Direct Bandgap Ge0.846Sn0.154 Photodiodes for Gas Sensing in the Mid-Wave Infrared

Authors: Cardoux, C., Casiez, L., Kroemer, E., Frauenrath, M., Chretien, J., Pauc, N., Calvo, V., Hartmann, J., Lartigue, O., Constancias, C., Barritault, P., Coudurier, N., Rodriguez, P., Vandeneynde, A., Grosse, P., Gravrand, O., Chelnokov, A., Reboud, V.

Source: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 31(1: SiGeSn Infrared Photon. and Quantum Electronics):1-8 Jan, 2025

Continuous Wave Operation of Electrically Pumped GeSn/SiGeSn Multiple Quantum Well Laser

Authors: Buca, Dan, Liu, T., Seidel, L., Concepcion, O., Hartmann, J.-M., Chelnokov, Alexei, Capellini, G., Oehme, M., Grutzmacher, D.

Source: 2024 IEEE 29th International Semiconductor Laser Conference (ISLC) Semiconductor Laser Conference (ISLC), 2024 IEEE 29th International. :1-2 Sep, 2024

Relation: 2024 IEEE 29th International Semiconductor Laser Conference (ISLC)

From Shock to Shift: Data Visualization for Constructive Climate Journalism

Authors: Morini, F., Eschenbacher, A., Hartmann, J., Dork, M.

Source: IEEE Transactions on Visualization and Computer Graphics IEEE Trans. Visual. Comput. Graphics Visualization and Computer Graphics, IEEE Transactions on. 30(1):1413-1423 Jan, 2024

Integration of HfO2-based 3D OxRAM with GAA stacked-nanosheet transistor for high-density embedded memory

Authors: Dubreuil, T., Barraud, S., Pedini, J.-M., Hartmann, J.-M., Boulard, F., Sarrazin, A., Gharbi, A., Sturm, J., Lambert, A., Martin, S., Castellani, N., Anotta, A., Magalhaes-Lucas, A., Souhaite, A., Andrieu, F.

Source: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :117-120 Sep, 2023

Relation: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)

Optimizing RFSOI Performance through a T-shaped Gate and Nano-Second Laser Annealing Techniques

Authors: Lucci, L., Cremer, S., Duriez, B., Fache, T., Kerdiles, S., Morand, Y., Hartmann, J.-M., Azevedo-Goncalves, J., Gaillard, F., Chevalier, P.

Source: 2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) Radio Frequency Integrated Circuits Symposium (RFIC), 2023 IEEE. :61-64 Jun, 2023

Relation: 2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)

Mid-Infrared Supercontinuum Generation in a Varying Dispersion Waveguide for Multi-Species Gas Spectroscopy

Authors: Torre, A.D., Armand, R., Sinobad, M., Fiaboe, K.F., Luther-Davies, B., Madden, S., Mitchell, A., Nguyen, T.G., Moss, D., Hartmann, J., Reboud, V., Fedeli, J., Monat, C., Grillet, C.

Source: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 29(1: Nonlinear Integrated Photonics):1-9 Jan, 2023

Charge carrier profiling with MIR and THz s-SNOM

Authors: Santos, Cristiane N., Lebouvier, Edouard, Walter, Benjamin, Eliet, Sophie, Chevalier, N., Hartmann, J. M., Peretti, Romain, Faucher, Marc, Lampin, Jean-Francois

Source: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2023 48th International Conference on. :1-2 Sep, 2023

Relation: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

A new FDSOI spin qubit platform with 40nm effective control pitch

Authors: Bédécarrats, T., Paz, B. Cardoso, Diaz, B. Martinez, Niebojewski, H., Bertrand1, B., Rambal, N., Comboroure, C., Sarrazin, A., Boulard, F., Guyez, E., Hartmann, J. -M., Morand, Y., Magalhaes-Lucas, A., Nowak, E., Catapano, E., Cassé, M., Urdampilleta, M., Niquet, Y. -M., Gaillard, F., De Franceschi, S., Meunier, T., Vinet, M.

Source: 2021 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2021, pp. 1-4

Subject Terms: Condensed Matter - Mesoscale and Nanoscale Physics

Access URL: http://arxiv.org/abs/2304.03721

Si/Si0.7Ge0.3 A2RAM nanowires fabrication and characterization for 1T-DRAM applications

Authors: Lacord, J., Wakam, F. Tcheme, Chalupa, Z., Hartmann, J.-M., Besson, P., Loup, V., Vizioz, C., Brevard, L., Aussenac, F., Mescot, X., Lee, K., Bawedin, M.

