Evaluation of the High-Frequency Transmission Characteristics of Coplanar Transmission Lines Fabricated on a Copper-Plated Cycloolefin Polymer Using a Direct Sputtering Copper Seed Layer

Authors: Shimizu, A., Fukada, K., Abe, M., Matsui, A., Endo, S.

Source: IEEE Access Access, IEEE. 13:34227-34237 2025

Diversifying Transmission Planning of Wind-Heavy Systems by Incorporating Dynamic Line Rating

Authors: Rajendran, S., Yogarathnam, A., Zhao, T., Endo, S., Aravinthan, V., Tamimi, A., Yokley, C.R., Yue, M.

Source: 2024 56th North American Power Symposium (NAPS) North American Power Symposium (NAPS), 2024 56th. :1-6 Oct, 2024

Relation: 2024 56th North American Power Symposium (NAPS)

Circular polarization measurement for individual gamma rays in capture reactions with intense pulsed neutrons

Authors: Endo, S., Abe, R., Fujioka, H., Ino, T., Iwamoto, O., Iwamoto, N., Kawamura, S., Kimura, A., Kitaguchi, M., Kobayashi, R., Nakamura, S., Okudaira, T. Oku T., Okuizumi, M., Omer, M., Rovira, G., Shima, T., Shimizu, H. M., Shizuma, T., Taira, Y., Takada, S., Takahashi, S., Yoshikawa, H., Yoshioka, T., Zen, H.

Subject Terms: Physics - Instrumentation and Detectors, Nuclear Experiment

Access URL: http://arxiv.org/abs/2406.15401

Adhesion Characteristics of Sputtered Cu Seed Layer on Cycloolefin Polymer

Authors: Shimizu, A., Fukada, K., Endo, S.

Source: 2024 International Conference on Electronics Packaging (ICEP) Electronics Packaging (ICEP), 2024 International Conference on. :125-126 Apr, 2024

Relation: 2024 International Conference on Electronics Packaging (ICEP)

Control of the Surface Modification of Epoxy Resin by VUV-Reduction and VUV-Redox Method using Vacuum Ultraviolet Light

Authors: Endo, S., Shimizu, A., Fukada, K.

Source: 2024 International Conference on Electronics Packaging (ICEP) Electronics Packaging (ICEP), 2024 International Conference on. :123-124 Apr, 2024

Relation: 2024 International Conference on Electronics Packaging (ICEP)

Transverse asymmetry of individual $\gamma$-rays in the $^{139}$La($\vec{n}$, $\gamma$)$^{140}$La reaction

Authors: Okuizumi, M., Auton, C. J., Endo, S., Fujioka, H., Hirota, K., Ino, T., Ishizaki, K., Kimura, A., Kitaguchi, M., Koga, J., Makise, S., Niinomi, Y., Oku, T., Okudaira, T., Sakai, K., Shima, T., Shimizu, H. M., Tada, H., Takada, S., Takahashi, S., Tani, Y., Yamamoto, T., Yoshikawa, H., Yoshioka, T.

Subject Terms: Nuclear Experiment

Access URL: http://arxiv.org/abs/2402.18876

High sensitivity of a future search for P-odd/T-odd interactions on the 0.75 eV $p$-wave resonance in $\vec{n}+^{139}\vec{\rm La}$ forward transmission determined using pulsed neutron beam

Authors: Nakabe, R., Auton, C. J., Endo, S., Fujioka, H., Gudkov, V., Hirota, K., Ide, I., Ino, T., Ishikado, M., Kambara, W., Kawamura, S., Kimura, A., Kitaguchi, M., Kobayashi, R., Okamura, T., Oku, T., Okudaira, T., Okuizumi, M., Munoz, J. G. Otero, Parker, J. D., Sakai, K., Shima, T., Shimizu, H. M., Shinohara, T., Snow, W. M., Takada, S., Takahashi, R., Takahashi, S., Tsuchikawa, Y., Yoshioka, T.

Subject Terms: Nuclear Experiment, High Energy Physics - Experiment

Access URL: http://arxiv.org/abs/2312.06115

Hybrid Robotic and Electrical Stimulation Assistance Can Enhance Performance and Reduce Mental Demand

Authors: Cazenave, L., Einenkel, M., Yurkewich, A., Endo, S., Hirche, S., Burdet, E.

Source: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 31:4063-4072 2023

Cut-Out Scenario Generation With Reasonability Foreseeable Parameter Range From Real Highway Dataset for Autonomous Vehicle Assessment

Authors: Muslim, H., Endo, S., Imanaga, H., Kitajima, S., Uchida, N., Kitahara, E., Ozawa, K., Sato, H., Nakamura, H.

Source: IEEE Access Access, IEEE. 11:45349-45363 2023

Spin dependence in the $p$-wave resonance of ${^{139}\vec{\rm{La}}+\vec{n}}$

Authors: Okudaira, T., Nakabe, R., Endo, S., Fujioka, H., Gudkov, V., Ide, I., Ino, T., Ishikado, M., Kambara, W., Kawamura, S., Kobayashi, R., Kitaguchi, M., Okamura, T., Oku, T., Munoz, J. G. Otero, Parker, J. D., Sakai, K., Shima, T., Shimizu, H. M., Shinohara, T., Snow, W. M., Takada, S., Tsuchikawa, Y., Takahashi, R., Takahashi, S., Yoshikawa, H., Yoshioka, T.

