Reinforcement Learning Based Train Rescheduling on Event Graphs

Authors: Gorsane, Rihab, Mestiri, Khalil Gorsan, Martinez, Daniel Tapia, Coyette, Vincent, Makhlouf, Beyrem, Vienken, Gereon, Truong, Minh Tri, Sohlke, Andreas, Hartleb, Johann, Kerkeni, Amine, Sturm, Irene, Kupper, Michael

Source: 2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC) Intelligent Transportation Systems (ITSC), 2023 IEEE 26th International Conference on. :874-879 Sep, 2023

Relation: 2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC)

Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers

Authors: Xama, N., Gomez, J., Dobbelaere, W., Vanhooren, R., Coyette, A., Gielen, G.

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(10):3426-3435 Oct, 2023

High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis

Authors: Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges

Source: 2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-4 May, 2023

Relation: 2023 IEEE European Test Symposium (ETS)

Multimodal CLIP Inference for Meta-Few-Shot Image Classification

Authors: Ferragu, Constance, Chagniot, Philomene, Coyette, Vincent

Subject Terms: Computer Science - Computer Vision and Pattern Recognition

Access URL: http://arxiv.org/abs/2405.10954

Recent Trends and Perspectives on Defect-Oriented Testing

Authors: Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Reorda, M.S., Ullmann, R., Vanhooren, R., Xama, N., Wu, L.

Source: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-10 Sep, 2022

Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)

DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value

Authors: Gomez, J., Xama, N., Coyette, A., Vanhooren, R., Dobbelaere, W., Gielen, G.

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 41(11):4771-4781 Nov, 2022

Jumanji: a Diverse Suite of Scalable Reinforcement Learning Environments in JAX

Authors: Bonnet, Clément, Luo, Daniel, Byrne, Donal, Surana, Shikha, Abramowitz, Sasha, Duckworth, Paul, Coyette, Vincent, Midgley, Laurence I., Tegegn, Elshadai, Kalloniatis, Tristan, Mahjoub, Omayma, Macfarlane, Matthew, Smit, Andries P., Grinsztajn, Nathan, Boige, Raphael, Waters, Cemlyn N., Mimouni, Mohamed A., Sob, Ulrich A. Mbou, de Kock, Ruan, Singh, Siddarth, Furelos-Blanco, Daniel, Le, Victor, Pretorius, Arnu, Laterre, Alexandre

Subject Terms: Computer Science - Machine Learning, Computer Science - Artificial Intelligence

Access URL: http://arxiv.org/abs/2306.09884

Experimental Validation of a Compact Pinhole Latent Defect Model for MOS Transistors

Authors: Gomez, J., Xama, N., Lootens, D., Coyette, A., Vanhooren, R., Dobbelaere, W., Gielen, G.

Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(9):4796-4802 Sep, 2022

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs

Authors: Sunter, Stephen, Wolinski, Michal, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Xama, Nektar, Gomez, Jhon, Gielen, Georges

Source: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020

Relation: 2020 IEEE International Test Conference (ITC)

Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing

Authors: Coyette, Anthony, Dobbelaere, Wim, Vanhooren, Ronny, Xama, Nektar, Gomez, Jhon, Gielen, Georges

Source: 2020 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2020 IEEE. :1-6 May, 2020

Relation: 2020 IEEE European Test Symposium (ETS)

Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics

Authors: Xama, Nektar, Raymaekers, Jakob, Andraud, Martin, Gomez, Jhon, Dobbelaere, Wim, Vanhooren, Ronny, Coyette, Anthony, Gielen, Georges

Source: 2020 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2020 IEEE. :1-6 May, 2020

Relation: 2020 IEEE European Test Symposium (ETS)

Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing

Authors: Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges

Source: 2020 IEEE 38th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2020 IEEE 38th. :1-6 Apr, 2020

Relation: 2020 IEEE 38th VLSI Test Symposium (VTS)

Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs

Authors: Dobbelaere, Wim, Colle, Frederik, Coyette, Anthony, Vanhooren, Ronny, Xama, Nektar, Gomez, Jhon, Gielen, Georges

Source: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-4 Nov, 2019

Relation: 2019 IEEE International Test Conference (ITC)

Pyoderma gangrenosum with severe systemic features, after augmentation mammoplasty

Authors: Marine Beeckman, Caroline Peeters, Maude Coyette, Liliane Marot, Halil Yildiz, Benoit Lengele, Marie Baeck

Source: JEADV Clinical Practice, Vol 3, Iss 1, Pp 271-274 (2024)

Subject Terms: augmentation mammoplasty, breast surgery, pathergy, postoperative pyoderma gangrenosum, postsurgical pyoderma gangrenosum, pyoderma gangrenosum, Dermatology, RL1-803, Diseases of the genitourinary system. Urology, RC870-923

File Description: electronic resource

Relation: https://doaj.org/toc/2768-6566

Access URL: https://doaj.org/article/a028b945b0494ee79844791aba209e32

Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems

Authors: Gielen, Georges, Esen, Baris, Dobbelaer, Wim, Vanhooren, Ronny, Coyette, Anthony, Xama, Nektar

Source: 2018 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2018 IEEE International Symposium on. :1-4 May, 2018

Relation: 2018 IEEE International Symposium on Circuits and Systems (ISCAS)

Non-intrusive detection of defects in mixed-signal integrated circuits using light activation

Authors: Esen, Baris, Coyette, Anthony, Xama, Nektar, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges

Source: 2017 IEEE International Test Conference (ITC) Test Conference (ITC), 2017 IEEE International. :1-7 Oct, 2017

Relation: 2017 IEEE International Test Conference (ITC)

Automatic testing of analog ICs for latent defects using topology modification

Authors: Xama, Nektar, Coyette, Anthony, Esen, Baris, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges

Source: 2017 22nd IEEE European Test Symposium (ETS) Test Symposium (ETS), 2017 22nd IEEE. :1-6 May, 2017

Relation: 2017 22nd IEEE European Test Symposium (ETS)

Reconstruction of the human nipple–areolar complex: a tissue engineering approach

Authors: Louis Maistriaux, Vincent Foulon, Lies Fievé, Daela Xhema, Robin Evrard, Julie Manon, Maude Coyette, Caroline Bouzin, Yves Poumay, Pierre Gianello, Catherine Behets, Benoît Lengelé

Source: Frontiers in Bioengineering and Biotechnology, Vol 11 (2024)

Subject Terms: nipple–areolar complex, nipple–areolar complex reconstruction, tissue engineering, decellularization, recellularization, extracellular matrix, Biotechnology, TP248.13-248.65

File Description: electronic resource

Relation: https://www.frontiersin.org/articles/10.3389/fbioe.2023.1295075/full; https://doaj.org/toc/2296-4185

Access URL: https://doaj.org/article/e8d602918cad48169f66fe3a67d6c2ae

Analog fault coverage improvement using final-test dynamic part average testing

Authors: Dobbelaere, Wim, Vanhooren, Ronny, De Man, Willy, Matthijs, Koen, Coyette, Anthony, Esen, Baris, Gielen, Georges

Source: 2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-9 Nov, 2016

Relation: 2016 IEEE International Test Conference (ITC)

Effective DC fault models and testing approach for open defects in analog circuits

Authors: Esen, Baris, Coyette, Anthony, Gielen, Georges, Dobbelaere, Wim, Vanhooren, Ronny

Source: 2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-9 Nov, 2016

Relation: 2016 IEEE International Test Conference (ITC)