-
1Academic Journal
Authors: Michalec, Sebastian1 (AUTHOR), Nieckarz, Wiktoria1,2 (AUTHOR), Klimek, Wiktoria1,3 (AUTHOR), Lange, Agata1 (AUTHOR), Matuszewski, Arkadiusz2 (AUTHOR), Piotrowska, Klara3 (AUTHOR), Hotowy, Anna1 (AUTHOR), Kunowska-Slósarz, Małgorzata3 (AUTHOR), Sosnowska, Malwina1 (AUTHOR) malwina_sosnowska@sggw.edu.pl
Source: Molecules. Apr2025, Vol. 30 Issue 7, p1521. 24p.
Subject Terms: *FOCUSED ion beams, *ERYTHROCYTES, *SILVER nanoparticles, *CHLORELLA vulgaris, *TRANSMISSION electron microscopy, *CHICKEN embryos
-
2Academic Journal
Authors: Rashid, Saqib1 (AUTHOR) saqib.rashid@uniroma3.it, Rossi, Edoardo1,2 (AUTHOR), Diplas, Spyros2,3 (AUTHOR), Carvalho, Patricia Almeida2,4 (AUTHOR), Pucicki, Damian1,3,4 (AUTHOR), Kuna, Rafal2,4 (AUTHOR), Sebastiani, Marco1,3 (AUTHOR)
Source: International Journal of Molecular Sciences. Apr2025, Vol. 26 Issue 7, p3296. 17p.
Subject Terms: *RESIDUAL stresses, *FOCUSED ion beams, *STRESS concentration, *STRAINS & stresses (Mechanics), *EPITAXY
-
3Academic Journal
Authors: Steigleder, Ana Paula1, Roldo, Liane2, lroldo@pfst.hr
Source: Coatings (2079-6412); Apr2025, Vol. 15 Issue 4, p419, 14p
-
4Academic Journal
Authors: Thoutam, Aravind Kumar1, Lamana, Murilo Sergio1,2, de Castilho, Bruno C. N. M.1,3, Ben Ettouil, Fadhel1, Chandrakar, Ritvij2, Bessette, Stephanie1,3, Brodusch, Nicolas2, Gauvin, Raynald2, Dolatabadi, Ali3, Moreau, Christian1, christian.moreau@concordia.ca
Source: Coatings (2079-6412); Mar2025, Vol. 15 Issue 3, p355, 19p
-
5Academic Journal
Authors: Lamana, Murilo Sergio1, Thoutam, Aravind Kumar1,2, de Castilho, Bruno C. N. M.1,3, Ben Ettouil, Fadhel1, Chandrakar, Ritvij2, Bessette, Stephanie2,3, Brodusch, Nicolas2, Gauvin, Raynald2, Dolatabadi, Ali3, Moreau, Christian1, christian.moreau@concordia.ca
Source: Coatings (2079-6412); Mar2025, Vol. 15 Issue 3, p357, 16p
-
6Academic Journal
Authors: DiBattista, Michael1 miked@varioscale.com, Chivas, Robert2, Yazdi, Ata Tafazoli1, Sheeder, Jonathan1, Silverman, Scott1
Source: Electronic Device Failure Analysis. Feb2025, Vol. 27 Issue 1, p3-7. 5p.
Subject Terms: *FOCUSED ion beams, *ION beams, *INTEGRATED circuits, *ARTIFICIAL intelligence, *REVERSE engineering, *CHEMICAL engineering, *ENGINEERS, *ION bombardment
-
7Academic Journal
Authors: Diop, Sokhna Awa Bousso1, sokhna.diop@mail.concordia.ca, Nastic, Aleksandra1,2, Dolatabadi, Ali2, Attarzadeh, Reza2, Moreau, Christian1
Source: Coatings (2079-6412); Feb2025, Vol. 15 Issue 2, p215, 24p
-
8Academic Journal
Authors: Fang, Chunpei1 (AUTHOR), Liu, Xin1 (AUTHOR), He, Lai1 (AUTHOR), Ma, Shuochen1 (AUTHOR), Wang, Jinpeng1 (AUTHOR), Hou, Xun2 (AUTHOR), Zhang, Jingwen1 (AUTHOR) jwzhang@xjtu.edu.cn
Source: Journal of Applied Physics. 1/14/2025, Vol. 137 Issue 2, p1-13. 13p.