Subject Terms: Nuclear Experiment

Access URL: http://arxiv.org/abs/2309.08905

A back-illuminated 6 μm SPAD depth sensor with PDE 36.5% at 940 nm via combination of dual diffraction structure and 2×2 on-chip lens

Authors: Fujisaki, Y., Tsugawa, H., Sakai, K., Kumagai, H., Nakamura, R., Ogita, T., Endo, S., Iwase, T., Takase, H., Yokochi, K., Yoshida, S., Shimada, S., Otake, Y., Wakano, T., Hiyama, H., Hagiwara, K., Arakawal, M., Matsumotol, S., Maeda, H., Sugihara, K., Takabayashi, K., Ono, M., Ishibashi, K., Yamamoto, K.

Source: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

Study of the Behavior of the Functional Group on the Direct Copper Sputtered Interface using Vacuum Ultraviolet Light

Authors: Endo, S., Shimizu, A., Ueyama, H., Fukada, K., Kashiwagi, Y.

Source: 2023 International Conference on Electronics Packaging (ICEP) Electronics Packaging (ICEP), 2023 International Conference on. :111-112 Apr, 2023

Relation: 2023 International Conference on Electronics Packaging (ICEP)

Angular distribution of $\gamma$-rays from a neutron-induced $p$-wave resonance of $^{132}$Xe

Authors: Okudaira, T., Tani, Y., Endo, S., Doskow, J., Fujioka, H., Hirota, K., Kameda, K., Kimura, A., Kitaguchi, M., Luxnat, M., Sakai, K., Schaper, D., Shima, T., Shimizu, H. M., Snow, W. M., Takada, S., Yamamoto, T., Yoshikawa, H., Yoshioka, T.

Subject Terms: Nuclear Experiment

Access URL: http://arxiv.org/abs/2212.10889

Measurement of the transverse asymmetry of $\gamma$-rays in the $^{117}$Sn(n,$\gamma$)$^{118}$Sn reaction

Authors: Endo, S., Okudaira, T., Abe, R., Fujioka, H., Hirota, K., Kimura, A., Kitaguchi, M., Oku, T., Sakai, K., Shima, T., Shimizu, H. M., Takada, S., Takahashi, S., Yamamoto, T., Yoshikawa, H., Yoshioka, T.

Subject Terms: Nuclear Experiment

Access URL: http://arxiv.org/abs/2210.15807

Analysis of the Trends Between Indoor Carbon Dioxide Concentration and Plug-Level Electricity Usage Through Topological Data Analysis

Authors: Endo, S., Yokogawa, S.

Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 22(2):1424-1434 Jan, 2022

Consideration of Improved Adhesion of Direct Copper Seed Layer by Medium-Vacuum Sputtering Using Vacuum Ultraviolet Light
10th Processes at the semiconductor solution interface symposium

Authors: Endo, S., Shimizu, A., Ueyama, H., Fukada, K., Kashiwagi, Y., Takamatsu, H., Hashimoto, K., Takahashi, R.

Source: ECS transactions. 111(2):27-34

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN608358102&indx=1&recIds=ETOCCN608358102

Angular distribution of $\gamma$ rays from the p-wave resonance of $^{118}$Sn

Authors: Koga, J., Takada, S., Endo, S., Fujioka, H., Hirota, K., Ishizaki, K., Kimura, A., Kitaguchi, M., Niinomi, Y., Okudaira, T., Sakai, K., Shima, T., Shimizu, H. M., Tani, Y., Yamamoto, T., Yoshikawa, H., Yoshioka, T.

Subject Terms: Nuclear Experiment

Access URL: http://arxiv.org/abs/2202.06222

A SPAD Depth Sensor Robust Against Ambient Light: The Importance of Pixel Scaling and Demonstration of a 2.5μm Pixel with 21.8% PDE at 940nm

Authors: Shimada, S., Otake, Y., Yoshida, S., Jibiki, Y., Fujii, M., Endo, S., Nakamura, R., Tsugawa, H., Fujisaki, Y., Yokochi, K., Iwase, J., Takabayashi, K., Maeda, H., Sugihara, K., Yamamoto, K., Ono, M., Ishibashi, K., Matsumoto, S., Hiyama, H., Wakano, T.

Source: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :37.3.1-37.3.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

Advanced Tape Expansion/Assembly Technology for FOWLP and Micro-LED Display

Authors: Fukushima, T., Yonekura, H., Doi, F., Endo, S., Fushimi, T., Yanagimura, K., Koyanagi, M., Tanaka, T., Motoyoshi, M.

Source: 2018 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2018 13th International. :210-213 Oct, 2018

Relation: 2018 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)

Energy dependent angular distribution of individual $\gamma$-rays in the $^{139}$La($n$, $\gamma$)$^{140}$La* reaction

Authors: Okudaira, T., Endo, S., Fujioka, H., Hirota, K., Ishizaki, K., Kimura, A., Kitaguchi, M., Koga, J., Niinomi, Y., Sakai, K., Shima, T., Shimizu, H. M., Takada, S., Tani, Y., Yamamoto, T., Yoshikawa, H., Yoshioka, T.

Source: Phys. Rev. C 104, 014601 (2021)

Subject Terms: Nuclear Experiment

Access URL: http://arxiv.org/abs/2101.00262