Contrasting failure characteristics of different levels of Cu dual-damascene metallization

Authors: Gan, C.L., Wei, F., Thompson, C.V., Pey, K.L., Choi, W.K., Hau-Riege, S.P., Yu, B.

Source: Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2002. IPFA 2002. Proceedings of the 9th International Symposium on the. :124-128 2002

Relation: Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits

Prospects for single-particle imaging at XFELs

Authors: Chapman, H.N., Hau-Riege, S.P., London, R.A., Marchesini, S., Noy, A., Szoke, A., Szoke, H., Ingerman, E., Hajdu, J., Huldt, G., Howells, M.R., He, H., Spence, J.C.H., Weierstall, U.

Source: Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004. Biophotonics/optical interconnects & VLSI photonics/WGM microcavities Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004 Digest of the LEOS Summer Topical Meetings. :2 pp. 2004

Relation: 2004 Digest of the LEOS Summer Topical Meetings: Biophotonics/Optical Interconnects & VLSI Photonics/WGM Microcavities

Synchrotron topographic evaluation of strain around craters generated by irradiation with X-ray pulses from free electron laser with different intensities

Authors: Wierzchowski, W., Wieteska, K., Sobierajski, R., Klinger, D., Pełka, J., Żymierska, D., Paulmann, C., Hau-Riege, S.P., London, R.A., Graf, A., Burian, T., Chalupský, J., Gaudin, J., Krzywinski, J., Moeller, S., Messerschmidt, M., Bozek, J., Bostedt, Ch.

Source: In Nuclear Inst. and Methods in Physics Research, B 1 December 2015 364:20-26

Comparing different approaches to characterization of focused X-ray laser beams

Authors: Chalupsky, J., Bohacek, P., Hajkova, V., Hau-Riege, S.P., Heimann, P.A., Juha, L., Krzywinski, J., Messerschmidt, M., Moeller, S.P., Nagler, B., Rowen, M., Schlotter, W.F., Swiggers, M.L., Turner, J.J.

Source: In Nuclear Inst. and Methods in Physics Research, A 2011 631(1):130-133

Colossal Magnetoresistive Manganite Based Fast Bolometric X-ray Sensors for Total Energy Measurements of Free Electron Lasers

Authors: Yong, G.J., Kolagani, R.M., Adhikari, S., Mundle, R.M., Cox, D.W., Davidson, A.L., Liang, Y., Drury, O.B., Hau-Riege, S.P., Gardner, C.

Source: SENSOR LETTERS. 6(5):741-745

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN242442706&indx=1&recIds=ETOCRN242442706

X-ray laser-induced ablation of lead compounds [8077-45]
Damage to VUV, EUV, and X-Ray Optics

Authors: Hajkova, V., Juha, L., Boha, P., Burian, T., Chalupsky, J., Vysin, L., Gaudin, J., Sinn, H., Heimann, P.A., Hau-Riege, S.P.

Source: PROCEEDINGS - SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 8077:8077 18-8077 18

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN079695474&indx=1&recIds=ETOCCN079695474

Lifetime and damage threshold properties of reflective x-ray coatings for the LCLS free-electron laser (Invited Paper) [8077-01]
Damage to VUV, EUV, and X-Ray Optics

Authors: Soufli, R., Fernandez-Perea, M., Hau-Riege, S.P., Baker, S.L., Robinson, J.C., Gullikson, E.M., Bozek, J.D., Kelez, N.M., Boutet, S.

Source: PROCEEDINGS - SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 8077:8077 02-8077 02

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN079695190&indx=1&recIds=ETOCCN079695190

Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors [7361-30]
Damage to VUV, EUV, and x-ray optics

Authors: Soufli, R., Baker, S.L., Robinson, J.C., Gullikson, E.M., McCarville, T.J., Pivovaroff, M.J., Stefan, P., Hau-Riege, S.P., Bionta, R.

Source: PROCEEDINGS - SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 7361:7361 0U-7361 0U

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN073560145&indx=1&recIds=ETOCCN073560145

Response of molecular solids to ultra-intense femtosecond soft x-ray pulses [7361-07]
Damage to VUV, EUV, and x-ray optics

Authors: Chalupsky, J., Juha, L., Hajkova, V., Cihelka, J., Vysin, L., Gautier, J., Hajdu, J., Hau-Riege, S.P., Jurek, M., Krzywinski, J.

