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1Conference
Authors: Gorsane, Rihab, Mestiri, Khalil Gorsan, Martinez, Daniel Tapia, Coyette, Vincent, Makhlouf, Beyrem, Vienken, Gereon, Truong, Minh Tri, Sohlke, Andreas, Hartleb, Johann, Kerkeni, Amine, Sturm, Irene, Kupper, Michael
Source: 2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC) Intelligent Transportation Systems (ITSC), 2023 IEEE 26th International Conference on. :874-879 Sep, 2023
Relation: 2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC)
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2Academic Journal
Authors: Xama, N., Gomez, J., Dobbelaere, W., Vanhooren, R., Coyette, A., Gielen, G.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(10):3426-3435 Oct, 2023
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3Conference
Authors: Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges
Source: 2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-4 May, 2023
Relation: 2023 IEEE European Test Symposium (ETS)
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4Report
Subject Terms: Computer Science - Computer Vision and Pattern Recognition
Access URL: http://arxiv.org/abs/2405.10954
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5Conference
Authors: Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Reorda, M.S., Ullmann, R., Vanhooren, R., Xama, N., Wu, L.
Source: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-10 Sep, 2022
Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)
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6Academic Journal
Authors: Gomez, J., Xama, N., Coyette, A., Vanhooren, R., Dobbelaere, W., Gielen, G.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 41(11):4771-4781 Nov, 2022
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7Report
Authors: Bonnet, Clément, Luo, Daniel, Byrne, Donal, Surana, Shikha, Abramowitz, Sasha, Duckworth, Paul, Coyette, Vincent, Midgley, Laurence I., Tegegn, Elshadai, Kalloniatis, Tristan, Mahjoub, Omayma, Macfarlane, Matthew, Smit, Andries P., Grinsztajn, Nathan, Boige, Raphael, Waters, Cemlyn N., Mimouni, Mohamed A., Sob, Ulrich A. Mbou, de Kock, Ruan, Singh, Siddarth, Furelos-Blanco, Daniel, Le, Victor, Pretorius, Arnu, Laterre, Alexandre
Access URL: http://arxiv.org/abs/2306.09884
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8Academic Journal
Authors: Gomez, J., Xama, N., Lootens, D., Coyette, A., Vanhooren, R., Dobbelaere, W., Gielen, G.
Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(9):4796-4802 Sep, 2022
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9Conference
Authors: Sunter, Stephen, Wolinski, Michal, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Xama, Nektar, Gomez, Jhon, Gielen, Georges
Source: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020
Relation: 2020 IEEE International Test Conference (ITC)
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10Conference
Authors: Coyette, Anthony, Dobbelaere, Wim, Vanhooren, Ronny, Xama, Nektar, Gomez, Jhon, Gielen, Georges
Source: 2020 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2020 IEEE. :1-6 May, 2020
Relation: 2020 IEEE European Test Symposium (ETS)
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11Conference
Authors: Xama, Nektar, Raymaekers, Jakob, Andraud, Martin, Gomez, Jhon, Dobbelaere, Wim, Vanhooren, Ronny, Coyette, Anthony, Gielen, Georges
Source: 2020 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2020 IEEE. :1-6 May, 2020
Relation: 2020 IEEE European Test Symposium (ETS)
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12Conference
Authors: Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges
Source: 2020 IEEE 38th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2020 IEEE 38th. :1-6 Apr, 2020
Relation: 2020 IEEE 38th VLSI Test Symposium (VTS)
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13Conference
Authors: Dobbelaere, Wim, Colle, Frederik, Coyette, Anthony, Vanhooren, Ronny, Xama, Nektar, Gomez, Jhon, Gielen, Georges
Source: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-4 Nov, 2019
Relation: 2019 IEEE International Test Conference (ITC)
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14Academic Journal
Authors: Marine Beeckman, Caroline Peeters, Maude Coyette, Liliane Marot, Halil Yildiz, Benoit Lengele, Marie Baeck
Source: JEADV Clinical Practice, Vol 3, Iss 1, Pp 271-274 (2024)
Subject Terms: augmentation mammoplasty, breast surgery, pathergy, postoperative pyoderma gangrenosum, postsurgical pyoderma gangrenosum, pyoderma gangrenosum, Dermatology, RL1-803, Diseases of the genitourinary system. Urology, RC870-923
File Description: electronic resource
Relation: https://doaj.org/toc/2768-6566
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15Conference
Authors: Gielen, Georges, Esen, Baris, Dobbelaer, Wim, Vanhooren, Ronny, Coyette, Anthony, Xama, Nektar
Source: 2018 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2018 IEEE International Symposium on. :1-4 May, 2018
Relation: 2018 IEEE International Symposium on Circuits and Systems (ISCAS)
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16Conference
Authors: Esen, Baris, Coyette, Anthony, Xama, Nektar, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges
Source: 2017 IEEE International Test Conference (ITC) Test Conference (ITC), 2017 IEEE International. :1-7 Oct, 2017
Relation: 2017 IEEE International Test Conference (ITC)
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17Conference
Authors: Xama, Nektar, Coyette, Anthony, Esen, Baris, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges
Source: 2017 22nd IEEE European Test Symposium (ETS) Test Symposium (ETS), 2017 22nd IEEE. :1-6 May, 2017
Relation: 2017 22nd IEEE European Test Symposium (ETS)
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18Academic Journal
Authors: Louis Maistriaux, Vincent Foulon, Lies Fievé, Daela Xhema, Robin Evrard, Julie Manon, Maude Coyette, Caroline Bouzin, Yves Poumay, Pierre Gianello, Catherine Behets, Benoît Lengelé
Source: Frontiers in Bioengineering and Biotechnology, Vol 11 (2024)
Subject Terms: nipple–areolar complex, nipple–areolar complex reconstruction, tissue engineering, decellularization, recellularization, extracellular matrix, Biotechnology, TP248.13-248.65
File Description: electronic resource
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19Conference
Authors: Dobbelaere, Wim, Vanhooren, Ronny, De Man, Willy, Matthijs, Koen, Coyette, Anthony, Esen, Baris, Gielen, Georges
Source: 2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-9 Nov, 2016
Relation: 2016 IEEE International Test Conference (ITC)
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20Conference
Source: 2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-9 Nov, 2016
Relation: 2016 IEEE International Test Conference (ITC)