Source: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) Ultimate Integration on Silicon (EuroSOI-ULIS), 2021 Joint International EUROSOI Workshop and International Conference on. :1-4 Sep, 2021

Relation: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

The new APD-Based Readout of the Crystal Barrel Calorimeter -- An Overview

Authors: Collaboration, CBELSA/TAPS, Honisch, C., Klassen, P., Müllers, J., Urban, M., Afzal, F., Bieling, J., Ciupka, S., Hartmann, J., Hoffmeister, P., Lang, M., Schaab, D., Schmidt, C., Steinacher, M., Walther, D., Beck, R., Brinkmann, K. -T., Crede, V., Dutz, H., Elsner, D., Erni, W., Fix, E., Frommberger, F., Grüner, M., Jude, T., Kalischewski, F., Keshelashvili, I., Krönert, P., Krusche, B., Mahlberg, P., Metag, V., Meyer, W., Müller, F., Nanova, M., Otto, B., Richter, L., Runkel, S., Salisbury, B., Schmieden, H., Schultes, J., Seifen, T., Stausberg, N., Taubert, F., Thiel, A., Thoma, U., Urff, G., Wendel, C., Wiedner, U., Wunderlich, Y., Zaunick, H. -G.

Subject Terms: Physics - Instrumentation and Detectors, Nuclear Experiment

Access URL: http://arxiv.org/abs/2212.12364

Silicon-Germanium Avalanche Receivers With fJ/bit Energy Consumption

Authors: Benedikovic, D., Virot, L., Aubin, G., Hartmann, J., Amar, F., Roux, X.L., Alonso-Ramos, C., Cassan, E., Marris-Morini, D., Boeuf, F., Fedeli, J., Szelag, B., Vivien, L.

Source: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 28(2: Optical Detectors):1-8 Apr, 2022

Progress in Germanium Tin (GeSn) Photonic Crystal Lasers

Authors: Thai, Q.M., Chretien, J., Bertrand, M., Aubin, J., Casiez, L., Chelnokov, A., Hartmann, J., Reboud, V., Pauc, N., Calvo, V.

Source: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 28(1: Semiconductor Lasers):1-9 Jan, 2022

Evolution of the liquid/solid interface roughness in Si1-xGex layers processed by nanosecond laser annealing

Authors: Demoulin, R., Daubriac, R., Kerdilès, S., Dagault, L., Adami, O., Ricciarelli, D., Hartmann, J.-M., Chiodi, F., Mio, A.M., Opprecht, M., Scheid, E., Alba, P.Acosta, Débarre, D., Magna, A.La, Cristiano, F.

Source: In Applied Surface Science 1 March 2025 684

Polarization observables in double neutral pion photoproduction

Authors: Collaboration, CBELSA/TAPS, Seifen, T., Hartmann, J., Afzal, F., Anisovich, A. V., Beck, R., Becker, M., Berlin, A., Bichow, M., Brinkmann, K. -Th., Crede, V., Dieterle, M., Dutz, H., Eberhardt, H., Elsner, D., Fornet-Ponse, K., Friedrich, St., Frommberger, F., Funke, Ch., Gottschall, M., Grüner, M., Görtz, St., Gutz, E., Hammann, Ch., Hannappel, J., Herick, J., Hillert, W., Hoffmeister, Ph., Honisch, Ch., Jahn, O., Jude, T., Käser, A., Kaiser, D., Kalinowsky, H., Kalischewski, F., Klassen, P., Keshelashvili, I., Klein, F., Klempt, E., Koop, K., Krusche, B., Lang, M., Mahlberg, Ph., Makonyi, K., Messi, F., Metag, V., Meyer, W., Müller, J., Müllers, J., Nanova, M., Nikonov, K., Nikonov, V. A., Novotny, R., Reeve, S., Roth, B., Reicherz, G., Rostomyan, T., Runkel, St., Sarantsev, A. V., Schmidt, Ch., Schmieden, H., Schmitz, R., Schultes, J., Sokhoyan, V., Stausberg, N., Thiel, A., Thoma, U., Urban, M., Urff, G., van Pee, H., Walther, D., Wendel, Ch., Wiedner, U., Wilson, A., Witthauer, L., Wunderlich, Y.

Subject Terms: Nuclear Experiment

Access URL: http://arxiv.org/abs/2207.01981

OctoPocus in VR: Using a Dynamic Guide for 3D Mid-Air Gestures in Virtual Reality

Authors: Fennedy, K., Hartmann, J., Roy, Q., Perrault, S.T., Vogel, D.

Source: IEEE Transactions on Visualization and Computer Graphics IEEE Trans. Visual. Comput. Graphics Visualization and Computer Graphics, IEEE Transactions on. 27(12):4425-4438 Dec, 2021

Rotordynamische Simulation fördermediengeschmierter Gleitlager
15th Gleit- und Wälzlagerungen VDI-Fachtagung

Authors: Wieckhorst, P., Bartel, D., Bevern, S., Hartmann, J.

