Optimal Machine Learning and Signal Processing Synergies for Low-Resource GNSS Interference Classification

Authors: van der Merwe, J.R., Franco, D.C., Feigl, T., Rugamer, A.

Source: IEEE Transactions on Aerospace and Electronic Systems IEEE Trans. Aerosp. Electron. Syst. Aerospace and Electronic Systems, IEEE Transactions on. 60(3):2705-2721 Jun, 2024

Velocity-Based Channel Charting With Spatial Distribution Map Matching

Authors: Stahlke, M., Yammine, G., Feigl, T., Eskofier, B.M., Mutschler, C.

Source: IEEE Journal of Indoor and Seamless Positioning and Navigation J. Ind. Sea. Pos. Nav. Indoor and Seamless Positioning and Navigation, IEEE Journal of. 2:230-239 2024

Estimating Multipath Component Delays With Transformer Models

Authors: Ott, J., Stahlke, M., Feigl, T., Mutschler, C.

Source: IEEE Journal of Indoor and Seamless Positioning and Navigation J. Ind. Sea. Pos. Nav. Indoor and Seamless Positioning and Navigation, IEEE Journal of. 2:219-229 2024

Uncertainty-Based Fingerprinting Model Monitoring for Radio Localization

Authors: Stahlke, M., Feigl, T., Kram, S., Eskofier, B.M., Mutschler, C.

Source: IEEE Journal of Indoor and Seamless Positioning and Navigation J. Ind. Sea. Pos. Nav. Indoor and Seamless Positioning and Navigation, IEEE Journal of. 2:166-176 2024

Double diffraction imaging of X-ray induced structural dynamics in single free nanoparticles

Authors: Sauppe, M., Bischoff, T., Bomme, C., Bostedt, C., Colombo, A., Erk, B., Feigl, T., Flückiger, L., Gorkhover, T., Heilrath, A., Kolatzki, K., Kumagai, Y., Langbehn, B., Müller, J. P., Passow, C., Ramm, D., Rolles, D., Rompotis, D., Schäfer-Zimmermann, J., Senfftleben, B., Treusch, R., Ulmer, A., Zimbalski, J., Möller, T., Rupp, D.

Subject Terms: Physics - Atomic and Molecular Clusters, Physics - Instrumentation and Detectors, Physics - Optics

Access URL: http://arxiv.org/abs/2312.12548

Indoor Localization With Robust Global Channel Charting: A Time-Distance-Based Approach

Authors: Stahlke, M., Yammine, G., Feigl, T., Eskofier, B.M., Mutschler, C.

Source: IEEE Transactions on Machine Learning in Communications and Networking Trans. Mach. Learn. Comm. Netw. Machine Learning in Communications and Networking, IEEE Transactions on. 1:3-17 2023

Estimating TOA Reliability With Variational Autoencoders

Authors: Stahlke, M., Kram, S., Ott, F., Feigl, T., Mutschler, C.

Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 22(6):5133-5140 Mar, 2022

Recurrent Neural Networks on Drifting Time-of-Flight Measurements

Authors: Feigl, T., Nowak, T., Philippsen, M., Edelhausser, T., Mutschler, C.

Source: 2018 International Conference on Indoor Positioning and Indoor Navigation (IPIN) Indoor Positioning and Indoor Navigation (IPIN), 2018 International Conference on. :206-212 Sep, 2018

Relation: 2018 International Conference on Indoor Positioning and Indoor Navigation (IPIN)

Sick Moves! Motion Parameters as Indicators of Simulator Sickness

Authors: Feigl, T., Roth, D., Gradl, S., Wirth, M., Latoschik, M.E., Eskofier, B.M., Philippsen, M., Mutschler, C.

Source: IEEE Transactions on Visualization and Computer Graphics IEEE Trans. Visual. Comput. Graphics Visualization and Computer Graphics, IEEE Transactions on. 25(11):3146-3157 Nov, 2019

Damage resistant and low stress EUV multilayer mirrors

Authors: Feigl, T., Yulin, S., Kuhlmann, T., Kaiser, N.

