FREYA: A 0.023-mm²/Channel, 20.8- μW/Channel, Event-Driven 8-Channel SoC for Spiking End-to-End Sensing of Time-Sparse Biosignals

Authors: Van Assche, J., Frenkel, C., Safa, A., Gielen, G.

Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 72(3):1093-1104 Mar, 2025

Nanopore Field-Effect Transistors for Single-Protein Detection: Design and Operation Optimization via Compact Modeling

Authors: Akkan, N., Willems, K., Martens, K., Voorspoels, A., Gielen, G., Van Dorpe, P., Verhulst, A.S.

Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 25(2):2169-2177 Jan, 2025

A Fingertip-Mimicking 12$\times$16 200 $\mu$m-Resolution e-Skin Taxel Readout Chip With Per-Taxel Spiking Readout and Embedded Receptive Field Processing

Authors: Alea, M.D., Safa, A., Giacomozzi, F., Adami, A., Temel, I.R., Rosa, M.A., Lorenzelli, L., Gielen, G.

Source: IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 18(6):1308-1320 Dec, 2024

Understanding the Transistor Behavior of Electron-Spin Qubits Above Cryogenic Temperatures

Authors: Lorenzelli, F., Godfrin, C., Stucchi, M., Grill, A., Li, R., Wan, D., Greve, K.D., Marinissen, E.J., Gielen, G.

Source: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(11):2217-2220 Nov, 2024

Possible Origins, Identification, and Screening of Silent Data Corruption in Data Centers

Authors: Sangani, D., Kaczer, B., Weckx, P., Roussel, Ph. J., Mishra, S., Marinissen, E. J., Gielen, G.

Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

Brain Feature Extraction With an Artifact-Tolerant Multiplexed Time-Encoding Neural Frontend for True Real-Time Closed-Loop Neuromodulation

Authors: Carlino, M.F., Gielen, G.

Source: IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 18(3):511-522 Jun, 2024

Hybrid Hamiltonian Simulation Approach for the Analysis of Quantum Error Correction Protocol Robustness

Authors: Gys, B., Burgelman, L., De Greve, K., Gielen, G., Catthoor, F.

Source: IEEE Transactions on Quantum Engineering IEEE Trans. Quantum Eng. Quantum Engineering, IEEE Transactions on. 5:1-11 2024

An Online-Spike-Sorting IC Using Unsupervised Geometry-Aware OSort Clustering for Efficient Embedded Neural-Signal Processing

Authors: Chen, Y., Tacca, B., Biswas, D., Gielen, G., Catthoor, F., Verhelst, M., Mora Lopez, C.

Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 58(11):2990-3002 Nov, 2023

Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers

Authors: Xama, N., Gomez, J., Dobbelaere, W., Vanhooren, R., Coyette, A., Gielen, G.

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(10):3426-3435 Oct, 2023

The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper)

Authors: Sangani, D., Diaz-Fortuny, J., Bury, E., Kaczer, B., Gielen, G.

Source: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology

Authors: Sangani, D., Diaz-Fortuny, J., Bury, E., Franco, J., Kaczer, B., Gielen, G.

Source: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):346-354 Sep, 2023

Delay Cell for Highly-Linear Current-Controlled Oscillator-Based Analog-to-Digital Conversion

Authors: Alvero-Gonzalez, L.M., Gielen, G., Gutierrez, E.

Source: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 70(9):3238-3242 Sep, 2023

Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays

Authors: Saraza-Canflanca, P., Sangani, D., Diaz-Fortuny, J., Tyaginov, S., Gielen, G., Bury, E., Kaczer, B.

Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :8A.2-1-8A.2-9 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions

Authors: Sangani, D., Diaz-Fortuny, J., Bury, E., Kaczer, B., Gielen, G.

Source: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-6 Oct, 2022

Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

Recent Trends and Perspectives on Defect-Oriented Testing

Authors: Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Reorda, M.S., Ullmann, R., Vanhooren, R., Xama, N., Wu, L.

Source: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-10 Sep, 2022

Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)

DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value

Authors: Gomez, J., Xama, N., Coyette, A., Vanhooren, R., Dobbelaere, W., Gielen, G.

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 41(11):4771-4781 Nov, 2022

Actively Multiplexed μECoG Brain Implant System With Incremental-ΔΣ ADCs Employing Bulk-DACs

Authors: Huang, X., Londono-Ramirez, H., Ballini, M., Van Hoof, C., Genoe, J., Haesler, S., Gielen, G., Helleputte, N.V., Lopez, C.M.

Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(11):3312-3323 Nov, 2022

A Co-Simulation Methodology for the Design of Integrated Silicon Spin Qubits With Their Control/Readout Cryo-CMOS Electronics

Authors: Gys, B., Acharya, R., Van Winckel, S., De Greve, K., Gielen, G., Catthoor, F.

Source: IEEE Journal on Emerging and Selected Topics in Circuits and Systems IEEE J. Emerg. Sel. Topics Circuits Syst. Emerging and Selected Topics in Circuits and Systems, IEEE Journal on. 12(3):685-693 Sep, 2022

A 96.9-dB-Resolution 109-μW Second-Order Robust Closed-Loop VCO-Based Sensor Interface for Multiplexed Single-Ended Resistance Readout in 180-nm CMOS

Authors: Sacco, E., Vergauwen, J., Gielen, G.

Source: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(9):2764-2777 Sep, 2022

Experimental Validation of a Compact Pinhole Latent Defect Model for MOS Transistors

Authors: Gomez, J., Xama, N., Lootens, D., Coyette, A., Vanhooren, R., Dobbelaere, W., Gielen, G.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(9):4796-4802 Sep, 2022