Diamond quantum magnetometer with dc sensitivity of < 10 pT Hz$^{-1/2}$ toward measurement of biomagnetic field

Authors: Sekiguchi, N., Fushimi, M., Yoshimura, A., Shinei, C., Miyakawa, M., Taniguchi, T., Teraji, T., Abe, H., Onoda, S., Ohshima, T., Hatano, M., Sekino, M., Iwasaki, T.

Source: Phys. Rev. Applied 21, 064010 (2024)

Subject Terms: Quantum Physics, Physics - Applied Physics

Access URL: http://arxiv.org/abs/2309.04093

Extending spin dephasing time of perfectly aligned Nitrogen-Vacancy centers by mitigating stress distribution on highly misoriented chemical-vapor-deposition diamond

Authors: Tsuji, T., Sekiguchi, T., Iwasaki, T., Hatano, M.

Subject Terms: Physics - Applied Physics, Condensed Matter - Materials Science, Quantum Physics

Access URL: http://arxiv.org/abs/2307.04003

Passive Shimming of Magnetically Shielded Room Using Ferromagnetic Plates

Authors: Jin, S., Kuwahata, A., Chikaki, S., Hatano, M., Sekino, M.

Source: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 58(2):1-5 Feb, 2022

Magnetic Field Generation System of the Magnetic Probe With Diamond Quantum Sensor and Ferromagnetic Materials for the Detection of Sentinel Lymph Nodes With Magnetic Nanoparticles

Authors: Kitaizumi, T., Kuwahata, A., Saichi, K., Sato, T., Igarashi, R., Ohshima, T., Masuyama, Y., Iwasaki, T., Hatano, M., Jelezko, F., Kusakabe, M., Yatsui, T., Sekino, M.

Source: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 57(2):1-5 Feb, 2021

Potential of diamond solid-state quantum sensors

Authors: Hatano, M.

Source: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :14.5.1-14.5.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

Characterization of Schottky Barrier Diodes on Heteroepitaxial Diamond on 3C-SiC/Si Substrates

Authors: Murooka, T., Yaita, J., Makino, T., Ogura, M., Kato, H., Yamasaki, S., Natal, M., Saddow, S.E., Iwasaki, T., Hatano, M.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(1):212-216 Jan, 2020

Fault-Diagnosis Architecture for Large-Scale Photovoltaic Power Plants That Does Not Require Additional Sensors

Authors: Kohno, T., Gokita, K., Shitanishi, H., Toyosaki, M., Nakamura, T., Morikawa, K., Hatano, M.

Source: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 9(3):780-789 May, 2019

Clinical Laboratory Data in Japan: A Comparative Study of Patients with Psychiatric Disorders and the General Population

Authors: Iwata M, Hatano M, Ito K, Matsuzaki H, Yamada S

Source: Neuropsychiatric Disease and Treatment, Vol Volume 19, Pp 2061-2068 (2023)

Subject Terms: big data, chronic kidney disease, diabetes mellitus, liver diseases, metabolic syndrome, mental disorders, Neurosciences. Biological psychiatry. Neuropsychiatry, RC321-571, Neurology. Diseases of the nervous system, RC346-429

File Description: electronic resource

Relation: https://www.dovepress.com/clinical-laboratory-data-in-japan-a-comparative-study-of-patients-with-peer-reviewed-fulltext-article-NDT; https://doaj.org/toc/1178-2021

Access URL: https://doaj.org/article/3048664ac7a44617b29f06b69a0b5363

Effectiveness of Clozapine on Employment Outcomes in Treatment-Resistant Schizophrenia: A Retrospective Bidirectional Mirror-Image Study

Authors: Matsuzaki H, Hatano M, Iwata M, Saito T, Yamada S

Source: Neuropsychiatric Disease and Treatment, Vol Volume 19, Pp 615-622 (2023)

Subject Terms: clozapine, antipsychotic agents, treatment-resistant schizophrenia, observational study, mental health recovery, Neurosciences. Biological psychiatry. Neuropsychiatry, RC321-571, Neurology. Diseases of the nervous system, RC346-429

File Description: electronic resource

Relation: https://www.dovepress.com/effectiveness-of-clozapine-on-employment-outcomes-in-treatment-resista-peer-reviewed-fulltext-article-NDT; https://doaj.org/toc/1178-2021

Access URL: https://doaj.org/article/0d8cd5c4b5ee493d90c43905760fefb9

Observation of Interface Defects in Diamond Lateral p-n-Junction Diodes and Their Effect on Reverse Leakage Current

Authors: Iwasaki, T., Suwa, T., Yaita, J., Kato, H., Makino, T., Ogura, M., Takeuchi, D., Yamasaki, S., Hatano, M.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(8):3298-3302 Aug, 2017

Current enhancement by conductivity modulation in diamond JFETs for next generation low-loss power devices

Authors: Iwasaki, T., Kato, H., Yaita, J., Makino, T., Ogura, M., Takeuchi, D., Okushi, H., Yamasaki, S., Hatano, M.

