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    Conference

    Source: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :265-270 May, 2010

    Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)

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    Academic Journal

    Source: Journal of Materials Science: Materials in Electronics; Sep2011, Vol. 22 Issue 9, p1308-1312, 5p

    PDF Full Text
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    Conference

    Source: Proceedings of the International Offshore & Polar Engineering Conference; 2013, p477-481, 5p

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    Conference

    Source: 2011 18th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2011, p1-7, 7p

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    Academic Journal

    Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2008, Vol. 26 Issue 4, p688-691, 4p, 4 Black and White Photographs, 1 Graph

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    Academic Journal

    Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2008, Vol. 26 Issue 4, p688-691, 4p, 4 Black and White Photographs, 1 Graph

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