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  1. 1
    Academic Journal

    Source: IEEE Transactions on Automation Science and Engineering IEEE Trans. Automat. Sci. Eng. Automation Science and Engineering, IEEE Transactions on. 22:3567-3581 2025

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    Academic Journal

    Source: IEEE Transactions on Automation Science and Engineering IEEE Trans. Automat. Sci. Eng. Automation Science and Engineering, IEEE Transactions on. 22:1045-1056 2025

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    Report

    Authors: Aker, M., Batzler, D., Beglarian, A., Beisenkötter, J., Biassoni, M., Bieringer, B., Biondi, Y., Block, F., Bornschein, B., Bornschein, L., Böttcher, M., Carminati, M., Chatrabhuti, A., Chilingaryan, S., Daniel, B. A., Descher, M., Barrero, D. Díaz, Doe, P. J., Dragoun, O., Drexlin, G., Edzards, F., Eitel, K., Ellinger, E., Engel, R., Enomoto, S., Felden, A., Fengler, C., Fiorini, C., Formaggio, J. A., Forstner, C., Fränkle, F. M., Gagliardi, G., Gauda, K., Gavin, A. S., Gil, W., Glück, F., Grössle, R., Gutknecht, N., Hannen, V., Hasselmann, L., Helbing, K., Henke, H., Heyns, S., Hiller, R., Hillesheimer, D., Hinz, D., Höhn, T., Huber, A., Jansen, A., Khosonthongkee, K., Köhler, C., Köllenberger, L., Kopmann, A., Kovač, N., La Cascio, L., Lasserre, T., Lauer, J., Le, T. L., Lebeda, O., Lehnert, B., Li, G., Lokhov, A., Machatschek, M., Mark, M., Marsteller, A., McMichael, K., Melzer, C., Mertens, S., Mohanty, S., Mostafa, J., Müller, K., Nava, A., Neumann, H., Niemes, S., Onillon, A., Parno, D. S., Pavan, M., Pinsook, U., Poon, A. W. P., Poyato, J. M. L., Priester, F., Ráliš, J., Ramachandran, S., Robertson, R. G. H., Rodenbeck, C., Röllig, M., Sack, R., Saenz, A., Salomon, R., Schäfer, P., Schlösser, K., Schlösser, M., Schlüter, L., Schneidewind, S., Schrank, M., Schürmann, J., Schütz, A. K., Schwemmer, A., Schwenck, A., Seeyangnok, J., Šefčík, M., Siegmann, D., Simon, F., Songwadhana, J., Spanier, F., Spreng, D., Sreethawong, W., Steidl, M., Štorek, J., Stribl, X., Sturm, M., Suwonjandee, N., Jerome, N. Tan, Telle, H. H., Thorne, L. A., Thümmler, T., Titov, N., Tkachev, I., Urban, K., Valerius, K., Vénos, D., Weinheimer, C., Welte, S., Wendel, J., Wetter, M., Wiesinger, C., Wilkerson, J. F., Wolf, J., Wüstling, S., Wydra, J., Xu, W., Zadorozhny, S., Zeller, G.

  5. 5
    Conference

    Source: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024

    Relation: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)

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    Academic Journal

    Source: IEEE Transactions on Control of Network Systems IEEE Trans. Control Netw. Syst. Control of Network Systems, IEEE Transactions on. 9(4):1743-1753 Dec, 2022

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  13. 13
    Academic Journal

    Source: IEEE Transactions on Mobile Computing IEEE Trans. on Mobile Comput. Mobile Computing, IEEE Transactions on. 21(12):4656-4666 Dec, 2022

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    Academic Journal

    Source: IEEE Transactions on Control Systems Technology IEEE Trans. Contr. Syst. Technol. Control Systems Technology, IEEE Transactions on. 29(4):1437-1449 Jul, 2021

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