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1Academic Journal
Authors: Van Assche, J., Frenkel, C., Safa, A., Gielen, G.
Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 72(3):1093-1104 Mar, 2025
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2Academic Journal
Authors: Akkan, N., Willems, K., Martens, K., Voorspoels, A., Gielen, G., Van Dorpe, P., Verhulst, A.S.
Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 25(2):2169-2177 Jan, 2025
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3Academic Journal
Authors: Alea, M.D., Safa, A., Giacomozzi, F., Adami, A., Temel, I.R., Rosa, M.A., Lorenzelli, L., Gielen, G.
Source: IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 18(6):1308-1320 Dec, 2024
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4Academic Journal
Authors: Lorenzelli, F., Godfrin, C., Stucchi, M., Grill, A., Li, R., Wan, D., Greve, K.D., Marinissen, E.J., Gielen, G.
Source: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(11):2217-2220 Nov, 2024
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5Conference
Authors: Sangani, D., Kaczer, B., Weckx, P., Roussel, Ph. J., Mishra, S., Marinissen, E. J., Gielen, G.
Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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6Academic Journal
Authors: Carlino, M.F., Gielen, G.
Source: IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 18(3):511-522 Jun, 2024
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7Academic Journal
Authors: Gys, B., Burgelman, L., De Greve, K., Gielen, G., Catthoor, F.
Source: IEEE Transactions on Quantum Engineering IEEE Trans. Quantum Eng. Quantum Engineering, IEEE Transactions on. 5:1-11 2024
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8Academic Journal
Authors: Chen, Y., Tacca, B., Biswas, D., Gielen, G., Catthoor, F., Verhelst, M., Mora Lopez, C.
Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 58(11):2990-3002 Nov, 2023
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9Academic Journal
Authors: Xama, N., Gomez, J., Dobbelaere, W., Vanhooren, R., Coyette, A., Gielen, G.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(10):3426-3435 Oct, 2023
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10Conference
Authors: Sangani, D., Diaz-Fortuny, J., Bury, E., Kaczer, B., Gielen, G.
Source: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023
Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)
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11Academic Journal
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
Authors: Sangani, D., Diaz-Fortuny, J., Bury, E., Franco, J., Kaczer, B., Gielen, G.
Source: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):346-354 Sep, 2023
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12Academic Journal
Authors: Alvero-Gonzalez, L.M., Gielen, G., Gutierrez, E.
Source: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 70(9):3238-3242 Sep, 2023
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13Conference
Authors: Saraza-Canflanca, P., Sangani, D., Diaz-Fortuny, J., Tyaginov, S., Gielen, G., Bury, E., Kaczer, B.
Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :8A.2-1-8A.2-9 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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14Conference
Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions
Authors: Sangani, D., Diaz-Fortuny, J., Bury, E., Kaczer, B., Gielen, G.
Source: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-6 Oct, 2022
Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)
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15Conference
Authors: Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Reorda, M.S., Ullmann, R., Vanhooren, R., Xama, N., Wu, L.
Source: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-10 Sep, 2022
Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)
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16Academic Journal
Authors: Gomez, J., Xama, N., Coyette, A., Vanhooren, R., Dobbelaere, W., Gielen, G.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 41(11):4771-4781 Nov, 2022
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17Academic Journal
Authors: Huang, X., Londono-Ramirez, H., Ballini, M., Van Hoof, C., Genoe, J., Haesler, S., Gielen, G., Helleputte, N.V., Lopez, C.M.
Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(11):3312-3323 Nov, 2022
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18Academic Journal
Authors: Gys, B., Acharya, R., Van Winckel, S., De Greve, K., Gielen, G., Catthoor, F.
Source: IEEE Journal on Emerging and Selected Topics in Circuits and Systems IEEE J. Emerg. Sel. Topics Circuits Syst. Emerging and Selected Topics in Circuits and Systems, IEEE Journal on. 12(3):685-693 Sep, 2022
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19Academic Journal
Authors: Sacco, E., Vergauwen, J., Gielen, G.
Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(9):2764-2777 Sep, 2022
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20Academic Journal
Authors: Gomez, J., Xama, N., Lootens, D., Coyette, A., Vanhooren, R., Dobbelaere, W., Gielen, G.
Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(9):4796-4802 Sep, 2022