Source: VDI-Berichte. 2415:177-194

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN608349028&indx=1&recIds=ETOCCN608349028

Epitaxy of Group-IV Semiconductors for Quantum Electronics
H02 - advanced CMOS-compatible semiconductor devices (20th symposium)

Authors: Hartmann, J. M., Bernier, N., Pierre, F., Barnes, J. P., Uazzocchi, V., Krawczyk, J., Lima, G., Kiyooka, E., De Franceschi, S.

Source: ECS transactions. 111(1):53-72

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN608351848&indx=1&recIds=ETOCCN608351848

Wideband precision stabilization of the -18.6 kV retarding voltage for the KATRIN spectrometer

Authors: Rodenbeck, C., Wüstling, S., Enomoto, S., Hartmann, J., Rest, O., Thümmler, T., Weinheimer, C.

Subject Terms: Physics - Instrumentation and Detectors, High Energy Physics - Experiment

Access URL: http://arxiv.org/abs/2203.13153

KATRIN: Status and Prospects for the Neutrino Mass and Beyond

Authors: Aker, M., Balzer, M., Batzler, D., Beglarian, A., Behrens, J., Berlev, A., Besserer, U., Biassoni, M., Bieringer, B., Block, F., Bobien, S., Bombelli, L., Bormann, D., Bornschein, B., Bornschein, L., Böttcher, M., Brofferio, C., Bruch, C., Brunst, T., Caldwell, T. S., Carminati, M., Carney, R. M. D., Chilingaryan, S., Choi, W., Cremonesi, O., Debowski, K., Descher, M., Barrero, D. Díaz, Doe, P. J., Dragoun, O., Drexlin, G., Edzards, F., Eitel, K., Ellinger, E., Engel, R., Enomoto, S., Felden, A., Fink, D., Fiorini, C., Formaggio, J. A., Forstner, C., Fränkle, F. M., Franklin, G. B., Friedel, F., Fulst, A., Gauda, K., Gavin, A. S., Gil, W., Glück, F., Grande, A., Grössle, R., Gugiatti, M., Gumbsheimer, R., Hannen, V., Hartmann, J., Haußmann, N., Helbing, K., Hickford, S., Hiller, R., Hillesheimer, D., Hinz, D., Höhn, T., Houdy, T., Huber, A., Jansen, A., Karl, C., Kellerer, J., King, P., Kleifges, M., Klein, M., Köhler, C., Köllenberger, L., Kopmann, A., Korzeczek, M., Kovalík, A., Krasch, B., Krause, H., Lasserre, T., La Cascio, L., Lebeda, O., Lechner, P., Lehnert, B., Le, T. L., Lokhov, A., Machatschek, M., Malcherek, E., Manfrin, D., Mark, M., Marsteller, A., Martin, E. L., Mazzola, E., Melzer, C., Mertens, S., Mostafa, J., Müller, K., Nava, A., Neumann, H., Niemes, S., Oelpmann, P., Onillon, A., Parno, D. S., Pavan, M., Pigliafreddo, A., Poon, A. W. P., Poyato, J. M. L., Pozzi, S., Priester, F., Puritscher, M., Radford, D. C., Ráliš, J., Ramachandran, S., Robertson, R. G. H., Rodejohann, W., Rodenbeck, C., Röllig, M., Röttele, C., Ryšavý, M., Sack, R., Saenz, A., Salomon, R. W. J., Schäfer, P., Schimpf, L., Schlösser, K., Schlösser, M., Schlüter, L., Schneidewind, S., Schrank, M., Schütz, A. K., Schwemmer, A., Sedlak, A., Šefčík, M., Sibille, V., Siegmann, D., Slezák, M., Spanier, F., Spreng, D., Steidl, M., Sturm, M., Telle, H. H., Thorne, L. A., Thümmler, T., Titov, N., Tkachev, I., Trigilio, P., Urban, K., Valerius, K., Vénos, D., Hernández, A. P. Vizcaya, Voigt, P., Weinheimer, C., Weiss, E., Welte, S., Wendel, J., Wiesinger, C., Wilkerson, J. F., Wolf, J., Wunderl, L., Wüstling, S., Wydra, J., Xu, W., Zadoroghny, S., Zeller, G.

Source: J. Phys. G: Nucl. Part. Phys. 49 (2022) 100501

Subject Terms: Nuclear Experiment, Astrophysics - Cosmology and Nongalactic Astrophysics, High Energy Physics - Experiment, Physics - Instrumentation and Detectors

Access URL: http://arxiv.org/abs/2203.08059

Light emission from ion-implanted SiGe quantum dots grown on Si substrates

Authors: Spindlberger, L., Aberl, J., Vukušić, L., Fromherz, T., Hartmann, J.-M., Fournel, F., Prucnal, S., Murphy-Armando, F., Brehm, M.

Source: In Materials Science in Semiconductor Processing October 2024 181