Total Ionizing Dose Response of a 22-nm Compiled Fully Depleted Silicon-on-Insulator Static Random Access Memory

Authors: Clark, L.T., Brown, W.E., Holbert, K.E., Rao, A., Bikkina, P., Turowski, M., Levy, A., Olvarez, T., Butler, J.D., YoungSciortino, C.S., Guertin, S.M.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(8):2034-2041 Aug, 2023

Extracting Total Ionizing Dose Threshold Voltage Shifts From Ring Oscillator Circuit Response

Authors: Clark, L.T., Young-Sciortino, C.S., Guertin, S.M., Brown, W.E., Holbert, K.E., Bikkina, P., Bhanushali, S., Levy, A., Turowski, M., Butler, J.D.

Source: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(1):162-171 Mar, 2023

Total Ionizing Dose Impact on 22-nm FD-SOI Ring Oscillator Current and Frequency

Authors: Clark, L.T., Brown, W.E., Young-Sciortino, C.S., Butler, J.D., Guertin, S.M., Holbert, K.E., Bikkina, P., Bhanushali, S., Turowski, M., Levy, A.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(12):2305-2313 Dec, 2022

Dynamic SDRAM SEFI detection and recovery test results

Authors: Guertin, S.M., Patterson, J.D., Nguyen, D.N.

Source: 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) Radiation effects data workshop Radiation Effects Data Workshop, 2004 IEEE. :62-67 2004

Relation: 2004 IEEE Radiation Effects Data Workshop

A chip and pixel qualification methodology on imaging sensors

Authors: Yuan Chen, Guertin, S.M., Petkov, M., Nguyen, D.N., Novak, F.

Source: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :435-439 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

Catastrophic SEE in high-voltage power MOSFETs

Authors: Selva, L.E., Scheick, L.Z., McClure, S., Miyahira, T., Guertin, S.M., Shah, S.K., Edmonds, L.D., Patterson, J.D.

Source: 2003 IEEE Radiation Effects Data Workshop Radiation effects data workshop Radiation Effects Data Workshop, 2003. IEEE. :113-120 2003

Relation: 2003 IEEE Radiation Effects Data Workshop

The effects of space radiation on linear integrated circuits

Authors: Johnston, A.H., Guertin, S.M.

Source: 2000 IEEE Aerospace Conference. Proceedings (Cat. No.00TH8484) Aerospace conference Aerospace Conference Proceedings, 2000 IEEE. 5:363-369 vol.5 2000

Relation: 2000 IEEE Aerospace Conference Proceedings

Single-event upset test results for the Xilinx XQ1701L PROM

Authors: Guertin, S.M., Swift, G.M., Nguyen, D.

Source: 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) Radiation effects data workshop Radiation Effects Data Workshop, 1999. :35-40 1999

Relation: 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

SEU evaluation of SRAM memories for space applications

Authors: Scheick, L.Z., Swift, G.M., Guertin, S.M.

Source: 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) Radiation effects Radiation Effects Data Workshop, 2000. :61-63 2000

Relation: 2000 IEEE Radiation Effects Data Workshop. Workshop Record

Single-event upset in the PowerPC750 microprocessor

Authors: Swift, G.M., Fannanesh, F.F., Guertin, S.M., Irom, F., Millward, D.G.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 48(6):1822-1827 Dec, 2001

Ion-induced stuck bits in 1T/1C SDRAM cells

Authors: Edmonds, L.D., Guertin, S.M., Scheick, L.Z., Nguyen, D., Swift, G.M.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 48(6):1925-1930 Dec, 2001

In-flight observations of multiple-bit upset in DRAMs

Authors: Swift, G.M., Guertin, S.M.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 47(6):2386-2391 Dec, 2000

Angular dependence of DRAM upset susceptibility and implications for testing and analysis

Authors: Guertin, S.M., Edmonds, L.D., Swift, G.M.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 47(6):2380-2385 Dec, 2000

Analysis of radiation effects on individual DRAM cells

Authors: Scheick, L.Z., Guertin, S.M., Swift, G.M.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 47(6):2534-2538 Dec, 2000

Angular and energy dependence of proton upset in optocouplers

Authors: Johnston, A.H., Miyahira, T., Swift, G.M., Guertin, S.M., Edmonds, L.D.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 46(6):1335-1341 Dec, 1999

Radiation effects on advanced flash memories

Authors: Nguyen, D.N., Guertin, S.M., Swift, G.M., Johnston, A.H.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 46(6):1744-1750 Dec, 1999

Radiation Tests on 2Gb NAND Flash Memories

Authors: Nguyen, D.N., Guertin, S.M., Patterson, J.D.

