-
1Conference
Authors: Vandooren, A., Stiers, K., Sheng, C., de Carvalho Cavalcante, C. Toledo, Hosseini, M., Batuk, D., Peng, A., Zhou, X., Mertens, H., Veloso, A., Mingardi, A., Kumar, S. Sarkar, Saroj, R. Kumar, D'have, K., Chiarella, T., Bommels, J., Loo, R., Rosseel, E., Porret, C., Shimura, Y., Akula, A., Choudhury, S., Brissonneau, V., Dupuy, E., Sarkar, T., Peter, A., Jourdan, N., Soulie, J.P., Vandersmissen, K., Iacovo, S., Montero, D., Vrancken, E., Sebaai, F., Gowda, P. Puttarame, Lai, K., Buccheri, N., Matagne, P., Chan, B. T., Marquez, A. Sepulveda, Langer, R., Koo, I. Gyo, Sanchez, E. Altamirano, Devriendt, K., Lazzarino, F., Mitard, J., Geypen, J., Grieten, E., Chen, Y-F., Verbeek, F., Pollenus, H., Heijlen, J., Lima, L.P.B., Holsteyns, F., Subramanian, S., Horiguchi, N., Demuynck, S., Biesemans, S.
Source: 2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024
Relation: 2024 IEEE International Electron Devices Meeting (IEDM)
-
2Report
Authors: Jin, C. -C., Li, D. -Y., Jiang, N., Dai, L. -X., Cheng, H. -Q., Zhu, J. -Z., Yang, C. -W., Rau, A., Baldini, P., Wang, T. -G., Zhou, H. -Y., Yuan, W., Zhang, C., Shu, X. -W., Shen, R. -F., Wang, Y. -L., Wen, S. -X., Wu, Q. -Y., Wang, Y. -B., Thomsen, L. L., Zhang, Z. -J., Zhang, W. -J., Coleiro, A., Eyles-Ferris, R., Fang, X., Ho, L. C., Hu, J. -W., Jin, J. -J., Li, W. -X., Liu, B. -F., Liu, F. -K., Liu, M. -J., Liu, Z., Lu, Y. -J., Merloni, A., Qiao, E. -L., Saxton, R., Soria, R., Wang, S., Xue, Y. -Q., Yang, H. -N., Zhang, B., Zhang, W. -D., Cai, Z. -M., Chen, F. -S., Chen, H. -L., Chen, T. -X., Chen, W., Chen, Y. -H., Chen, Y. -F., Chen, Y., Cordier, B., Cui, C. -Z., Cui, W. -W., Dai, Y. -F., Ding, H. -C., Fan, D. -W., Fan, Z., Feng, H., Garcia, J. A., Guan, J., Han, D. -W., Hou, D. -J., Hu, H. -B., Huang, M. -H., Huo, J., Jia, S. -M., Jia, Z. -Q., Jiang, B. -W., Jin, G., Kong, X., Kuulkers, E., Lei, W. -H., Li, C. -K., Li, J. -F., Li, L. -H., Li, M. -S., Li, W., Li, Z. -D., Lian, T. -Y., Ling, Z. -X., Liu, C. -Z., Liu, H. -Y, Liu, H. -Q., Liu, J. -F., Liu, Y., Lu, F. -J., Luo, L. -D., Ma, J., Mao, X., Mu, H. -Y., Nandra, K., O'Brien, P., Pan, H. -W., Pan, X., Qin, G. -J., Rea, N., Sanders, J., Song, L. -M., Sun, H., Sun, S. -L., Sun, X. -J., Tan, Y. -Y., Tang, Q. -J., Tao, Y. -H., Wang, B. -C., Wang, J., Wang, J. -F., Wang, L., Wang, W. -X., Wang, Y. -S., Wang, Z. -X., Wu, Q. -W., Wu, X. -F., Xu, H. -T., Xu, J. -J., Xu, X. -P., Xu, Y. -F., Xu, Z., Xue, C. -B., Xue, S. -J., Xue, Y. -L., Yan, A. -L., Yang, X. -T., Yang, Y. -J., Zhang, J., Zhang, M., Zhang, S. -N., Zhang, Y. -H., Zhang, Z., Zhang, Z. -L., Zhao, D. -H., Zhao, H. -S., Zhao, X. -F., Zhao, Z. -J., Zheng, J., Zhu, Q. -F., Zhu, Y. -X., Zhu, Z. -C., Zou, H.
