-
1Conference
Authors: Hui, Yuanfei, Cui, Zhiwei, Zhao, Sihan, Li, Tie, Li, Gang, He, Haijun
Source: 2024 14th International Symposium on Antennas, Propagation and EM Theory (ISAPE) Antennas, Propagation and EM Theory (ISAPE), 2024 14th International Symposium on. :1-4 Oct, 2024
Relation: 2024 14th International Symposium on Antennas, Propagation and EM Theory (ISAPE)
-
2Conference
Authors: Ghaffari, Amir Hosein, Zandi, Hesam
Source: 2022 6th International Conference on Millimeter-Wave and Terahertz Technologies (MMWaTT) Millimeter-Wave and Terahertz Technologies (MMWaTT), 2022 6th International Conference on. :1-5 Dec, 2022
Relation: 2022 6th International Conference on Millimeter-Wave and Terahertz Technologies (MMWaTT)
-
3Conference
Authors: Tamersit, Khalil, Boualleg, Abdelhalim, Bourouba, Hocine
Source: 2022 IEEE Workshop on Complexity in Engineering (COMPENG) Complexity in Engineering (COMPENG), 2022 IEEE Workshop on. :1-5 Jul, 2022
Relation: 2022 IEEE Workshop on Complexity in Engineering (COMPENG)
-
4Conference
Authors: Chandrasekar, L, Pradhan, K P
Source: 2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC) Nanotechnology Materials and Devices Conference (NMDC), 2021 IEEE 16th. :1-4 Dec, 2021
Relation: 2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC)
-
5Academic Journal
Authors: T., Aiswarya, Vaitheeswaran, G. ⁎
Source: In Computational Materials Science 20 February 2025 250
-
6Conference
Authors: Chandrasekar, L, Pradhan, K P
Source: 2020 5th IEEE International Conference on Emerging Electronics (ICEE) Emerging Electronics (ICEE), 2020 5th IEEE International Conference on. :1-4 Nov, 2020
Relation: 2020 5th IEEE International Conference on Emerging Electronics (ICEE)
-
7Academic Journal
Authors: Song, Yuxuan a, Zhang, Zixuan a, Guan, Lixiu a, Liu, Xiaobiao b, Li, Linyang a, ⁎
Source: In Computational Materials Science May 2025 253
-
8Conference
Authors: Chandrasekar, L, Pradhan, K P
Source: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020
Relation: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
-
9Conference
Authors: Wang, Yan, Lan, Yu, Wu, Yunqiu, Xu, Yuehang
Source: 2019 IEEE Asia-Pacific Microwave Conference (APMC) Asia-Pacific Microwave Conference (APMC), 2019 IEEE. :372-374 Dec, 2019
Relation: 2019 IEEE Asia-Pacific Microwave Conference (APMC)
-
10Conference
Authors: Yi, Jong Chang, Kim, Young June, Kim, Yi Young, Lee, Seok, Woo, Deok Ha, Kim, Chulki
Source: TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON) Region 10 Conference, TENCON, 2019 - 2019 IEEE. :2051-2053 Oct, 2019
Relation: TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)
-
11Conference
Transfer characteristics of graphene based field effect transistor (GFET) for biosensing application
Source: 2017 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) Micro and Nanoelectronics (RSM), 2017 IEEE Regional Symposium on. :88-91 Aug, 2017
Relation: 2017 IEEE Regional Symposium on Micro and Nanoelectronics (RSM)
-
12Academic Journal
Authors: Qi Han, Yadong Jiang, Xianchao Liu, Chaoyi Zhang, Jun Wang
Source: Frontiers of Optoelectronics, Vol 16, Iss 1, Pp 1-9 (2023)
Subject Terms: Black phosphorus quantum dots, Dirac point, Photoconduction, Adsoprtion, Applied optics. Photonics, TA1501-1820
File Description: electronic resource
Relation: https://doaj.org/toc/2095-2767
-
13Academic Journal
Source: J, Vol 6, Iss 1, Pp 152-163 (2023)
Subject Terms: Dirac point, topological insulator, topological crystalline insulator, first-principles, band structure, phonon modes, Science
File Description: electronic resource
-
14Academic Journal
Authors: Shiu-Ming Huang, Pin-Cing Wang, Kuo-Yi Hung, Fu-En Cheng, Chang-Yu Li, Mitch Chou
Source: Nanoscale Research Letters, Vol 17, Iss 1, Pp 1-6 (2022)
Subject Terms: Paramagnetic susceptibility peak, Topological material, Dirac point, Lattice distortion, Materials of engineering and construction. Mechanics of materials, TA401-492
File Description: electronic resource
Relation: https://doaj.org/toc/1556-276X
-
15Conference
Authors: Jing, Li, Wensheng, Wei, Yuxing, Dai
Source: 2012 Third International Conference on Digital Manufacturing & Automation Digital Manufacturing and Automation (ICDMA), 2012 Third International Conference on. :763-766 Jul, 2012
Relation: 2012 Third International Conference on Digital Manufacturing and Automation (ICDMA)
-
16Conference
Authors: Alarcon, A., Nguyen, V. Hung, Berrada, S., Querlioz, D., Saint-Martin, J., Bournel, A., Dollfus, P.
Source: 2012 15th International Workshop on Computational Electronics Computational Electronics (IWCE), 2012 15th International Workshop on. :1-4 May, 2012
Relation: 2012 15th International Workshop on Computational Electronics (IWCE)
-
17Conference
Source: 2017 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) Numerical Simulation of Optoelectronic Devices (NUSOD), 2017 International Conference on. :11-12 Jul, 2017
Relation: 2017 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
-
18Conference
Source: 2011 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on. :1104-1107 Feb, 2011
Relation: 2011 IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
-
19Academic Journal
Authors: Shiu-Ming Huang, Pin-Cing Wang, Pin-Cyuan Chen, Jai-Long Hong, Cheng-Maw Cheng, Hao-Lun Jian, You-Jhih Yan, Shih-Hsun Yu, Mitch M. C. Chou
Source: Nanoscale Research Letters, Vol 17, Iss 1, Pp 1-6 (2022)
Subject Terms: Paramagnetic susceptibility peak, Topological material, Dirac point, Surface state, Materials of engineering and construction. Mechanics of materials, TA401-492
File Description: electronic resource
Relation: https://doaj.org/toc/1556-276X
-
20Conference
Authors: Zhang, Qingwei, Li, Ping, Wang, Gang, Zeng, Rongzhou, Hu, Rongyan
Source: 2016 IEEE International Nanoelectronics Conference (INEC) Nanoelectronics Conference (INEC), 2016 IEEE International. :1-2 May, 2016
Relation: 2016 IEEE International Nanoelectronics Conference (INEC)