SPICE-Level Demonstration of Unsupervised Learning With Spintronic Synapses in Spiking Neural Networks

Authors: Daddinounou, S., Gebregiorgis, A., Hamdioui, S., Vatajelu, E.

Source: IEEE Access Access, IEEE. 13:6845-6854 2025

EON-1: A Brain-Inspired Processor for Near-Sensor Extreme Edge Online Feature Extraction

Authors: Dobrita, A., Yousefzadeh, A., Thorpe, S., Vadivel, K., Detterer, P., Tang, G., van Schaik, G., Konijnenburg, M., Gebregiorgis, A., Hamdioui, S., Sifalakis, M.

Source: IEEE Transactions on Circuits and Systems for Artificial Intelligence IEEE Trans. Circuits Syst. Artif. Intel. Circuits and Systems for Artificial Intelligence, IEEE Transactions on. 1(2):128-140 Dec, 2024

Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing

Authors: Aziza, H., Postel-Pellerin, J., Fieback, M., Hamdioui, S., Xun, H., Taouil, M., Coulie, K., Rahajandraibe, W.

Source: 2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-5 Apr, 2024

Relation: 2024 IEEE 25th Latin American Test Symposium (LATS)

Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs

Authors: Copetti, T. S., Chordia, A., Fieback, M., Taouil, M., Hamdioui, S., Bolzani Poehls, L. M.

Source: 2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-6 Apr, 2024

Relation: 2024 IEEE 25th Latin American Test Symposium (LATS)

Two Cascaded Spin Wave Majority Gates Operation Under Continuous and Pulse Modes

Authors: Mahmoud, A.N., Ciubotaru, F., Vanderveken, F., Adelmann, C., Cotofana, S., Hamdioui, S.

Source: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 71(4):1919-1923 Apr, 2024

Reliable and Energy-Efficient Diabetic Retinopathy Screening Using Memristor-Based Neural Networks

Authors: Diware, S., Chilakala, K., Joshi, R.V., Hamdioui, S., Bishnoi, R.

Source: IEEE Access Access, IEEE. 12:47469-47482 2024

Using STLs for Effective In-Field Test of GPUs

Authors: Rodriguez Condia, J.E., da Silva, F.A., Bagbaba, A.C., Guerrero-Balaguera, J., Hamdioui, S., Sauer, C., Reorda, M.S.

Source: IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 40(2):109-117 Apr, 2023

Recent Trends and Perspectives on Defect-Oriented Testing

Authors: Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Reorda, M.S., Ullmann, R., Vanhooren, R., Xama, N., Wu, L.

Source: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-10 Sep, 2022

Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)

Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs

Authors: Copetti, T. S., Nilovic, M., Fieback, M., Gemmeke, T., Hamdioui, S., Bolzani Poehls, L. M.

Source: 2022 IEEE 23rd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2022 IEEE 23rd. :1-6 Sep, 2022

Relation: 2022 IEEE 23rd Latin American Test Symposium (LATS)

Accurate and Energy-Efficient Bit-Slicing for RRAM-Based Neural Networks

Authors: Diware, S., Singh, A., Gebregiorgis, A., Joshi, R.V., Hamdioui, S., Bishnoi, R.

Source: IEEE Transactions on Emerging Topics in Computational Intelligence IEEE Trans. Emerg. Top. Comput. Intell. Emerging Topics in Computational Intelligence, IEEE Transactions on. 7(1):164-177 Feb, 2023

Severity-Based Hierarchical ECG Classification Using Neural Networks

Authors: Diware, S., Dash, S., Gebregiorgis, A., Joshi, R.V., Strydis, C., Hamdioui, S., Bishnoi, R.

Source: IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 17(1):77-91 Feb, 2023

Efficient Signed Arithmetic Multiplication on Memristor-Based Crossbar

Authors: Zahedi, M., Shahroodi, T., Wong, S., Hamdioui, S.

Source: IEEE Access Access, IEEE. 11:33964-33978 2023

Balanced Dual-Mask Protection Scheme for GIFT Cipher Against Power Attacks

Authors: Aljuffri, A., Reinbrecht, C., Hamdioui, S., Taouil, M., Sepulveda, J.

Source: 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-6 Apr, 2022

Relation: 2022 IEEE 40th VLSI Test Symposium (VTS)

MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design

Authors: Wu, L., Rao, S., Taouil, M., Marinissen, E.J., Kar, G.S., Hamdioui, S.

