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1Academic Journal
Authors: Kokandakar, Ajinkya H., Lin, Yuzhou, Jin, Steven, Weiss, Jordan, Rabinowitz, Amanda R., May, Reuben A. Buford, Small, Dylan, Deshpande, Sameer K.
Source: Observational Studies. 10(1):11-35
Availability: https://muse.jhu.edu/article/929115
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2Academic Journal
Source: Observational Studies. 9(3):29-41
Availability: https://muse.jhu.edu/article/895651
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3
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4Report
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5Report
Authors: Brill, Ryan S., Yee, Ryan, Deshpande, Sameer K., Wyner, Abraham J.
Subject Terms: Statistics - Applications
Access URL: http://arxiv.org/abs/2409.04889
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6Conference
Authors: Thareja, Gaurav, Pal, Ashish, Ma, Quan, Ching, Chi, Patel, Sahil, Gao, Xingyao, Dag, Sefa, Qi, Zhimin, Zhang, Aixi, Yue, Shiyu, Lei, Wei, Xu, Yi, Lei, Yu, Jiang, Hao, You, Shi, Zheng, Wenkai, Hung, Raymond, Costrini, Gregory, Zhu, Qing, Tran, Randy, Gupta, Rohit, Reddy, Vinod, Vyas, Pratik B., Hassan, Sajjad, Cai, Man Ping, Shen, Gang, Chen, Zhebo, Hou, Wenting, Lei, Jianxin, Wang, Rongjun, Shen, Walters, Deshpande, Sameer, Huey, Sidney, Tang, Jianshe, Naik, Mehul, Kesapragada, Sree, Ayyagari-Sangamali, Buvna, Bazizi, El Mehdi, Tang, Xianmin
Source: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Relation: 2023 International Electron Devices Meeting (IEDM)
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7Report
Authors: Fisher, Jared D., Puelz, David W., Deshpande, Sameer K.
Access URL: http://arxiv.org/abs/2408.07765
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8Report
Authors: Kokandakar, Ajinkya H., Lin, Yuzhou, Jin, Steven, Weiss, Jordan, Rabinowitz, Amanda R., May, Reuben A. Buford, Small, Dylan, Deshpande, Sameer K.
Subject Terms: Statistics - Applications
Access URL: http://arxiv.org/abs/2405.03538
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9Report
Authors: Alexandr, Yulia, Bakenhus, Miles, Curiel, Mark, Deshpande, Sameer K., Gross, Elizabeth, Gu, Yuqi, Hill, Max, Johnson, Joseph, Kagy, Bryson, Karwa, Vishesh, Li, Jiayi, Lyu, Hanbaek, Petrović, Sonja, Rodriguez, Jose Israel
Source: Alg. Stat. 15 (2024) 357-382
Subject Terms: Mathematics - Statistics Theory, 62R01
Access URL: http://arxiv.org/abs/2402.13961
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10Conference
Authors: Palmieri, Andrea, Tavakoli, Mahdi, Ching, Chi, Zheng, Wenkai, You, Shi, Zhang, Xiaodong, Cornigli, Davide, Haverty, Michael, Singh, Navneet, Larcher, Luca, Jamieson, Monika, Bhatnagar, Ajay, Jansen, Alexander, Gage, Max, Tang, Jianshe, Deshpande, Sameer, Brown, Brian, Srivatsa, Arun, Naik, Mehul, Xie, Bo, Gelatos, Jerry, Lee, Joung Joo, Tang, Xianmin, Thareja, Gaurav, Pesic, Milan
Source: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :10A.3-1-10A.3-6 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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11
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12Conference
BEOL Interconnect Innovation: Materials, Process and Systems Co-optimization for 3nm Node and Beyond
Authors: Thareja, Gaurav, Pal, Ashish, Wang, Xingye, Dag, Sefa, You, Shi, Sharma, Shashank, Zhu, Qing, Cervantes, Carmen L., Hwang, Shinjae, Spuller, Matthew, Ng, Ben, Kumar, Pradeep S., Tam, Norman, Gage, Max, Deshpande, Sameer, Wu, Zhiyuan, Jansen, Alexander, Dey, Liton, Chen, Feng, Xie, Xianjin, Kashefizadeh, Keyvan, Reddy, Vinod, Lo, Andy, Chen, Zhebo, Huey, Sidney, Tang, Jianshe, Ren, He, Naik, Mehul, Brown, Brian, Kesapragada, Sree, Sangamali, Buvna Ayyagari, Bazizi, El Mehdi, Tang, Xianmin
Source: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
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13Academic Journal
Authors: Liyanaarachchi, Gajendra1 (AUTHOR), Deshpande, Sameer1 (AUTHOR) s.deshpande@griffith.edu.au, Weaven, Scott2 (AUTHOR), Sangroya, Deepak3 (AUTHOR), Jebarajakirthy, Charles2 (AUTHOR), Bodle, Kerry4 (AUTHOR), Roemer, Carina1 (AUTHOR)
Source: Journal of Strategic Marketing. May2025, Vol. 33 Issue 3, p271-295. 25p.
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14Academic Journal
Authors: Braithwaite, Felicity A. a, b, ⁎, 1, Deshpande, Sameer c, Buchbinder, Rachelle d, Dennett, Liz e, St. Jean, Craig Richard f, Krebs, Brandon g, Gross, Douglas P. h
Source: In The Journal of Pain March 2025 28
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15Conference
Authors: Najdovski, Zoran, Deshpande, Sameer, Wei, Lei, Salaken, Syed Moshfeq, Mohajer, Navid, Nahavandi, Saeid, Bello, Fernando
Source: 2020 IEEE International Systems Conference (SysCon) Systems Conference (SysCon), 2020 IEEE International. :1-8 Aug, 2020
Relation: 2020 IEEE International Systems Conference (SysCon)
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16Report
Subject Terms: Statistics - Machine Learning, Computer Science - Machine Learning, Statistics - Other Statistics
Access URL: http://arxiv.org/abs/2212.00219
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17
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18Report
Authors: Kokandakar, Ajinkya H, Lin, Yuzhou, Jin, Steven, Weiss, Jordan, Rabinowitz, Amanda R, May, Reuben A Buford, Small, Dylan, Deshpande, Sameer K
Subject Terms: Statistics - Applications
Access URL: http://arxiv.org/abs/2211.02104
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19Report
Source: Observational Studies 9(3), 29-41 (2023). https://www.muse.jhu.edu/article/895651
Subject Terms: Statistics - Applications
Access URL: http://arxiv.org/abs/2211.02020
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