Photon Counting Detectors for X-Ray Imaging With Emphasis on CT

Authors: Ballabriga, R., Alozy, J., Bandi, F.N., Campbell, M., Egidos, N., Fernandez-Tenllado, J.M., Heijne, E.H.M., Kremastiotis, I., Llopart, X., Madsen, B.J., Pennicard, D., Sriskaran, V., Tlustos, L.

Source: IEEE Transactions on Radiation and Plasma Medical Sciences IEEE Trans. Radiat. Plasma Med. Sci. Radiation and Plasma Medical Sciences, IEEE Transactions on. 5(4):422-440 Jul, 2021

New gaseous detectors: the application of CMOS pixel chips as direct anode

Authors: Campbell, M., Heijne, E.H.M., Llopart, X., Chefdeville, M., Colas, P., Giganon, A., Giomataris, Y., Colijn, A.P., Fornaini, A., van der Graaf, H., Kluit, P., Timmermans, J., Visschers, J.L., Schmitz, J.

Source: IEEE Symposium Conference Record Nuclear Science 2004. Nuclear science symposium Nuclear Science Symposium Conference Record, 2004 IEEE. 2:955-958 Vol. 2 2004

Relation: 2004 IEEE Nuclear Science Symposium Conference Record

Spectroscopic imaging of x-rays : a new look

Authors: Heijne, E.H.M.

Source: 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) Nuclear science symposium Nuclear Science Symposium Conference Record, 2003 IEEE. 1:228-231 Vol.1 2003

Relation: 2003 IEEE Nuclear Science Symposium. Conference Record

Studies of the spectral and angular distributions of transition radiation using a silicon pixel sensor on a Timepix3 chip

Authors: Alozy, J., Belyaev, N., Campbell, M., Cherry, M., Dachs, F., Doronin, S., Filippov, K., Fusco, P., Gargano, F., Heijne, E.H.M., Konovalov, S., Krasnopevtsev, D., Llopart, X., Loparco, F., Mascagna, V., Mazziotta, M.N., Pernegger, H., Ponomarenko, D., Rembser, C., Romaniouk, A., Savchenko, A.A., Schaefer, D., Schioppa, E.J., Sergeeva, D.Yu., Shulga, E., Smirnov, S., Smirnov, Y., Soldani, M., Spinelli, P., Strikhanov, M., Teterin, P., Tikhomirov, V., Tishchenko, A.A., van Beuzekom, M., van der Heijden, B., Vorobev, K., Zhukov, K.

Source: In Nuclear Inst. and Methods in Physics Research, A 1 May 2020 961

Transition radiation measurements with a Si and a GaAs pixel sensor on a Timepix3 chip

Authors: Dachs, F., Alozy, J., Belyaev, N., Bergmann, B.L., van Beuzekom, M., Billoud, T.R.V., Burian, P., Broulim, P., Campbell, M., Chelkov, G., Cherry, M., Doronin, S., Filippov, K., Fusco, P., Gargano, F., van der Heijden, B., Heijne, E.H.M., Konovalov, S., Cudie, X.L., Loparco, F., Mascagna, V., Mazziotta, M.N., Meduna, L., Pernegger, H., Ponomarenko, D., Pospisil, S., Prest, M., Rembser, C., Romaniouk, A., Savchenko, A.A., Schaefer, D., Schioppa, E.J., Sergeeva, D., Shchukin, D., Shulga, E., Smirnov, S., Smirnov, Y., Smolyanskiy, P., Soldani, M., Spinelli, P., Strikhanov, M., Teterin, P., Tikhomirov, V., Tishchenko, A.A., Vallazza, E., Vorobev, K., Zhukov, K.

Source: In Nuclear Inst. and Methods in Physics Research, A 1 April 2020 958

A multichip module, the basic building block for large area pixel detectors

Authors: Becks, K.-H., Heijne, E.H.M., Middelkamp, P., Scharfetter, L., Snoeys, W.

Source: Proceedings 1996 IEEE Multi-Chip Module Conference (Cat. No.96CH35893) Multi-chip modules Multi-Chip Module Conference, 1996. MCMC-96, Proceedings., 1996 IEEE. :16-19 1996

Relation: Proceedings 1996 IEEE Multi-Chip Module Conference (Cat. No.96CH35893)

Pixel frontend electronics in a radiation hard technology for hybrid and monolithic applications

Authors: Pengg, F., Campbell, M., Heijne, E.H.M., Snoeys, W.

Source: 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record Nuclear science and medical imaging Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE. 2:728-732 vol.2 1995

Relation: 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record

Analog performance of SOI MOSFETs up to 25 mrad (Si)

Authors: Faccio, F., Aspell, P., Heijne, E.H.M., Jarron, P., Borel, G.

Source: Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems Radiation and its effects on components and systems Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on. :137-141 1995

Relation: Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems

Radiation induced lifetime degradation in SIMOX structures

Authors: Cristoloveanu, S., Ionescu, A.M., Chovet, A., Heijne, E.H.M., Jarron, P.

Source: RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) Radiation and its effects on components and systems Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on. :385-391 1993

Relation: Proceedings of 2nd European Conference Radiations and their Effects on Devices and Systems (RADECS 93)

Integrated circuits for particle physics experiments

Authors: Snoeys, W., Campbell, M., Heijne, E.H.M., Marchioro, A.

