Dual-Parallel-Pixel-Row Decoupling Method for Camera-Based Three-Degree-of-Freedom Interferometers

Authors: Hu, P., Lin, X., Molnar, G., Werner, C., Fu, H., Yang, R., Flugge, J., Yu, L.

Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(16):26190-26198 Aug, 2024

Dimensional nanometrology at PTB

Authors: Danzebrink, H.-U., Dai, G., Pohlenz, F., Dziomba, T., Butefisch, S., Flugge, J., Bosse, H.

Source: 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International. :898-901 May, 2012

Relation: 2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

New Methodology for Realistic Integration of Sorption Processes Safety Assessments - 14153
Waste management

Authors: Monig, J., Noseck, U., Britz, S., Flugge, J., Brendler, V., Stockmann, M.

Source: WASTE MANAGEMENT -TUCSON-. 6:5237-5252

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN087477550&indx=1&recIds=ETOCCN087477550

The impact of climate transitions on the radionuclide transport through a sedimentary aquifer
Geological Society of South Africa; Assessing and managing groundwater in different environments

Authors: Flugge, J., Stockmann, M., Schneider, A., Noseck, U.

Source: HYDROGEOLOGY SELECTED PAPERS. 19:147-164

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN085432405&indx=1&recIds=ETOCCN085432405

Fabrication and Characterization of an Improved Micro Inductosyn
Magnetic materials, processes and devices

Authors: Miletic, D., Flugge, J., Gatzen, H.H.

Source: ECS TRANSACTIONS. 50(10):175-188

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN085279815&indx=1&recIds=ETOCCN085279815

Stability of a Fiber-Fed Heterodyne Interferometer
Laser metrology for precision measurement and inspection in industry

Authors: Weichert, C., Flugge, J., Kochert, P., Koning, R., Tutsch, R.

Source: VDI BERICHTE. (2156):243-250

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN080309350&indx=1&recIds=ETOCCN080309350

A fast Phasemeter for Interferometric Applications with an Accuracy in the Picometer Regime
Laser metrology for precision measurement and inspection in industry

Authors: Kochert, P., Flugge, J., Weichert, C., Koning, R., Manske, E.

Source: VDI BERICHTE. (2156):251-258

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN080309362&indx=1&recIds=ETOCCN080309362

Development and Test of a Heterodyne Phase Measurement Electronics
European Society for Precision Engineering and Nanotechnology

Authors: Flugge, J., Weichert, C., Koning, R., Hu, H., Bosse, H.

Source: PROCEEDINGS OF THE EUSPEN CONFERENCE. Conf 9^t^h:372-375

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN077192188&indx=1&recIds=ETOCCN077192188

Aspects of design and the characterization of a high resolution heterodyne displacement interferometer
Advanced optical metrology

Authors: Weichert, C., Flugge, J., Koning, R., Bosse, H., Tutsch, R.

Source: FRINGE -INTERNATIONAL WORKSHOP-. Conf 6:263-268

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN074429474&indx=1&recIds=ETOCCN074429474

A method for the in situ determination of Abbe errors and their correction
Nanoscale seminar; Nanoscale metrology

Authors: Koning, R., Flugge, J., Bosse, H.

Source: MEASUREMENT SCIENCE AND TECHNOLOGY. 18(2):476-481

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN063018235&indx=1&recIds=ETOCCN063018235

S3P24 Control system for guiding deviations on the PTB nanometer comparator
European Society for Precision Engineering and Nanotechnology

Authors: Flugge, J., Koning, R., Bosse, H.

Source: PROCEEDINGS OF THE EUSPEN INTERNATIONAL CONFERENCE. CONF 5:233-236

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN057135840&indx=1&recIds=ETOCCN057135840

Recent activities at PTB nanometer comparator [5190-41]
Recent developments in traceable dimensional measurements

Authors: Flugge, J., Koning, R., Bosse, H.

Source: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 5190:391-399

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN050831198&indx=1&recIds=ETOCCN050831198

Improved second-harmonic two-wavelength interferometer with refractive index correction without effect modulation [5190-35]
Recent developments in traceable dimensional measurements

Authors: Bodermann, B., Flugge, J., Meiners-Hagen, K.

Source: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 5190:339-346

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN050831137&indx=1&recIds=ETOCCN050831137

Line scale comparison Nano3 [5190-12]
Recent developments in traceable dimensional measurements

Authors: Bosse, H., Hassler-Grohne, W., Flugge, J., Koning, R.

Source: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 5190:122-133

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN050830911&indx=1&recIds=ETOCCN050830911

Status of the nanometer comparator at PTB [4401-33]
Recent developments in traceable dimensional measurements

Authors: Flugge, J., Koning, R. G.

Source: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 4401:275-283

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN042357054&indx=1&recIds=ETOCCN042357054

Realizing traceability to the SI in dimensional metrology: today and in the future (Invited Paper) [4401-27]
Recent developments in traceable dimensional measurements

Authors: Kunzmann, H., Jager, F., Flugge, J.

Source: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 4401:253-262

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN042357029&indx=1&recIds=ETOCCN042357029

Software and Control System of the PTB Nanometer Length Comparator
European Society for Precision Engineering and Nanotechnology

Authors: Flugge, J., Dai, G., Koning, R.

Source: PROCEEDINGS OF THE EUSPEN INTERNATIONAL CONFERENCE. 2:548-551

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN041267720&indx=1&recIds=ETOCCN041267720

Design Aspects of the international Line Scale Comparison Nano3
European Society for Precision Engineering and Nanotechnology

Authors: Bosse, H., Hassler-Grohne, W., Tschirnich, J., Flugge, J., Bonsch, G., Speckbacher, P., Israel, W.

Source: PROCEEDINGS OF THE EUSPEN INTERNATIONAL CONFERENCE. 2:302-305

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN041267094&indx=1&recIds=ETOCCN041267094

Design of the Temperature Measurement and Control System at the PTB Nanometer Comparator
EUSPEN topical conference on fabrication and metrology in nanotechnology

Authors: Flugge, J., Dai, G.

Source: PROCEEDINGS OF THE EUSPEN TOPICAL CONFERENCE ON FABRICATION AND METROLOGY IN NANOTECHNOLOGY. 2:303-309

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN036683818&indx=1&recIds=ETOCCN036683818

PCM-shielding of precision measuring equipment by means of latent heat

Authors: Schalles, M., Frohlich, T., Flugge, J.

Source: PRECISION ENGINEERING. 42:80-84

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN369422903&indx=1&recIds=ETOCRN369422903