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 41(11):4991-5004 Nov, 2022

Non-Binary Spin Wave Based Circuit Design

Authors: Mahmoud, A.N., Vanderveken, F., Ciubotaru, F., Adelmann, C., Hamdioui, S., Cotofana, S.

Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 69(10):3888-3900 Oct, 2022

Spin Wave Based Approximate Computing

Authors: Mahmoud, A., Vanderveken, F., Ciubotaru, F., Adelmann, C., Hamdioui, S., Cotofana, S.

Source: IEEE Transactions on Emerging Topics in Computing IEEE Trans. Emerg. Topics Comput. Emerging Topics in Computing, IEEE Transactions on. 10(4):1932-1940 Jan, 2022

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs

Authors: Wu, L., Rao, S., Taouil, M., Marinissen, E.J., Kar, G.S., Hamdioui, S.

Source: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 71(9):2219-2233 Sep, 2022

Evaluating the Impact of Process Variation on RRAMs

Authors: Brum, E., Fieback, M., Copetti, T. S., Jiayi, H., Hamdioui, S., Vargas, F., Poehls, L. M. Bolzani

Source: 2021 IEEE 22nd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2021 IEEE 22nd. :1-6 Oct, 2021

Relation: 2021 IEEE 22nd Latin American Test Symposium (LATS)

Advances in Magnetics Roadmap on Spin-Wave Computing

Authors: Chumak, A.V., Kabos, P., Wu, M., Abert, C., Adelmann, C., Adeyeye, A.O., Akerman, J., Aliev, F.G., Anane, A., Awad, A., Back, C.H., Barman, A., Bauer, G.E.W., Becherer, M., Beginin, E.N., Bittencourt, V.A.S.V., Blanter, Y.M., Bortolotti, P., Boventer, I., Bozhko, D.A., Bunyaev, S.A., Carmiggelt, J.J., Cheenikundil, R.R., Ciubotaru, F., Cotofana, S., Csaba, G., Dobrovolskiy, O.V., Dubs, C., Elyasi, M., Fripp, K.G., Fulara, H., Golovchanskiy, I.A., Gonzalez-Ballestero, C., Graczyk, P., Grundler, D., Gruszecki, P., Gubbiotti, G., Guslienko, K., Haldar, A., Hamdioui, S., Hertel, R., Hillebrands, B., Hioki, T., Houshang, A., Hu, C.-M., Huebl, H., Huth, M., Iacocca, E., Jungfleisch, M.B., Kakazei, G.N., Khitun, A., Khymyn, R., Kikkawa, T., Klaui, M., Klein, O., Klos, J.W., Knauer, S., Koraltan, S., Kostylev, M., Krawczyk, M., Krivorotov, I.N., Kruglyak, V.V., Lachance-Quirion, D., Ladak, S., Lebrun, R., Li, Y., Lindner, M., Macedo, R., Mayr, S., Melkov, G.A., Mieszczak, S., Nakamura, Y., Nembach, H.T., Nikitin, A.A., Nikitov, S.A., Novosad, V., Otalora, J.A., Otani, Y., Papp, A., Pigeau, B., Pirro, P., Porod, W., Porrati, F., Qin, H., Rana, B., Reimann, T., Riente, F., Romero-Isart, O., Ross, A., Sadovnikov, A.V., Safin, A.R., Saitoh, E., Schmidt, G., Schultheiss, H., Schultheiss, K., Serga, A.A., Sharma, S., Shaw, J.M., Suess, D., Surzhenko, O., Szulc, K., Taniguchi, T., Urbanek, M., Usami, K., Ustinov, A.B., Van der Sar, T., Van Dijken, S., Vasyuchka, V.I., Verba, R., Kusminskiy, S.V., Wang, Q., Weides, M., Weiler, M., Wintz, S., Wolski, S.P., Zhang, X.

Source: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 58(6):1-72 Jun, 2022

Improving the Detection of Undefined State Faults in FinFET SRAMs

Authors: Medeiros, G.C., Fieback, M., Copetti, T.S., Gebregiorgis, A., Taouil, M., Poehls, L.B., Hamdioui, S.

Source: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2021 16th International Conference on. :1-6 Jun, 2021

Relation: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)