Source: 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on. :77-80 May, 2015

Relation: 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD)

Simulation-Based Study About the Lifetime and Incident Light Properties Dependence of the Optically Triggered 4H-SiC Thyristors Operation

Authors: Hasegawa, J., Pace, L., Phung, L.V., Hatano, M., Planson, D.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(3):1203-1208 Mar, 2017

Device engineering for diamond quantum sensors

Authors: Hatano, M., Iwasaki, T.

Source: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :26.3.1-26.3.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

Potential of diamond power devices

Authors: Yamasaki, S., Makino, T., Takeuchi, D., Ogura, M., Kato, H., Matsumoto, T., Iwasaki, T., Hatano, M., Suzuki, M., Koizumi, S., Ohashi, H., Okushi, H.

Source: 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on. :307-310 May, 2013

Relation: 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)

Half pitch 14 nm direct pattering with Nanoimprint lithography

Authors: Nakasugi, T., Kono, T., Fukuhara, K., Hatano, M., Tokue, H., Komori, M., Tsuda, H., Komukai, T., Takahata, K., Kato, H., Kobayashi, K., Mitra, A., Kobayashi, S., Inoue, S., Higashiki, T., Motokawa, T., Saito, M., Kanamitsu, S., Itoh, M., Imamura, T., Matasunaga, K., Hashimoto, K., Kim, Y., Cho, J., Jung, W.

Source: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :11.7.1-11.7.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

Fluorinated Graphene FETs Controlled by Ionic Liquid Gate

Authors: Furuyama, S., Tahara, K., Iwasaki, T., Matsutani, A., Hatano, M.

Source: Journal of Display Technology J. Display Technol. Display Technology, Journal of. 10(11):962-965 Nov, 2014

EES data analysis of lithography trouble detected by MapSSA

Authors: Matsushita, H., Iyama, A., Miyashige, H., Nakagawa, S., Hatano, M., Kakinuma, H.

Source: 2008 International Symposium on Semiconductor Manufacturing (ISSM) Semiconductor Manufacturing (ISSM), 2008 International Symposium on. :382-385 Oct, 2008

Relation: 2008 IEEE International Symposium on Semiconductor Manufacturing (ISSM)

Treatment Continuation of Asenapine or Olanzapine in Japanese Schizophrenia Patients: A Propensity Score Matched Study

Authors: Matsuzaki H, Hatano M, Iwata M, Yamada S

Source: Neuropsychiatric Disease and Treatment, Vol Volume 17, Pp 3655-3661 (2021)

Subject Terms: asenapine, olanzapine, antipsychotic agents, schizophrenia, retrospective studies, propensity score, Neurosciences. Biological psychiatry. Neuropsychiatry, RC321-571, Neurology. Diseases of the nervous system, RC346-429

File Description: electronic resource

Relation: https://www.dovepress.com/treatment-continuation-of-asenapine-or-olanzapine-in-japanese-schizoph-peer-reviewed-fulltext-article-NDT; https://doaj.org/toc/1178-2021

Access URL: https://doaj.org/article/2e13756d79a6467ead0bfead867e591d

Reliability Improvement by Adopting Ti-barrier Metal B for Porous Low-k IL Structure

Authors: Sakata, A., Yamashita, S., Omoto, S., Hatano, M., Wada, J., Higashi, K., Yamaguchi, H., Yosho, T., Imamizu, K., Yamada, M., Hasunuma, M., Takahashi, S., Yamada, A., Hasegawa, T., Kaneko, H.

Source: 2006 International Interconnect Technology Conference Interconnect Technology Conference, 2006 International. :101-104 2006

Relation: 2006 International Interconnect Technology Conference

Mechanism of moisture uptake induced via failure and its impact on 45nm node interconnect design

Authors: Fujimaki, T., Higashi, K., Nakamura, N., Matsunaga, N., Yoshida, K., Miyawaki, N., Hatano, M., Hasunuma, M., Wada, J., Nishioka, T., Akiyama, K., Kawashima, H., Enomoto, Y., Hasegawa, T., Honda, K., Iwai, M., Yamada, S., Matsuoka, F.

Source: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :183-186 2005

Relation: International Electron Devices Meeting 2005