Subject Terms: Astrophysics - High Energy Astrophysical Phenomena, Astrophysics - Astrophysics of Galaxies
Access URL: http://arxiv.org/abs/2501.09580
-
3Report
Authors: Sun, H., Li, W. -X., Liu, L. -D., Gao, H., Wang, X. -F., Yuan, W., Zhang, B., Filippenko, A. V., Xu, D., An, T., Ai, S., Brink, T. G., Liu, Y., Liu, Y. -Q., Wang, C. -Y., Wu, Q. -Y., Wu, X. -F., Yang, Y., Zhang, B. -B., Zheng, W. -K., Ahumada, T., Dai, Z. -G., Delaunay, J., Elias-Rosa, N., Benetti, S., Fu, S. -Y., Howell, D. A., Huang, Y. -F., Kasliwal, M. M., Karambelkar, V., Stein, R., Lei, W. -H., Lian, T. -Y., Peng, Z. -K., Ridnaia, A. V., Svinkin, D. S., Wang, X. -Y., Wang, A. -L., Wei, D. -M., An, J., Andrews, M., Bai, J. -M, Dai, C. -Y., Ehgamberdiev, S. A., Fan, Z., Farah, J., Feng, H. -C., Fynbo, J. P. U., Guo, W. -J., Guo, Z., Hu, M. -K., Hu, J. -W., Jiang, S. -Q., Jin, J. -J., Li, A., Li, J. -D., Li, R. -Z., Liang, Y. -F., Ling, Z. -X., Liu, X., Mao, J. -R., McCully, C., Mirzaqulov, D., Newsome, M., Gonzalez, E. Padilla, Pan, X., Terreran, G., Tinyanont, S., Wang, B. -T., Wang, L. -Z., Wen, X. -D., Xiang, D. -F., Xue, S. -J., Yang, J., Zhu, Z. -P., Cai, Z. -M., Castro-Tirado, A. J., Chen, F. -S., Chen, H. -L., Chen, T. -X., Chen, W., Chen, Y. -H., Chen, Y. -F., Chen, Y., Cheng, H. -Q., Cordier, B., Cui, C. -Z., Cui, W. -W., Dai, Y. -F., Fan, D. -W., Feng, H., Guan, J., Han, D. -W., Hou, D. -J., Hu, H. -B., Huang, M. -H., Huo, J., Jia, S. -M., Jia, Z. -Q., Jiang, B. -W., Jin, C. -C., Jin, G., Kuulkers, E., Li, C. -K., Li, D. -Y., Li, J. -F., Li, L. -H., Li, M. -S., Li, W., Li, Z. -D., Liu, C. -Z, Liu, H. -Y., Liu, H. -Q., Liu, M. -J., Lu, F. -J., Luo, L. -D., Ma, J., Mao, X., Nandra, K., O'Brien, P., Pan, H. -W., Rau, A., Rea, N., Sanders, J., Song, L. -M., Sun, S. -L., Sun, X. -J., Tan, Y. -Y., Tang, Q. -J., Tao, Y. -H., Wang, H., Wang, J., Wang, L., Wang, W. -X., Wang, Y. -L., Wang, Y. -S., Xiong, D. -R., Xu, H. -T., Xu, J. -J., Xu, X. -P., Xu, Y. -F., Xu, Z., Xue, C. -B., Xue, Y. -L., Yan, A. -L., Yang, H. -N., Yang, X. -T., Yang, Y. -J., Zhang, C., Zhang, J., Zhang, M., Zhang, S. -N., Zhang, W. -D., Zhang, W. -J., Zhang, Y. -H., Zhang, Z., Zhang, Z. -L., Zhao, D. -H., Zhao, H. -S., Zhao, X. -F., Zhao, Z. -J., Zhou, Y. -L., Zhu, Y. -X., Zhu, Z. -C.
