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1Conference
Authors: Takenaka, Mitsuru, Han, Jaehoon, Boeuf, Frederic, Park, Jinkwon, Li, Qiang, Ho, Chong Pei, Lyu, Dongsheng, Ohno, Shuhei, Fujikata, Junichi, Takahashi, Shigeki, Takagi, Shinichi
Source: 2018 European Conference on Optical Communication (ECOC) Optical Communication (ECOC), 2018 European Conference on. :1-3 Sep, 2018
Relation: 2018 European Conference on Optical Communication (ECOC)
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2Conference
Authors: Takenaka, Mitsuru, Han, Jaehoon, Li, Qiang, Ho, Chong Pei, Lyu, Dongsheng, Ohno, Shuhei, Takagi, Shinichi
Source: 2018 Photonics in Switching and Computing (PSC) Photonics in Switching and Computing (PSC), 2018. :1-2 Sep, 2018
Relation: 2018 Photonics in Switching and Computing (PSC)
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3Conference
Authors: Fujikata, Junichi, Kinoshita, Keizo, Han, Jaehoon, Horikawa, Tsuyoshi, Takahashi, Shigeki, Yashiki, Kenichiro, Kurihara, Mitsuru, Hagihara, Yasuhiko, Takenaka, Mitsuru, Nakamura, Takahiro, Kurata, Kazuhiko, Mogami, Tohru
Source: 2017 IEEE 14th International Conference on Group IV Photonics (GFP) Group IV Photonics (GFP), 2017 IEEE 14th International Conference on. :25-26 Aug, 2017
Relation: 2017 IEEE 14th International Conference on Group IV Photonics (GFP)
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4Conference
Authors: Yang, Seiyang, Han, Jaehoon, Kwak, Doowhan, Kim, Namdo, Cha, Daeseo, Park, Junhyuck, Kim, Jay
Source: 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014. :1-3 Mar, 2014
Relation: 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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5Periodical
Authors: Kim, Seong Kwang, Geum, Dae-Myeong, Lim, Hyeong-Rak, Han, Jaehoon, Kim, Hyungjun, Jeong, Yeonjoo, Kim, Sang-Hyeon
Source: IEEE electron device letters. 41(4):605-608
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6Conference
Authors: Kim, Younghyun, Han, Jaehoon, Takenaka, Mitsuru, Takagi, Shinichi
Source: 10th International Conference on Group IV Photonics Group IV Photonics (GFP), 2013 IEEE 10th International Conference on. :99-100 Aug, 2013
Relation: 2013 IEEE 10th International Conference on Group IV Photonics (GFP)
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7Periodical
Authors: Geum, Dae-Myeong, Kim, Seong Kwang, Kang, Chang-Mo, Moon, Seung-Hyun, Kyhm, Jihoon, Han, JaeHoon, Lee, Dong-Seon, Kim, SangHyeon
Source: Nanoscale. 11(48):23139-23148
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8Conference
Authors: Ocampo, Jaime, Jelic, Sacha, Han, Jaehoon
Source: SAE technical paper series. 36(0011)
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9Conference
Authors: Mukutmoni, Devadatta, Donley, Tristan, Han, Jaehoon, Muthuraman, Karthik Mahadevan, Campbell, P. David, Mertz, Tom
Source: SAE technical paper series. 01(2888)
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10
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11Periodical
Authors: Fujikata, Junichi, Noguchi, Masataka, Kim, Younghyun, Han, Jaehoon, Takahashi, Shigeki, Nakamura, Takahiro, Takenaka, Mitsuru
Source: Applied physics express. 11(3):032201-032201
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12Academic Journal
Authors: Kim, Seong Kwang, Jeong, YeonJoo, Bidenko, Pavlo, Lim, Hyeong-Rak, Jeon, Yu-Rim, Kim, Hansung, Lee, Yun Jung, Geum, Dae-Myeong, Han, JaeHoon, Choi, Changhwan, Kim, Hyung-jun, Kim, SangHyeon
Source: ACS Applied Materials & Interfaces; 2/12/2020, Vol. 12 Issue 6, p7372-7380, 9p
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13Academic Journal
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14Academic Journal
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15Academic Journal
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16Periodical
Authors: Vivien, Laurent, Pavesi, Lorenzo, Pelli, Stefano, Takenaka, Mitsuru, Kim, Younghyun, Han, Jaehoon, Kang, Jian, Ikku, Yuki, Cheng, Yongpeng, Park, Jinkwon, Takagi, Shinichi
Source: Proceedings of SPIE; April 2016, Vol. 9891 Issue: 1 p98911H-98911H-8, 890208p
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17Conference
Authors: Tryggvason, Getar, Juric, Damir, Han, Jaehoon, Ceccio, Steven L.
Source: Proceedings of SPIE; Nov1996, Issue 1, p178-184, 7p
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18Conference
Authors: Juric, Damir, Tryggvason, Grétar, Han, Jaehoon
Source: AIP Conference Proceedings; Jan1997, Vol. 387 Issue 1, p659-664, 6p
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19Academic Journal
Authors: Han, Jaehoon, Tryggvason, Grétar
Source: Physics of Fluids. Jun2001, Vol. 13 Issue 6, p1554. 12p.
Subject Terms: *DROPLETS, *FLUID dynamics, *NAVIER-Stokes equations, *REYNOLDS number
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20Academic Journal
Authors: Han, Jaehoon, Tryggvason, Gretar
Source: Physics of Fluids. Dec99, Vol. 11 Issue 12, p3650. 18p. 3 Diagrams, 16 Graphs.
Subject Terms: *DROPLETS, *LIQUIDS, *DENSITY, *PHYSICS experiments, *MEASUREMENT