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1Conference
Authors: Nitsch, C., Otto, M., Heider, M., Hohn, B.-R., Stahl, K.
Source: VDI BERICHTE. 2218:491-504
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2Conference
Authors: Zomek, B., Stahl, K., Hohn, B.-R., Schudy, J., Tobie, T.
Source: VDI BERICHTE. 2199(2):1243-1254
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3Conference
Authors: Hohn, B.-R., Stahl, K., Gwinner, P.
Source: VDI BERICHTE. 2199(2):1113-1124
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4Conference
Authors: Heider, M., Bihr, J., Otto, M., Hohn, B.-R., Stahl, K.
Source: VDI BERICHTE. 2199(2):1091-1100
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5Conference
Authors: Mayer, J., Stahl, K., Hohn, B.-R., Michaelis, K., Hinterstoisser, M.
Source: VDI BERICHTE. 2199(2):969-980
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6Conference
Authors: Monz, A., Stahl, K., Hohn, B.-R., Otto, M.
Source: VDI BERICHTE. 2199(1):255-264
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7Conference
Authors: Stahl, K., Hohn, B.-R., Michaelis, K., Mayer, J.
Source: VDI BERICHTE. 2187:465-480
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8Conference
Authors: Hohn, B.-R., Pflaum, H., Tomic, D.
Source: ICMT'2006. :825-830
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9Conference
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10Conference
Authors: Hohn, B.-R., Heider, M., Stahl, K., Otto, M., Bihr, J.
Source: PROCEEDINGS OF THE ASME DESIGN ENGINEERING TECHNICAL CONFERENCES. 8:397-404
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11Conference
Authors: Hohn, B.-R., Stahl, K., Oster, P., Tobie, T., Schwienbacher, S., Koller, P.
Source: PROCEEDINGS OF THE ASME DESIGN ENGINEERING TECHNICAL CONFERENCES. 8:93-100
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12Conference
Authors: Bihr, J., Hohn, B.-R., Stahl, K., Otto, M., Heider, M.
Source: VDI BERICHTE. (2155):61-72
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13Conference
Authors: Heider, M., Hohn, B.-R., Stahl, K., Otto, M., Bihr, J.
Source: VDI BERICHTE. (2155):49-60
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14Conference
Authors: Hohn, B.-R., Stahl, K., Otto, M., Derse, M., Nitsch, C.
Source: VDI BERICHTE. 2130:355-364
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15Conference
Authors: Hohn, B.-R., Wirth, C., Haefke, N.
Source: VDI BERICHTE. 2130:171-184
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16Conference
Authors: Hohn, B.-R., Stahl, K., Lienkamp, M., Wirth, C., Kurth, F., Wiesbeck, F.
Source: VDI BERICHTE. 2130:77-94
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17Conference
Authors: Hohn, B.-R., Stahl, K., Pflaum, H., Wohlleber, F.
Source: VDI-BERICHTE. (2094):197-210
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18Conference
Authors: Hohn, B.-R., Stahl, K., Pflaum, H., Hensel, M.
Source: VDI-BERICHTE. (2094):105-116
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19Conference
Authors: Hohn, B.-R., Michaelis, K., Weisel, C.
Source: VDI BERICHTE. 2108(2):1221-1232
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20Conference
Authors: Hohn, B.-R., Oster, P., Braykoff, C.
Source: VDI BERICHTE. 2108(2):1295-1308