73-79 2002
Relation: 2002 IEEE Bipolar/BICMOS Circuits and Technology Meeting
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3Conference
Authors: Lin, C.C., Hsu, H.M., Chen, Y.H., Shih, T., Jang, S.M., Yu, C.H., Liang, M.S.
Source: Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461) Interconnect technology conference Interconnect Technology Conference, 2001. Proceedings of the IEEE 2001 International. :113-115 2001
Relation: Proceedings of the IEEE 2001 International Interconnect Technology Conference
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4Conference
Authors: Chen, C.H., Chang, C.S., Chao, C.P., Kuan, J.F., Chang, C.L., Wang, S.H., Hsu, H.M., Lien, W.Y., Tsai, Y.C., Lin, H.C., Wu, C.C., Huang, C.F., Chen, S.M., Tseng, P.M., Chen, C.W., Ku, C.C., Lin, T.Y., Chang, C.F., Lin, H.J., Tsai, M.R., Chen, S., Chen, C.F., Wei, M.Y., Wang, Y.J., Lin, J.C.H., Chen, W.M., Chang, C.C., King, M.C., Huang, C.M., Lin, C.T., Guo, J.C., Chern, G.J., Tang, D.D., Sun, J.Y.C.
Source: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :2.5.1-2.5.4 2003
Relation: IEEE International Electron Devices Meeting 2003
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5Conference
Authors: Tang, D.D., Lin, W.C., Lai, L.S., Wang, C.H., Lee, L.P., Hsu, H.M., Wu, C.M., Chang, C.W., Lien, W.Y., Chao, C.P., Lee, C.Y., Chern, G.J., Guo, J.C., Chang, C.S., Sun, Y.C., Du, D.S., Lan, K.C., Lin, L.F.
Source: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :28.6.1-28.6.4 2003
Relation: IEEE International Electron Devices Meeting 2003
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6Academic Journal
Authors: Hsu, H.M., Chang, S.H.C., Huang, Y.C., Chen, K.B.
Source: In Value in Health November 2012 15(7):A625-A625
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7Academic Journal
Authors: Wang, S.M., Kuo, L.C., Ouyang, W.C., Hsu, H.M., Ma, H.I.
Source: In Asian Journal of Psychiatry 2011 4 Supplement 1:S72-S72
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8Periodical
Authors: Wooster, G.A., Hsu, H.M., Bowser, P.R.
Source: Journal of Aquatic Animal Health; September 1993, Vol. 5 Issue: 3 p157-164, 8p