Showing 1 - 20 results of 1,130 Refine Results
  1. 1
    Conference

    Source: 2022 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) ICSTW Software Testing, Verification and Validation Workshops (ICSTW), 2022 IEEE International Conference on. :102-109 Apr, 2022

    Relation: 2022 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

  2. 2
    Conference

    Source: 2022 IEEE/SICE International Symposium on System Integration (SII) System Integration (SII), 2022 IEEE/SICE International Symposium on. :329-335 Jan, 2022

    Relation: 2022 IEEE/SICE International Symposium on System Integration (SII)

  3. 3
    Conference

    Source: 2021 4th International Conference on Artificial Intelligence for Industries (AI4I) AI4I Artificial Intelligence for Industries (AI4I), 2021 4th International Conference on. :34-37 Sep, 2021

    Relation: 2021 4th International Conference on Artificial Intelligence for Industries (AI4I)

  4. 4
    Conference

    Source: 2020 IEEE/ACM Innovating the Network for Data-Intensive Science (INDIS) INDIS Innovating the Network for Data-Intensive Science (INDIS), 2020 IEEE/ACM. :45-56 Nov, 2020

    Relation: 2020 IEEE/ACM Innovating the Network for Data-Intensive Science (INDIS)

  5. 5
    Conference

    Source: 2020 IEEE Aerospace Conference Aerospace Conference, 2020 IEEE. :1-10 Mar, 2020

    Relation: 2020 IEEE Aerospace Conference

  6. 6
    Conference

    Source: 2020 IEEE Aerospace Conference Aerospace Conference, 2020 IEEE. :1-11 Mar, 2020

    Relation: 2020 IEEE Aerospace Conference

  7. 7
  8. 8
    Academic Journal

    Authors: Cheuk, Tina (ORCID 0000-0001-7841-2492), Morales-Doyle, Daniel (ORCID 0000-0002-9425-2158)

    Source: Science Education. Sep 2022 106(5):1198-1213.

    Peer Reviewed: Y

    Page Count: 16

    HTML Full Text     PDF Full Text
  9. 9
  10. 10
  11. 11
  12. 12
    Conference

    Source: 2016 IEEE/ACM 1st International Workshop on Variability and Complexity in Software Design (VACE) VACE Variability and Complexity in Software Design (VACE), IEEE/ACM International Workshop on. :5-11 May, 2016

    Relation: 2016 IEEE/ACM 1st International Workshop on Variability and Complexity in Software Design (VACE)

  13. 13
  14. 14
  15. 15
  16. 16
  17. 17
    Conference

    Source: 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International. :866-871 May, 2013

    Relation: 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

  18. 18
  19. 19
  20. 20