Source: Digest of Papers. Microprocesses and Nanotechnology 2001. 2001 International Microprocesses and Nanotechnology Conference (IEEE Cat. No.01EX468) Microprocesses and nanotechnology Microprocesses and Nanotechnology Conference, 2001 International. :130-131 2001

Relation: Digest of Papers. Microprocesses and Nanotechnology 2001. 2001 International Microprocesses and Nanotechnology Conference

Interlayer transition zones in Mo/Si superlattices.

Authors: Yulin, S., Feigl, T., Kuhlmann, T.

Source: Journal of Applied Physics; August 1 2002, Vol. 92 Issue 3, p1216-1220, 5p

Synchronized beamline at FLASH2 based on high-order harmonic generation for two-color dynamics studies

Authors: Appi, E., Papadopoulou, C. C., Mapa, J. L., Jusko, C., Mosel, P., Schoenberg, A., Stock, J., Feigl, T., Ališauskas, S., Lang, T., Heyl, C. M., Manschwetus, B., Brachmanski, M., Braune, M., Lindenblatt, H., Trost, F., Meister, S., Schoch, P., Trabattoni, A., Calegari, F., Treusch, R., Moshammer, R., Hartl, I., Morgner, U., Kovacev, M.

Source: Review of scientific instruments. 92(12)

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100138305932.0x000001&indx=1&recIds=ETOCvdc_100138305932.0x000001

Nanoscale imaging using a compact laser plasma EUV source
International Congress on X-ray Optics and Microanalysis

Authors: Wachulak, P., Bartnik, A., Fiedorowicz, H., Kostecki, J., Jarocki, R., Szczurek, M., Szczurek, A., Feigl, T., Pina, L.

Source: AIP CONFERENCE PROCEEDINGS. 1437:79-84

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN083995705&indx=1&recIds=ETOCCN083995705

Coatings for Short Wavelengths
Society of Vacuum Coaters

Authors: Kaiser, N., Bernitzki, H., Bischoff, M., Feigl, T., Gabler, D., Tunnermann, A., Yulin, S., Zaczek, C.

Source: PROCEEDINGS OF THE ANNUAL TECHNICAL CONFERENCE- SOCIETY OF VACUUM COATERS. (51):463-468

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN071179938&indx=1&recIds=ETOCCN071179938

EUV multilayer optics
International conference on micro and nano engineering; MNE 2005

Authors: Feigl, T., Yulin, S., Benoit, N., Kaiser, N.

Source: MICROELECTRONIC ENGINEERING. 83(4/9):703-706

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN059627800&indx=1&recIds=ETOCCN059627800

High-temperature multilayers [5751-151]
Emerging lithographic technologies IX

Authors: Yulin, S., Benoit, N., Feigl, T., Kaiser, N.

Source: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 5751(NO 2):1155-1161

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN056134114&indx=1&recIds=ETOCCN056134114

New challenges for VUV-XUV radiation resistant coatings (Invited Paper) [5647-01]
Optical materials for high-power lasers; 36th annual Boulder damage symposium: Laser-induced damage in optical materials: 2004

Authors: Gatto, A., Heber, J., Yang, M., Benoit, N., Yulin, S. A., Feigl, T., Kaiser, N.

Source: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 5647:1-8

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN055551933&indx=1&recIds=ETOCCN055551933

EUV/soft x-ray multilayer optics [5645-39]
Advanced microlithography technologies

Authors: Yulin, S. A., Feigl, T., Benoit, N., Kaiser, N.

Source: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 5645:289-298

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN055447810&indx=1&recIds=ETOCCN055447810

Radiation stability of EUV Mo/Si multilayer mirrors
International conference on surface x-ray and neutron scattering

Authors: Benoit, N., Yulin, S., Feigl, T., Kaiser, N.

Source: PHYSICA B. 357(NO 1-2):222-226

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN054580792&indx=1&recIds=ETOCCN054580792

High-performance Cr/Sc multilayers for the soft x-ray range [5193-23]
Advances in mirror technology for x-ray, EUV lithography, laser and other applications

Authors: Yulin, S. A., Schafers, F., Feigl, T., Kaiser, N.

Source: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 5193:172-176

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN051972142&indx=1&recIds=ETOCCN051972142