Source: PROCEEDINGS - SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 7361:7361 08-7361 08

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN073559957&indx=1&recIds=ETOCCN073559957

Nonequilibrium electron dynamics in materials driven by high-intensity x-ray pulses (4 pages)

Authors: Hau-Riege, S.P.

Source: PHYSICAL REVIEW -SERIES E-. 87(5):053102-053102

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN334989524&indx=1&recIds=ETOCRN334989524

Effect of high-intensity x-ray radiation on Bragg diffraction in silicon and diamond (4 pages)

Authors: Hau-Riege, S.P., Pardini, T.

Source: JOURNAL OF APPLIED PHYSICS. 112(11):114904-114904

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN324503559&indx=1&recIds=ETOCRN324503559

Photoelectron Dynamics in X-Ray Free-Electron-Laser Diffractive Imaging of Biological Samples

Authors: Hau-Riege, S.P.

Source: PHYSICAL REVIEW LETTERS. 108(23):238101-238101

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN314323762&indx=1&recIds=ETOCRN314323762

Ultrafast Transitions from Solid to Liquid and Plasma States of Graphite Induced by X-Ray Free-Electron Laser Pulses

Authors: Hau-Riege, S.P., Graf, A., Doppner, T., London, R.A., Krzywinski, J., Fortmann, C., Glenzer, S.H., Frank, M., Sokolowski-Tinten, K., Messerschmidt, M.

Source: PHYSICAL REVIEW LETTERS. 108(21):217402-217402

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN313964190&indx=1&recIds=ETOCRN313964190

Near-Ultraviolet Luminescence of N~2 Irradiated by Short X-Ray Pulses

Authors: Hau-Riege, S.P., Bionta, R.M., Ryutov, D.D., London, R.A., Ables, E., Kishiyama, K.I., Shen, S., McKernan, M.A., McMahon, D.H., Messerschmidt, M.

Source: PHYSICAL REVIEW LETTERS. 105(4):043003-043003

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN276469507&indx=1&recIds=ETOCRN276469507

Sacrificial Tamper Slows Down Sample Explosion in FLASH Diffraction Experiments

Authors: Hau-Riege, S.P., Boutet, S., Barty, A., Bajt, S., Bogan, M.J., Frank, M., Andreasson, J., Iwan, B., Seibert, M.M., Hajdu, J.

Source: PHYSICAL REVIEW LETTERS. 104(6):064801-064801

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN267138771&indx=1&recIds=ETOCRN267138771

Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation (3 pages)

Authors: Hau-Riege, S.P., London, R.A., Bionta, R.M., Ryutov, D., Soufli, R., Bajt, S., McKernan, M.A., Baker, S.L., Krzywinski, J., Sobierajski, R.

Source: APPLIED PHYSICS LETTERS. 95(11):111104-111104

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN258935121&indx=1&recIds=ETOCRN258935121

Molecular Dynamics Simulations of Electron-Ion Temperature Equilibration in an SF~6 Plasma

Authors: Benedict, L.X., Glosli, J.N., Richards, D.F., Streitz, F.H., Hau-Riege, S.P., London, R.A., Graziani, F.R., Murillo, M.S., Benage, J.F.

Source: PHYSICAL REVIEW LETTERS. 102(20):205004-205004

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN252647708&indx=1&recIds=ETOCRN252647708

Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser (3 pages)

Authors: Hau-Riege, S.P., London, R.A., Bionta, R.M., Soufli, R., Ryutov, D., Shirk, M., Baker, S.L., Smith, P.M., Nataraj, P.

Source: APPLIED PHYSICS LETTERS. 93(20):201105-201105

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN241823306&indx=1&recIds=ETOCRN241823306

Modeling of the damage dynamics of nanospheres exposed to x-ray free-electron-laser radiation (4 pages)

Authors: Hau-Riege, S.P., Chapman, H.N.

Source: PHYSICAL REVIEW -SERIES E-. 77(4):041902-041902

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN229445606&indx=1&recIds=ETOCRN229445606

Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas (9 pages)

Authors: Hau-Riege, S.P., Bionta, R.M., Ryutov, D.D., Krzywinski, J.

Source: JOURNAL OF APPLIED PHYSICS. 103(5):053306-053306

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN227129644&indx=1&recIds=ETOCRN227129644