Subject Terms: Astrophysics - High Energy Astrophysical Phenomena
Access URL: http://arxiv.org/abs/2410.02315
-
4Conference
Authors: Vega-Gonzalez, V., Stiers, K., Sheng, C., Demuynck, S., de Carvalho Cavalcante, C Toledo, Petersen, L., Chiarella, T., Boemmels, J., Sarkar, T., Vergel, N. Franchina, Radisic, D., Loo, R., Rosseel, E., Porret, C., Mannaert, G., Choudhury, S., Brissonneau, V., Dupuy, E., Peter, A., Jourdan, N., Soulie, J-P., Hakamata, T., Romo-Negreira, A., Clark, R., Vandersmissen, K., Sebaai, F., Gowda, P. Puttarame, Lai, J.G., Mingardi, A., Sarkar, S. Kumar, Chan, B. T., Marquez, A. Sepulveda, Langer, R., Koo, I. Gyo, Sanchez, E. Altamirano, Devriendt, K., Delgadillo, P. Rincon, Lazzarino, F., Mitard, J., Geypen, J., Batuk, D., Chen, Y-F., Verbeeck, F., Holsteyns, F., Subramanian, S., Tokei, Zs., Horiguchi, N., Biesemans, S.
Source: 2024 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2024 IEEE International. :1-3 Jun, 2024
Relation: 2024 IEEE International Interconnect Technology Conference (IITC)
-
5Report
Authors: Liu, Y., Sun, H., Xu, D., Svinkin, D. S., Delaunay, J., Tanvir, N. R., Gao, H., Zhang, C., Chen, Y., Wu, X. -F., Zhang, B., Yuan, W., An, J., Bruni, G., Frederiks, D. D., Ghirlanda, G., Hu, J. -W., Li, A., Li, C. -K., Li, J. -D., Malesani, D. B., Piro, L., Raman, G., Ricci, R., Troja, E., Vergani, S. D., Wu, Q. -Y., Yang, J., Zhang, B. -B., Zhu, Z. -P., Postigo, A. de Ugarte, Demin, A. G., Dobie, D., Fan, Z., Fu, S. -Y., Fynbo, J. P. U., Geng, J. -J., Gianfagna, G., Hu, Y. -D., Huang, Y. -F., Jiang, S. -Q., Jonker, P. G., Julakanti, Y., Kennea, J. A., Kokomov, A. A., Kuulkers, E., Lei, W. -H., Leung, J. K., Levan, A. J., Li, D. -Y., Li, Y., Littlefair, S. P., Liu, X., Lysenko, A. L., Ma, Y. -N., Martin-Carrillo, A., O'Brien, P., Parsotan, T., Quirola-Vasquez, J., Ridnaia, A. V., Ronchini, S., Rossi, A., Mata-Sanchez, D., Schneider, B., Shen, R. -F., Thakur, A. L., Tohuvavohu, A., Torres, M. A. P., Tsvetkova, A. E., Ulanov, M. V., Wei, J. -J., Xiao, D., Yin, Y. -H. I., Bai, M., Burwitz, V., Cai, Z. -M., Chen, F. -S., Chen, H. -L., Chen, T. -X., Chen, W., Chen, Y. -F., Chen, Y. -H., Cheng, H. -Q., Cui, C. -Z., Cui, W. -W., Dai, Y. -F., Dai, Z. -G., Eder, J., Fan, D. -W., Feldman, C., Feng, H., Feng, Z., Friedrich, P., Gao, X., Guan, J., Han, D. -W, Han, J., Hou, D. -J., Hu, H. -B., Hu, T., Huang, M. -H., Huo, J., Hutchinson, I., Ji