Subject Terms: *FOCUSED ion beams, *STRAY currents, *TUNNEL design & construction, *PHOTOLITHOGRAPHY, *ANODES, *FIELD emission
-
9Academic Journal
Authors: Pašta, Ondřej1 (AUTHOR) marcin.kopec@cvrez.cz, Kopeć, Marcin1 (AUTHOR), Cvrček, Ladislav2 (AUTHOR), Krejčí, Jakub3 (AUTHOR), Halodová, Patricie1 (AUTHOR), Sihelská, Kristína1 (AUTHOR)
Source: Materials (1996-1944). Jan2025, Vol. 18 Issue 1, p143. 14p.
Subject Terms: *FOCUSED ion beams, *PROTECTIVE coatings, *NUCLEAR fuels, *SCANNING electron microscopy, *X-ray spectroscopy, *FRETTING corrosion
-
10Academic Journal
Authors: Zhang, Yan1 (AUTHOR), Chen, Zhaoqiang1,2,3 (AUTHOR) czq@qlu.edu.cn, Wu, Wendong1 (AUTHOR), Xu, Chonghai1,2,3 (AUTHOR)
Source: Scientific Reports. 12/28/2024, Vol. 14 Issue 1, p1-28. 28p.
Subject Terms: *FOCUSED ion beams, *MONTE Carlo method, *FINITE element method, *CONTACT angle, *SILICON crystals
-
11Academic Journal
Authors: Nanda, Laxmipriya1 (AUTHOR), Das, Bidyadhar1 (AUTHOR), Sahoo, Subhashree1 (AUTHOR), Sahoo, Pratap K.1 (AUTHOR), Senapati, Kartik1 (AUTHOR) kartik@niser.ac.in
Source: Journal of Applied Physics. 12/21/2024, Vol. 136 Issue 23, p1-9. 9p.
Subject Terms: *MAGNETIC impurities, *FOCUSED ion beams, *SUPERCONDUCTING circuits, *MAGNETORESISTANCE, *NANOWIRES, *OSCILLATIONS
-
12Academic Journal
Authors: Nanda, Laxmipriya1, Das, Bidyadhar1, Sahoo, Subhashree1, Sahoo, Pratap K.1, Senapati, Kartik1, kartik@niser.ac.in
Source: Journal of Applied Physics; 12/21/2024, Vol. 136 Issue 23, p1-9, 9p
-
13Academic Journal
Authors: Gupta, Yubraj1,2 (AUTHOR) ygupta@ua.pt, Heintzmann, Rainer2,3 (AUTHOR), Costa, Carlos1 (AUTHOR), Jesus, Rui4 (AUTHOR), Pinho, Eduardo4 (AUTHOR)
Source: PLoS ONE. 11/26/2024, Vol. 19 Issue 11, p1-34. 34p.
Subject Terms: *FOCUSED ion beams, *ADENOSINE triphosphate, *SCANNING electron microscopy, *ELECTRON beams, *NEURODEGENERATION
-
14Academic Journal
Authors: Yin, Daniel B.1,2 (AUTHOR) dbyin@umich.edu, Sun, Haiping3 (AUTHOR) haipings@umich.edu, Misra, Amit1,4 (AUTHOR) dbyin@umich.edu
Source: Materials (1996-1944). Nov2024, Vol. 17 Issue 21, p5144. 23p.
