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1Conference
Sub-60 mV/dec Germanium Nanowire Field-Effect Transistors with 2-nm-thick Ferroelectric Hf0.5Zr0.5O2
Authors: Lin, Y.-W., Yu, T.-Y., Su, C.-J., Chen, Y.-N., Chang, H.-H., Luo, G.-L., Wu, C.-T., Wu, W.-F., Lin, K.-L., Hou, F.-J., Wu, Y.-C., Yeh, W.-K.
Source: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications (VLSI-TSA), 2021 International Symposium on. :1-2 Apr, 2021
Relation: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
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2Conference
Authors: Yeh, M.-S., Luo, G.-L., Hou, F.-J., Sung, P.-J., Wang, C.-J., Su, C.-J., Wu, C.-T., Huang, Y.-C., Hong, T.-C., Chao, T.-S., Chen, B.-Y., Chen, K.-M., Izawa, M., Miura, M., Morimoto, M., Ishimura, H., Lee, Y.-J., Wu, W.-F., Yeh, W.-K.
Source: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2018 IEEE 2nd. :205-207 Mar, 2018
Relation: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
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3Conference
Authors: Tang, Y.-T, Su, C.-J., Wang, Y.-S., Kao, K.-H., Wu, T.-L., Sung, P.-J., Hou, F.-J., Wang, C.-J., Yeh, M.-S., Lee, Y.-J., Wu, W.-F., Huang, G.-W., Shieh, J.-M., Yeh, W.-K., Wang, Y.-H.
Source: 2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :45-46 Jun, 2018
Relation: 2018 IEEE Symposium on VLSI Technology
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4Periodical
Authors: Xie, K. L., Wang, Z. F., Guo, Y. R., Zhang, C., Zhu, W. H., Hou, F. J.
Source: Animal bioscience. 35(6):838-846
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5Conference
Authors: Su, C.-J., Tang, Y.-T, Tsou, Y.-C., Sung, P.-J., Hou, F.-J., Wang, C.-J., Chung, S.-T., Hsieh, C.-Y., Yeh, Y.-S., Hsueh, F.-K., Kao, K.-H., Chuang, S.-S., Wu, C.-T., You, T.-Y., Jian, Y.-L., Chou, T.-H., Shen, Y.-L., Chen, B.-Y., Luo, G.-L., Hong, T.-C., Huang, K.-P., Chen, M.-C., Lee, Y.-J., Chao, T.-S., Tseng, T.-Y., Wu, W.-F., Huang, G.-W., Shieh, J.-M., Yeh, W.-K., Wang, Y.-H.
Source: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T152-T153 Jun, 2017
Relation: 2017 Symposium on VLSI Technology
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6Conference
Authors: Sung, P.-J., Chang, C.-Y., Chen, L.-Y., Kao, K.-H., Su, C.-J., Liao, T.-H., Fang, C.-C., Wang, C.-J., Hong, T.-C., Jao, C.-Y., Hsu, H.-S., Luo, S.-X., Wang, Y.-S., Huang, H.-F., Li, J.-H., Huang, Y.-C., Hsueh, F.-K., Wu, C.-T., Huang, Y.-M., Hou, F.-J., Luo, G.-L., Shen, Y.-L., Ma, W. C.-Y., Huang, K.-P., Lin, K.-L., Samukawa, S., Li, Y., Huang, G.-W, Lee, Y.-J., Li, J.-Y., Wu, W.-F., Shieh, J.-M., Chao, T.-S., Yeh, W.-K., Wang, Y.-H.
Source: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :21.4.1-21.4.4 Dec, 2018
Relation: 2018 IEEE International Electron Devices Meeting (IEDM)
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7Conference
Authors: Sung, P.-J., Cho, T.-C., Chen, P.-C., Hou, F.-J., Lai, C.-H, Lee, Y.-J., Li, Y., Samukawa, S., Chao, T.-S., Wu, W.-F., Yeh, W.-K.
Source: 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) Nanotechnology (IEEE-NANO), 2016 IEEE 16th International Conference on. :174-175 Aug, 2016
Relation: 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO)
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8Conference
Authors: Su, C.-J., Hong, T.-C., Tsou, Y.-C., Hou, F.-J., Sung, P.-J., Yeh, M.-S., Wan, C.-C., Kao, K.-H., Tang, Y.-T., Chiu, C.-H., Wang, C.-J., Chung, S.-T., You, T.-Y., Huang, Y.-C., Wu, C.-T., Lin, K.-L., Luo, G.-L., Huang, K.-P., Lee, Y.-J., Chao, T.-S., Wu, W.-F., Huang, G.-W., Shieh, J.-M., Yeh, W.-K., Wang, Y.-H.
Source: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :15.4.1-15.4.4 Dec, 2017
Relation: 2017 IEEE International Electron Devices Meeting (IEDM)
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9Periodical
Authors: Abdalla, Ahmed, I. A., Hou, F. J.
Source: Allelopathy journal. 54(2):157-168
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10Periodical
Authors: Sung, P.-J., Cho, T.-C., Hou, F.-J., Hsueh, F.-K., Chung, S.-T., Lee, Y.-J., Current, M. I., Chao, T.-S.
Source: IEEE transactions on electron devices. 64(5):2054-2060
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11Periodical
Authors: Hou, F.-J., Sung, P.-J., Hsueh, F.-K., Wu, C.-T., Lee, Y.-J., Li, Y., Samukawa, S., Hou, T.-H.
Source: IEEE transactions on electron devices. 63(10):3837-3843
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12Conference
Authors: Lin, H.-C., Lee, M.-H., Yeh, K.-L., Hou, F.-J., Wang, M.-F., Huang, T.-Y.
Source: PROCEEDINGS- ELECTROCHEMICAL SOCIETY PV. 2002-23:208-215
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13Periodical
Authors: Liu, Y., Hou, F.-J., Zhou, J., Wang, Z.-H., Li, T.-W., Su, X.-R.
Source: OCEANOLOGIA ET LIMNOLOGIA SINICA. 44(4):979-986
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14Periodical
Authors: Chen, L.-P., Hou, F.-J., Zhang, D.-J., He, W.-N., Zhou, J., Zhang, C.-D., Tong, Q.-Q., Wang, Z.-H., Li, T.-W., Su, X.-R.
Source: OCEANOLOGIA ET LIMNOLOGIA SINICA. 44(4):930-935
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15Periodical
Authors: Wang, P.-y., Chen, L., Hou, F.-j., Li, C.-h.
Source: CHINESE JOURNAL OF PHARMACEUTICAL ANALYSIS. 32(5):802-805
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16Periodical
Authors: Hou, F.-j., Wang, Y.-b., Miao, Y.-h., Chen, Y.-j.
Source: JOURNAL OF ANALYTICAL SCIENCE. 27(2):231-234
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17Periodical
Authors: Ren, J.-z., Hou, F.-j.
Source: ACTA PRATACULTURAE SINICA. 19(3):1-5
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18Periodical
Authors: Li, Z.-g., Hou, F.-j.
Source: ACTA PRATACULTURAE SINICA. 19(1):42-49
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19Periodical
Authors: Shieh, J., Hou, F. J., Chen, Y. C., Chen, H. M., Yang, S. P., Cheng, C. C., Chen, H. L.
Source: ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM-. 22(5):597-601
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20Periodical
Authors: Hou, F.-j., Xu, L.
Source: ACTA PRATACULTURAE SINICA. 18(6):210-225