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1Conference
Authors: Yanfen Xiao, Hofmann, Meike, Sherman, Stanislav, Yixiao Wang, Zappe, Hans
Source: 2015 China Semiconductor Technology International Conference Semiconductor Technology International Conference (CSTIC), 2015 China. :1-3 Mar, 2015
Relation: 2015 China Semiconductor Technology International Conference (CSTIC)
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2Academic Journal
Source: Journal of the European Optical Society-Rapid Publications, Vol 19, Iss 1, p 26 (2023)
Subject Terms: light sheet fluorescence microscopy, diffractive optical elements, multi-plane imaging, 3d imaging, multi-focal lens, Applied optics. Photonics, TA1501-1820, Optics. Light, QC350-467
File Description: electronic resource
Relation: https://jeos.edpsciences.org/articles/jeos/full_html/2023/01/jeos20230017/jeos20230017.html; https://doaj.org/toc/1990-2573
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3Academic Journal
Authors: Xiao, Yanfen, Mendez, Salvador Aguilar, Hofmann, Meike, Gauch, Melanie, Ehlers, Henrik, Ristau, Detlev, Mueller, Claas, Zappe, Hans
Source: In Sensors & Actuators: A. Physical 1 October 2017 265:181-186
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4Academic Journal
Source: EPJ Web of Conferences, Vol 266, p 04004 (2022)
File Description: electronic resource
Relation: https://www.epj-conferences.org/articles/epjconf/pdf/2022/10/epjconf_eosam2022_04004.pdf; https://doaj.org/toc/2100-014X
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5Academic Journal
Authors: Gleißner, Uwe, Khatri, Bilal, Megnin, Christof, Sherman, Stanislav, Xiao, Yanfen, Hofmann, Meike, Günther, Axel, Rahlves, Maik, Roth, Bernhard, Zappe, Hans, Hanemann, Thomas
Source: In Sensors & Actuators: A. Physical 15 April 2016 241:224-230
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6Academic Journal
Authors: HOFMANN, MEIKE1, BURCH, GERALD F.2, gburch@uwf.edu, BURCH, JANA J.3
Source: ISACA Journal; 2024, Issue 1, p32-39, 8p
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7Academic Journal
Authors: Hofmann, Meike1, meike.hofmann@tu-ilmenau.de, Herrmann, Andreas2, andreas.herrmann@tu-ilmenau.de, Brokmann, Ulrike2, ulrike.brokmann@tu-ilmenau.de
Source: Technisches Messen; Jun2022, Vol. 89 Issue 6, p447-454, 8p
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8Academic Journal
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9Periodical
Authors: Hofmann, Meike, Xiao, Yanfen, Sherman, Stanislav, Gleissner, Uwe, Schmidt, Thomas, Zappe, Hans
Source: Applied optics. 55(5):1124-1124
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10Academic Journal
Authors: Yanfen Xiao1, yanfen.xiao@imtek.uni-freiburg.de, Hofmann, Meike1, Ziyu Wang1, Sherman, Stanislav1, Zappe, Hans1
Source: Applied Optics (1559-128X); 5/1/2016, Vol. 55 Issue 13, p3566-3573, 8p
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11Conference
Authors: Yanfen Xiao1, Pichler, Elke2, Hofmann, Meike1, meike.hofmann@imtek.uni-freiburg.de, Bethmann, Konrad2, Köhring, Michael2, Willer, Ulrike2, Zappe, Hans1
Source: Interdisciplinarity in Engineering; 2014, Vol. 15, p692-702, 11p
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12Academic Journal
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13Academic Journal
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14Academic Journal
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15Periodical
Authors: Thienpont, Hugo, Mohr, Jürgen, Zappe, Hans, Nakajima, Hirochika, Sherman, Stanislav, Xiao, Yanfen, Hofmann, Meike, Schmidt, Thomas, Gleissner, Uwe, Zappe, Hans
Source: Proceedings of SPIE; July 2016, Vol. 9888 Issue: 1 p98880I-98880I-7, 889928p
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16Periodical
Authors: Thienpont, Hugo, Mohr, Jürgen, Zappe, Hans, Nakajima, Hirochika, Xiao, Yanfen, Hofmann, Meike, Wang, Ziyu, Langenecker, Alexa, Shermann, Stanislav, Gleissner, Uwe, Zappe, Hans
Source: Proceedings of SPIE; July 2016, Vol. 9888 Issue: 1 p98880F-98880F-8, 889929p
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17Academic Journal
Authors: Xiao, Yanfen, Pichler, Elke, Hofmann, Meike, Bethmann, Konrad, Köhring, Michael, Willer, Ulrike, Zappe, Hans
Source: Procedia Technology; 2014, Vol. 15, p692-702, 11p
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18Periodical
Authors: Broquin, Jean-Emmanuel, Nunzi Conti, Gualtiero, Xiao, Yanfen, Hofmann, Meike, Wang, Ziyu, Sherman, Stanislav, Li, Pei, Zappe, Hans
Source: Proceedings of SPIE; February 2016, Vol. 9750 Issue: 1 p97501V-97501V-8, 877518p
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19Periodical
Authors: Duparré, Angela, Geyl, Roland, Hofmann, Meike, Xiao, Yanfen, Sherman, Stanislav, Bollgrün, Patrick, Schmidt, Thomas, Gleissner, Uwe, Zappe, Hans
Source: Proceedings of SPIE; September 2015, Vol. 9628 Issue: 1 p96281R-96281R-6, 866536p
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20Periodical
Source: Proceedings of SPIE; February 2015, Vol. 9365 Issue: 1 p93651F-93651F-8, 842868p