Source: 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056) Solid-state circuits Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International. :184-185 2000

Relation: 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers

First measurements of the spectral and angular distribution of transition radiation using a silicon pixel sensor on a Timepix3 chip

Authors: Schioppa, E.J., Dachs, F., Alozy, J., Belyaev, N., Campbell, M., Cherry, M., Doronin, S., Filippov, K., Fusco, P., Gargano, F., Heijne, E.H.M., Konovalov, S., Krasnopevtsev, D., Llopart, X., Loparco, F., Mascagna, V., Mazziotta, M.N., Pernegger, H., Ponomarenko, D., Prest, M., Pyatiizbyantseva, D., Radomskii, R., Rembser, C., Romaniouk, A., Shulga, E., Smirnov, S., Smirnov, Y., Soldani, M., Spinelli, P., Sergeeva, D. Yu., Savchenko, A.A., Schaefer, D., Strikhanov, M., Tishchenko, A.A., Teterin, P., Tikhomirov, V., Vallazza, E., van Beuzekom, M., van der Heijden, B., Vorobev, K., Zhukov, K.

Source: In Nuclear Inst. and Methods in Physics Research, A 21 August 2019 936:523-526

Neutron-induced radiation damage in silicon detectors

Authors: Lemeilleur, F., Glaser, M., Heijne, E.H.M., Jarron, P., Occelli, E.

Source: Conference Record of the 1991 IEEE Nuclear Science Symposium and Medical Imaging Conference Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE. :308-313 vol.1 1991

Relation: 1991 IEEE Nuclear Science Symposium and Medical Imaging Conference

A 1006 element hybrid silicon pixel detector with strobed binary output

Authors: Anghinolfi, F., Aspell, P., Bass, K., Beusch, W., Bosisio, L., Boutonnet, C., Burger, P., Campbell, M., Chesi, E., Claeys, C., Clemens, J.C., Cohen Solal, M., Debusschere, I., Delpierre, P., Di Bari, D., Dierickx, B., Enz, C.C., Focardi, E., Forti, F., Gally, Y., Glaser, M., Gys, T., Habrard, M.C., Heijne, E.H.M., Hermans, L., Hurst, R., Inzani, P., Jaeger, J.J., Jarron, P., Krummenacher, F., Lemeilleur, F., Lenti, V., Manzari, V., Meddeler, G., Morando, M., Munns, A., Nava, F., Navach, F., Neyer, C., Ottaviani, G., Pellegrini, F., Pengg, F., Perego, R., Pindo, M., Potheau, R., Quercigh, E., Redaelli, N., Rossi, L., Sauvage, D., Segato, G., Simone, S., Stefanini, G., Tonelli, G., Vanstraelen, G., Vegni, G., Verweij, H., Viertel, G.M., Waisbard, J.

Source: Conference Record of the 1991 IEEE Nuclear Science Symposium and Medical Imaging Conference Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE. :255-262 vol.1 1991

Relation: 1991 IEEE Nuclear Science Symposium and Medical Imaging Conference

ICON, a current mode preamplifier in CMOS technology for use with high rate particle detectors

Authors: Anghinolfi, F., Aspell, P., Campbell, M., Heijne, E.H.M., Jarron, P., Meddeler, G., Santiard, J.C., Buytaert, S.

Source: Conference Record of the 1991 IEEE Nuclear Science Symposium and Medical Imaging Conference Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE. :629-633 vol.1 1991

Relation: 1991 IEEE Nuclear Science Symposium and Medical Imaging Conference

1-M sample/sec 12-bit low-power pipelined A/D converter

Authors: Valencic, V., Anghinolfi, F., Deval, P., Krummenacher, F., Jarron, P., Heijne, E.H.M., Declercq, M.

Source: 1990 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 1990 IEEE International Symposium on. :1360-1363 vol.2 1990

Relation: 1990 IEEE International Symposium on Circuits and Systems (ISCAS)

Noise contribution of the body resistance in partially-depleted SOI MOSFETs

Authors: Faccio, F., Anghinolfi, F., Heijne, E.H.M., Jarron, P., Cristoloveanu, S.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 45(5):1033-1038 May, 1998

Pixel frontend electronics in a radiation hard technology for hybrid and monolithic applications

Authors: Pengg, F., Campbell, M., Heijne, E.H.M., Snoeys, W.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 43(3):1732-1736 Jun, 1996

Construction and characterization of a 117 cm/sup 2/ silicon pixel detector

Authors: Heijne, E.H.M., Antinori, F., Barberis, D., Beker, H., Beusch, W., Burger, P., Campbell, M., Cantatore, E., Catanesi, M.G., Chesi, E., Darbo, G., D'Auria, S., Da Via, C., Di Bari, D., Di Liberto, S., Elia, D., Gys, T., Helstrup, H., Heuser, J.M., Jacholkowski, A., Jarron, P., Klempt, W., Kralik, I., Krummenacher, F., Lasalle, J.C., Leitner, R., Lemeilleur, F., Lenti, V., Lokajicek, M., Lopez, L., Luptak, M., Maggi, G., Martinengo, P., Meddi, F., Menetrey, A., Middelkamp, P., Morando, M., Munns, A., Musico, P., Pellegrini, F., Pospisil, S., Quercigh, E., Ridky, J., Rossi, L., Safarik, K., Saladino, S., Segato, G., Simone, S., Snoeys, W., Stefanini, G., Vrba, V.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 42(4):413-418 Aug, 1995

Experimental results using a hybrid silicon pixel detector for scintillating fibre readout and X-ray imaging

Authors: Da Via, C., Campbell, M., Heijne, E.H.M., Middelkamp, P., Stefanini, G.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 42(4):409-412 Aug, 1995

Noise characterization of transistors in a 1.2 /spl mu/m CMOS-SOI technology up to a total-dose of 12 Mrad (Si)

Authors: Faccio, F., Bianchi, M., Fornasari, M., Heijne, E.H.M., Jarron, P., Rossi, G., Borel, G., Redolfi, J.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 41(6):2310-2316 Dec, 1994