Subject Terms: *FOCUSED ion beams, *FINITE element method, *STRESS concentration, *FINITE geometries, *CONCENTRATION functions, *LASER deposition
-
15Academic Journal
Authors: Panjan, Peter1, aljaz.drnovsek@ijs.sipeter.panjan@ijs.si, Miletić, Aleksandar2, aleksandarvmiletic@gmail.com, Drnovšek, Aljaž1, miha.cekada@ijs.si, Terek, Pal2, palterek@uns.ac.rs, Čekada, Miha1, matjaz.panjan@ijs.si, Kovačević, Lazar2, lazarkov@uns.ac.rs, Panjan, Matjaž1
Source: Coatings (2079-6412); Nov2024, Vol. 14 Issue 11, p1452, 17p
-
16Academic Journal
Authors: Krawczynska, Agnieszka Teresa1 (AUTHOR) agnieszka.krawczynska@pw.edu.pl, Michalicha, Anna2 (AUTHOR), Suchecki, Przemyslaw1 (AUTHOR), Budniak, Karolina1 (AUTHOR), Roguska, Agata3 (AUTHOR), Kerber, Michael4 (AUTHOR), Setman, Daria4 (AUTHOR), Spychalski, Maciej1 (AUTHOR), Adamczyk-Cieslak, Boguslawa1 (AUTHOR), Liedke, Maciej Oskar5 (AUTHOR), Butterling, Maik5 (AUTHOR), Hirschmann, Eric5 (AUTHOR), Wagner, Andreas5 (AUTHOR), Lewandowska, Malgorzata1 (AUTHOR), Belcarz, Anna2 (AUTHOR)
Source: Scientific Reports. 10/19/2024, Vol. 14 Issue 1, p1-15. 15p.
Subject Terms: *SCANNING transmission electron microscopy, *FOCUSED ion beams, *CRYSTAL defects, *X-ray photoelectron spectroscopy, *SURFACE preparation
-
17Academic Journal
Authors: Gracia-Abad, Rubén1 (AUTHOR), Sangiao, Soraya1,2,3 (AUTHOR) sangiao@unizar.es, Balakrishnan, Geetha4 (AUTHOR), De Teresa, José María1,3 (AUTHOR) deteresa@unizar.es
Source: Scientific Reports. 10/16/2024, Vol. 14 Issue 1, p1-11. 11p.
Subject Terms: *TOPOLOGICAL insulators, *FOCUSED ion beams, *QUANTUM computing, *SUPERCONDUCTORS, *SUPERCONDUCTIVITY, *SUPERCONDUCTING quantum interference devices
-
18Academic Journal
Authors: Gomez-Hurtado, Lucia R.1,2 (AUTHOR) gyang9@ncsu.edu, Yao, Tiankai1 (AUTHOR) tiankai.yao@inl.gov, Teng, Fei1 (AUTHOR) fei.teng@inl.gov, Matos II, Mario D.1 (AUTHOR) mario.matos@inl.gov, Hawkins, Laura1 (AUTHOR) laura.hawkins@inl.gov, Yang, Ge2 (AUTHOR), Wang, Yachun1 (AUTHOR) yachun.wang@inl.gov
Source: Energies (19961073). Sep2024, Vol. 17 Issue 17, p4199. 13p.
Subject Terms: *FOCUSED ion beams, *INCONEL, *TENSILE strength, *TRANSMISSION electron microscopy, *ELECTRON diffraction
-
19Academic Journal
Authors: Yang, Huyi1 (AUTHOR) huygens2021@163.com, Fu, Ming1 (AUTHOR) fm7887077@163.com, Zhang, Xin1 (AUTHOR) 17828195929@163.com, Zhu, Kailin1 (AUTHOR) 13548003532@163.com, Cao, Lei2 (AUTHOR) cusery@my.swjtu.edu.cn, Hu, Chunfeng2 (AUTHOR) cusery@my.swjtu.edu.cn
Source: Materials (1996-1944). Sep2024, Vol. 17 Issue 17, p4238. 12p.
Subject Terms: *POLYCRYSTALLINE silicon, *FOCUSED ion beams, *BRITTLE fractures, *SILICON carbide, *SCANNING electron microscopy
-
20Academic Journal
Authors: Mahani, Fatemeh Fouladi1 (AUTHOR), Astorga, Luis Angel Mayoral2 (AUTHOR), Choi, Hyung Woo2 (AUTHOR), Mokhtari, Arash1 (AUTHOR) amokhtari@uk.ac.ir, Berini, Pierre2,3 (AUTHOR)
Source: Scientific Reports. 8/4/2024, Vol. 14 Issue 1, p1-9. 9p.
Subject Terms: *FOCUSED ion beams, *DESIGN exhibitions, *SURFACE structure, *PLASMONICS, *POLARITONS