Transient Photocurrent From High-Voltage Vertical GaN Diodes Irradiated With Electrons: Experiments and Simulations

Authors: Koukourinkova, S. D., Colon, A., Doyle, B. L., Vizkelethy, G., Pickrell, G. W., Gunning, B. P., Kropka, K. E., Bielejec, E. S., Wampler, W. R.

Source: IEEE transactions on nuclear science. 70(4):469-477

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Radiation-induced resistance changes in TaOx and TiO2 memristors

Authors: Hughart, D. R., Lohn, A. J., Mickel, P. R., Dodd, P. E., Shaneyfelt, M. R., Silva, A. I., Bielejec, E., Vizkelethy, G., Doyle, B. L., Marshall, M. T., McLain, M. L., Marinella, M. J., Dalton, S. M.

Source: 2014 IEEE Aerospace Conference Aerospace Conference, 2014 IEEE. :1-11 Mar, 2014

Relation: 2014 IEEE Aerospace Conference

Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions

Authors: Auden, E. C., Pacheco, J. L., Bielejec, E., Vizkelethy, G., Abraham, J. B. S., Doyle, B. L.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 62(6):2919-2925 Dec, 2015

Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam

Authors: Dodds, N. A., Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E., Doyle, B. L., Trinczek, M., Blackmore, E. W., Rodbell, K. P., Gordon, M. S., Reed, R. A., Pellish, J. A., LaBel, K. A., Marshall, P. W., Swanson, S. E., Vizkelethy, G., Van Deusen, S., Sexton, F. W., Martinez, M. J.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 61(6):2904-2914 Dec, 2014

Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in ${\rm TaO}_{\rm x}$ Memristors

Authors: Hughart, D. R., Pacheco, J. L., Lohn, A. J., Mickel, P. R., Bielejec, E., Vizkelethy, G., Doyle, B. L., Wolfley, S. L., Dodd, P. E., Shaneyfelt, M. R., McLain, M. L., Marinella, M. J.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 61(6):2965-2971 Dec, 2014

Damage Equivalence of Heavy Ions in Silicon Bipolar Junction Transistors

Authors: Bielejec, E., Vizkelethy, G., Kolb, N. R., King, D. B., Doyle, B. L.

Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 53(6):3681-3686 Dec, 2006

X-ray-diffraction characterization of silicon-on-insulator films.

Authors: Thompson, L. R., Collins, G. J., Doyle, B. L.

Source: Journal of Applied Physics; November 1 1991, Vol. 70, p4760-4769, 10p

Characterization of ion-implantation doping of strained-layer superlattices. Structural properties.

Authors: Myers, D. R., Picraux, S. T., 1943-, Doyle, B. L.

Source: Journal of Applied Physics; November 15 1986, Vol. 60, p3631-3640, 10p

Au diffusion in amorphous and polycrystalline Ni0.55Nb0,45.

Authors: Doyle, B. L.

Source: Journal of Applied Physics; September 1982, Vol. 53, p6186-6190, 5p

Ion-luminescence properties of GaN films being developed for IPEM
International conference on ion beam analysis(IBA 2007)

Authors: Rossi, P., Doyle, B. L., Vizkelethy, G., McDaniel, F. D., Knapp, J., Jauregui, H., Villone, J.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 266(NO 8):1294-1299

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Particulate characterization by PIXE multivariate spectral analysis
International conference on the applications of accelerators in research and industry; CAARI 2006

Authors: Antolak, A. J., Morse, D. H., Grant, P. G., Kotula, P. G., Doyle, B. L., Richardson, C. B.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 261(NO 1-2):470-474

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Photofission in uranium by nuclear reaction gamma-rays
International conference on the applications of accelerators in research and industry; CAARI 2006

Authors: Morse, D. H., Antolak, A. J., Doyle, B. L.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 261(NO 1-2):378-381

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PIXE-quantified AXSIA: Elemental mapping by multivariate spectral analysis
Ion beam analysis; IBA2005

Authors: Doyle, B. L., Provencio, P. P., Kotula, P. G., Antolak, A. J., Ryan, C. G., Campbell, J. L., Barrett, K.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 249(1/2):828-832

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Performance of an alpha-IPEM
Ion beam analysis; IBA2005

Authors: Rossi, P., Doyle, B. L., Auzelyte, V., McDaniel, F. D., Mellon, M.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 249(1/2):242-245

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Heavy ion beam induced current/charge (IBIC) through insulating oxides
Ion beam analysis; IBA2005

Authors: Vizkelethy, G., Brice, D. K., Doyle, B. L.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 249(1/2):204-208

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Cross sections for 165degree backscattering of 8.0-11.7MeV a from carbon
Ion beam analysis; IBA2005

Authors: Banks, J. C., Wampler, W. R., Browning, J. F., Doyle, B. L.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 249(1/2):101-104

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Fabrication of phosphor micro-grids using proton beam lithography
Proceedings of the 14th international conference on ion beam modification of materials

Authors: Auzelyte, V., Elfman, M., Kristiansson, P., Pallon, J., Wegdén, M., Nilsson, C., Malmqvist, K., Doyle, B. L., Rossi, P., Hearne, S. J.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 242(1-2):253-256

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An annular Si drift detector muPIXE system using AXSIA analysis
Particle-induced x-ray emission and its analytical applications; PIXE 2004

Authors: Doyle, B. L., Walsh, D. S., Kotula, P. G., Rossi, P., Schulein, T., Rohde, M.

Source: X-RAY SPECTROMETRY. 34(4):279-284

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Radiation effects microscopy for failure analysis of microelectronic devices
Nuclear microprobe technology and applications

Authors: Vizkelethy, G., Doyle, B. L., Brice, D. K., Dodd, P. E., Shaneyfelt, M. R., Schwank, J. R.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 231(NO 1):467-475

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Parameterization of ion channeling half-angles and minimum yields

Authors: Doyle, B. L.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 371:63-68

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