Source: 2006 IEEE Radiation Effects Data Workshop Radiation Effects Data Workshop, 2006 IEEE. :121-125 Jul, 2006

Relation: 2006 IEEE Radiation Effects Data Workshop

The Effect of Total Ionizing Dose Degradation on Laptop Hard Disks

Authors: Nguyen, D.N., Guertin, S.M., Patterson, J.D.

Source: 2005 8th European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on. :PW9-1-PW9-4 Sep, 2005

Relation: 2005 8th European Conference on Radiation and Its Effects on Components and Systems

Evolution of the differential transverse momentum correlation function with centrality in Au+Au collisions at sNN=200 GeV

Authors: Agakishiev, G., Aggarwal, M.M., Ahammed, Z., Alakhverdyants, A.V., Alekseev, I., Alford, J., Anderson, B.D., Anson, C.D., Arkhipkin, D., Averichev, G.S., Balewski, J., Beavis, D.R., Behera, N.K., Bellwied, R., Betancourt, M.J., Betts, R.R., Bhasin, A., Bhati, A.K., Bichsel, H., Bielcik, J., Bielcikova, J., Biritz, B., Bland, L.C., Bordyuzhin, I.G., Borowski, W., Bouchet, J., Braidot, E., Brandin, A.V., Bridgeman, A., Brovko, S.G., Bruna, E., Bueltmann, S., Bunzarov, I., Burton, T.P., Cai, X.Z., Caines, H., Calderón de la Barca Sánchez, M., Cebra, D., Cendejas, R., Cervantes, M.C., Chajecki, Z., Chaloupka, P., Chattopadhyay, S., Chen, H.F., Chen, J.H., Chen, J.Y., Chen, L., Cheng, J., Cherney, M., Chikanian, A., Choi, K.E., Christie, W., Chung, P., Codrington, M.J.M., Corliss, R., Cramer, J.G., Crawford, H.J., Davila Leyva, A., De Silva, L.C., Debbe, R.R., Dedovich, T.G., Derevschikov, A.A., Derradi de Souza, R., Didenko, L., Djawotho, P., Dogra, S.M., Dong, X., Drachenberg, J.L., Draper, J.E., Dunlop, J.C., Efimov, L.G., Elnimr, M., Engelage, J., Eppley, G., Estienne, M., Eun, L., Evdokimov, O., Fatemi, R., Fedorisin, J., Fersch, R.G., Filip, P., Finch, E., Fine, V., Fisyak, Y., Gagliardi, C.A., Gangadharan, D.R., Geurts, F., Ghosh, P., Gorbunov, Y.N., Gordon, A., Grebenyuk, O.G., Grosnick, D., Guertin, S.M., Gupta, A., Gupta, S., Guryn, W., Haag, B., Hajkova, O., Hamed, A., Han, L.-X., Harris, J.W., Hays-Wehle, J.P., Heinz, M., Heppelmann, S., Hirsch, A., Hjort, E., Hoffmann, G.W., Hofman, D.J., Huang, B., Huang, H.Z., Humanic, T.J., Huo, L., Igo, G., Jacobs, P., Jacobs, W.W., Jena, C., Jin, F., Joseph, J., Judd, E.G., Kabana, S., Kang, K., Kapitan, J., Kauder, K., Ke, H.W., Keane, D., Kechechyan, A., Kettler, D., Kikola, D.P., Kiryluk, J., Kisiel, A., Kizka, V., Knospe, A.G., Koetke, D.D., Kollegger, T., Konzer, J., Koralt, I., Koroleva, L., Korsch, W., Kotchenda, L., Kouchpil, V., Kravtsov, P., Krueger, K., Krus, M., Kumar, L., Kurnadi, P., Lamont, M.A.C., Landgraf, J.M., LaPointe, S., Lauret, J., Lebedev, A., Lednicky, R., Lee, J.H., Leight, W., LeVine, M.J., Li, C., Li, L., Li, N., Li, W., Li, X., Li, Y., Li, Z.M., Lima, L.M., Lisa, M.A., Liu, F., Liu, H., Liu, J., Ljubicic, T., Llope, W.J., Longacre, R.S., Love, W.A., Lu, Y., Lukashov, E.V., Luo, X., Ma, G.L., Ma, Y.G., Mahapatra, D.P., Majka, R., Mall, O.I., Manweiler, R., Margetis, S., Markert, C., Masui, H., Matis, H.S., Matulenko, Yu.A., McDonald, D., McShane, T.S., Meschanin, A., Milner, R., Minaev, N.G., Mioduszewski, S., Mitrovski, M.K., Mohammed, Y., Mohanty, B., Mondal, M.M., Morozov, B., Morozov, D.A., Munhoz, M.G., Mustafa, M.K., Naglis, M., Nandi, B.K., Nayak, T.K., Netrakanti, P.K., Nogach, L.V., Nurushev, S.B., Odyniec, G., Ogawa, A., Oh, K., Ohlson, A., Okorokov, V., Oldag, E.W., Oliveira, R.A.N., Olson, D., Pachr, M., Page, B.S., Pal, S.K., Pandit, Y., Panebratsev, Y., Pawlak, T., Pei, H., Peitzmann, T., Perkins, C., Peryt, W., Pile, P., Planinic, M., Ploskon, M.A., Pluta, J., Plyku, D., Poljak, N., Porter, J., Poskanzer, A.M., Potukuchi, B.V.K.S., Powell, C.B., Prindle, D., Pruneau, C., Pruthi, N.K., Pujahari, P.R., Putschke, J., Qiu, H., Raniwala, R., Raniwala, S., Redwine, R., Reed, R., Ritter, H.G., Roberts, J.B., Rogachevskiy, O.V., Romero, J.L., Ruan, L., Rusnak, J., Sahoo, N.R., Sakrejda, I., Salur, S., Sandweiss, J., Sangaline, E., Sarkar, A., Schambach, J., Scharenberg, R.P., Schmah, A.M., Schmitz, N., Schuster, T.R., Seele, J., Seger, J., Selyuzhenkov, I., Seyboth, P., Shah, N., Shahaliev, E., Shao, M., Sharma, M., Shi, S.S., Shou, Q.Y., Sichtermann, E.P., Simon, F., Singaraju, R.N., Skoby, M.J., Smirnov, N., Solanki, D., Sorensen, P., Souza, U.G., Spinka, H.M., Srivastava, B., Stanislaus, T.D.S., Staszak, D., Steadman, S.G., Stevens, J.R., Stock, R., Strikhanov, M., Stringfellow, B., Suaide, A.A.P., Suarez, M.C., Subba, N.L., Sumbera, M., Sun, X.M., Sun, Y., Sun, Z., Surrow, B., Svirida, D.N., Symons, T.J.M., Szanto de Toledo, A., Takahashi, J., Tang, A.H., Tang, Z., Tarini, L.H., Tarnowsky, T., Thein, D., Thomas, J.H., Tian, J., Timmins, A.R., Tlusty, D., Tokarev, M., Trentalange, S., Tribble, R.E., Tribedy, P., Tsai, O.D., Ullrich, T., Underwood, D.G., Van Buren, G., van Nieuwenhuizen, G., Vanfossen, J.A., Varma, R., Vasconcelos, G.M.S., Vasiliev, A.N., Videbæk, F., Viyogi, Y.P., Vokal, S., Voloshin, S.A., Wada, M., Walker, M., Wang, F., Wang, G., Wang, H., Wang, J.S., Wang, Q., Wang, X.L., Wang, Y., Webb, G., Webb, J.C., Westfall, G.D., Whitten, C., Wieman, H., Wissink, S.W., Witt, R., Witzke, W., Wu, Y.F., Xiao, Z., Xie, W., Xu, H., Xu, N., Xu, Q.H., Xu, W., Xu, Y., Xu, Z., Xue, L., Yang, Y., Yepes, P., Yip, K., Yoo, I.-K., Zawisza, M., Zbroszczyk, H., Zhan, W., Zhang, J.B., Zhang, S., Zhang, W.M., Zhang, X.P., Zhang, Y., Zhang, Z.P., Zhao, F., Zhao, J., Zhong, C., Zhou, W., Zhu, X., Zhu, Y.H., Zoulkarneev, R., Zoulkarneeva, Y.

Source: Physics letters B. 704(5):467-473

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100058415485.0x000001&indx=1&recIds=ETOCvdc_100058415485.0x000001

Investigation of Low Cross Section Events in the RHBD/FT UT699 Leon 3FT.

Authors: Guertin, S.M., Hafer, C., Griffith, S.

Source: 2011 IEEE Radiation Effects Data Workshop (REDW); 2011, p1-8, 8p