, Z., Jia, S. -M., Jia, Z. -Q., Jiang, B. -W., Jin, C. -C., Jin, G., Jin, J. -J., Keereman, A., Lerman, H., Li, J. -F., Li, L. -H., Li, M. -S., Li, W., Li, Z. -D., Lian, T. -Y., Liang, E. -W., Ling, Z. -X., Liu, C. -Z., Liu, H. -Y., Liu, H. -Q., Liu, M. -J., Liu, Y. -R., Lu, F. -J., LU, H. -J., Luo, L. -D., Ma, F. L., Ma, J., Mao, J. -R., Mao, X., McHugh, M., Meidinger, N., Nandra, K., Osborne, J. P., Pan, H. -W., Pan, X., Ravasio, M. E., Rau, A., Rea, N., Rehman, U., Sanders, J., Santovincenzo, A., Song, L. -M., Su, J., Sun, L. -J., Sun, S. -L., Sun, X. -J., Tan, Y. -Y., Tang, Q. -J., Tao, Y. -H., Tong, J. -Z., Wang, H., Wang, J., Wang, L., Wang, W. -X., Wang, X. -F., Wang, X. -Y., Wang, Y. -L., Wang, Y. -S., Wei, D. -M., Willingale, R., Xiong, S. -L., Xu, H. -T., Xu, J. -J., Xu, X. -P., Xu, Y. -F., Xu, Z., Xue, C. -B., Xue, Y. -L., Yan, A. -L., Yang, F., Yang, H. -N., Yang, X. -T., Yang, Y. -J, Yu, Y. -W., Zhang, J., Zhang, M., Zhang, S. -N., Zhang, W. -D., Zhang, W. -J., Zhang, Y. -H., Zhang, Z., Zhang, Z. -L., Zhao, D. -H., Zhao, H. -S., Zhao, X. -F., Zhao, Z. -J., Zhou, L. -X., Zhou, Y. -L., Zhu, Y. -X., Zhu, Z. -C., Zuo, X. -X.
Subject Terms: Astrophysics - High Energy Astrophysical Phenomena
Access URL: http://arxiv.org/abs/2404.16425
-
6Conference
Authors: Bi, J. G., Xu, Y., Jiang, J. P., Du, F., Du, J. C., Chen, Y. F., Zhou, J. B.
Source: 2022 IEEE 5th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2022 IEEE 5th International. :3564-3568 May, 2022
Relation: 2022 IEEE 5th International Electrical and Energy Conference (CIEEC)
-
7Report
Authors: Ling, Z. X., Sun, X. J., Zhang, C., Sun, S. L., Jin, G., Zhang, S. N., Zhang, X. F., Chang, J. B., Chen, F. S., Chen, Y. F., Cheng, Z. W., Fu, W., Han, Y. X., Li, H., Li, J. F., Li, Y., Li, Z. D., Liu, P. R., Lv, Y. H., Ma, X. H., Tang, Y. J., Wang, C. B., Xie, R. J., Xue, Y. L., Yan, A. L., Zhang, Q., Bao, C. Y., Cai, H. B., Cheng, H. Q., Cui, C. Z., Dai, Y. F., Fan, D. W., Hu, H. B., Hu, J. W., Huang, M. H., Jia, Z. Q., Jin, C. C., Li, D. Y., Li, J. Q., Liu, H. Y., Liu, M. J., Liu, Y., Pan, H. W., Qiu, Y. L., Sugizaki, M., Sun, H., Wang, W. X., Wang, Y. L., Wu, Q. Y., Xu, X. P., Xu, Y. F., Yang, H. N., Yang, X., Zhang, B., Zhang, M., Zhang, W. D., Zhang, Z., Zhao, D. H., Cong, X. Q., Jiang, B. W., Li, L. H., Qiu, X. B., Sun, J. N., Su, D. T., Wang, J., Wu, C., Xu, Z., Yang, X. M., Zhang, S. K., Zhang, N., Zhu, Y. F., Ban, H. Y., Bi, X. Z., Cai, Z. M., Chen, W., Chen, X., Chen, Y. H., Cui, Y., Duan, X. L., Feng, Z. G, Gao, Y., He, J. W., He, T., Huang, J. J., Li, F., Li, J. S., Li, T. J., Li, T. T., Liu, H. Q., Liu, L., Liu, R., Liu, S., Meng, N., Shi, Q., Sun, A. T., Wang, Y. M., Wang, Y. B., Wu, H. C., Xu, D. X, Yang, Y. Q, Yang, Y., Yu, X. S., Zhang, K. X., Zhang, Y. L., Zhang, Y. H., Zhang, Y. T., Zhou, H., Zhu, X. C., Cheng, J. S., Qin, L., Wang, L., Wang, Q. L., Bai, M., Gao, R. L., Ji, Z., Liu, Y. R., Ma, F. L., Shi, Y. J., Su, J., Tan, Y. Y., Tong, J. Z., Xu, H. T., Xue, C. B., Xue, G. F., Yuan, W.
Subject Terms: Astrophysics - Instrumentation and Methods for Astrophysics, High Energy Physics - Experiment, Physics - Instrumentation and Detectors
Access URL: http://arxiv.org/abs/2305.14895
-
8Report
Authors: Zhang, C., Ling, Z. X., Sun, X. J., Sun, S. L., Liu, Y., Li, Z. D., Xue, Y. L., Chen, Y. F., Dai, Y. F., Jia, Z. Q., Liu, H. Y., Zhang, X. F., Zhang, Y. H., Zhang, S. N., Chen, F. S., Cheng, Z. W., Fu, W., Han, Y. X., Li, H., Li, J. F., Li, Y., Liu, P. R., Ma, X. H., Tang, Y. J., Wang, C. B., Xie, R. J., Yan, A. L., Zhang, Q., Jiang, B. W., Jin, G., Li, L. H., Qiu, X. B., Su, D. T., Sun, J. N., Xu, Z., Zhang, S. K., Zhang, Z., Zhang, N., Bi, X. Z., Cai, Z. M., He, J. W., Liu, H. Q., Zhu, X. C., Cheng, H. Q., Cui, C. Z., Fan, D. W., Hu, H. B., Huang, M. H., Jin, C. C., Li, D. Y., Pan, H. W., Wang, W. X., Xu, Y. F., Yang, X., Zhang, B., Zhang, M., Zhang, W. D., Zhao, D. H., Bai, M., Ji, Z., Liu, Y. R., Ma, F. L., Su, J., Tong, J. Z., Wang, Y. S., Zhao, Z. J., Feldman, C., O'Brien, P., Osborne, J. P., Willingale, R., Burwitz, V., Hartner, G., Langmeier, A., Müller, T., Rukdee, S., Schmidt, T., Kuulkers, E., Yuan, W.
Subject Terms: Astrophysics - High Energy Astrophysical Phenomena, Astrophysics - Instrumentation and Methods for Astrophysics
Access URL: http://arxiv.org/abs/2211.10007
-
9Conference
Authors: Tung, W.-F., Wu, F.-H., Chan, P.-C., Lin, H.-H., Chen, Y.-F., Lin, C.-S.
Source: 2020 International Symposium on Computer, Consumer and Control (IS3C) IS3C Computer, Consumer and Control (IS3C), 2020 International Symposium on. :49-52 Nov, 2020
Relation: 2020 International Symposium on Computer, Consumer and Control (IS3C)
-
10Conference
Authors: Liu, X. W., Li, H. Q., Zhang, C., Liao, J. P., Zhong, L. S., Xi, B. F., Chen, Y. F., Zheng, Y. Y., Yu, S. M.
