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    Conference

    Source: 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on. :236-239 Apr, 2008

    Relation: 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

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    Conference

    Source: 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023) Semiconductor manufacturing Semiconductor Manufacturing Conference Proceedings, 1997 IEEE International Symposium on. :P11-P13 1997

    Relation: 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

  20. 20
    Academic Journal

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