Source: 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2020 IEEE Conference on. :219-222 Oct, 2020
Relation: 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
-
11Conference
Authors: Ku, K.-N., Chang, P.-C., Wang, C.-C., Lin, C.-Y., Hsu, C.-H., Chen, T.-H., Huang, C.-Y., Lee, C.-S., Chen, Y.-F., Chou, K.-W., Chen, S.-C., Lee, M.-C., Lin, C.-C., Chu, M.-T., Wu, C.-I.
Source: 2020 Opto-Electronics and Communications Conference (OECC) Opto-Electronics and Communications Conference (OECC), 2020. :1-3 Oct, 2020
Relation: 2020 Opto-Electronics and Communications Conference (OECC)
-
12Conference
Authors: Su, Ming-Sin, Wang, Chang-Ning, Tsai, Clair, Yang, T. L., Yang, Rolance, Wu, W. C., Liu, C. S., Chiu, J. M., Chen, Y. F., Pang, Ponder, Ku, Harry, Wang, Kirin, Su, C.H., Hsu, Steven, Lu, Calvin, Liu, K. C., Liao, Marvin
Source: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2019 IEEE 69th. :1175-1178 May, 2019
Relation: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC)
-
13Academic Journal
Authors: Chen, Y. F.1, Huang, C.1,2, Yan, W. H.1, He, G. P.1, Zhang, S. X.3, zhangsx@stdu.edu.cn
Source: Journal of Applied Fluid Mechanics; Sep2024, Vol. 17 Issue 9, p1885-1895, 11p
-
14Conference
Authors: Wan, J., Deng, J N., Cao, X Y., Liu, H B., Lu, B R., Chen, Y F., Zaslavsky, A., Cristoloveanu, S., Bawedin, M.
Source: 2018 18th International Workshop on Junction Technology (IWJT) Junction Technology (IWJT), 2018 18th International Workshop on. :1-4 Mar, 2018
Relation: 2018 18th International Workshop on Junction Technology (IWJT)
-
15Conference
Authors: West, M., Chen, Y.-F., Nguyen, F., Cournoyer, B.
Source: Annual forum proceedings. 78(2):1291-1297
-
16Conference
Authors: Bao, K., Yi, X. J., Chen, Y. F., Zhang, Z.
Source: 2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) Industrial Engineering and Engineering Management (IEEM), 2017 IEEE International Conference on. :2135-2139 Dec, 2017
Relation: 2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)
-
17Conference
Authors: Yao, B. C., Wu, Y., Yu, C. B., He, J. R., Rao, Y. J., Gong, Y., Chen, Y. F., Li, Y. R.
Source: 2017 25th Optical Fiber Sensors Conference (OFS) Optical Fiber Sensors Conference (OFS), 2017 25th. :1-4 Apr, 2017
Relation: 2017 25th Optical Fiber Sensors Conference (OFS)
-
18Conference
Authors: Xie, X. Y., Qin, H., Hong, G., Chen, Y. F., Zeng, K.
Source: 2016 16th International Conference on Ground Penetrating Radar (GPR) Ground Penetrating Radar (GPR), 2016 16th International Conference on. :1-5 Jun, 2016
Relation: 2016 16th International Conference on Ground Penetrating Radar (GPR)
-
19Conference
Authors: Xie, X. Y., Chen, Y. F., Zhou, B.
Source: 2016 16th International Conference on Ground Penetrating Radar (GPR) Ground Penetrating Radar (GPR), 2016 16th International Conference on. :1-5 Jun, 2016
Relation: 2016 16th International Conference on Ground Penetrating Radar (GPR)
-
20Conference
Authors: Deng, J. N., Shao, J. H., Lu, B. R., Chen, Y. F., Zaslavsky, A., Cristoloveanu, S., Bawedin, M., Wan, J.
Source: 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017 IEEE. :1-3 Oct, 2017
Relation: 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)