-
1Report
Authors: Shao, Y. H., Chen, S. Y., Yang, H. Z., Xi, F., Hong, H., Liu, Z.
Access URL: http://arxiv.org/abs/2405.16889
-
2Conference
Authors: Huang, X. G., Chen, S. Y.
Source: 2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT) Microwave and Millimeter Wave Technology (ICMMT), 2023 International Conference on. :1-3 May, 2023
Relation: 2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)
-
3Report
-
4
-
5Academic Journal
Authors: Lin, P.-C, Chen, S.-Y, Kuo, H.-Y, Lin, F.-R
Source: Journal of Education and Learning. 2022 11(4):31-40.
Peer Reviewed: Y
Page Count: 10
Descriptors: Higher Education, Foreign Countries, Majors (Students), Undergraduate Study, Undergraduate Students, Student Attitudes, Self Management, Design, Independent Study, Human Capital, Self Concept
Geographic Terms: Taiwan
-
6Conference
Authors: Chen, S. Y., Yang, W., Xu, G. F., Liu, C. T.
Source: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-4 Sep, 2021
Relation: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
-
7Conference
Authors: Lou, H. B., Chen, S. Y., Chen, J. R., Huang, X. G.
Source: 2021 13th International Symposium on Antennas, Propagation and EM Theory (ISAPE) Antennas, Propagation and EM Theory (ISAPE), 2021 13th International Symposium on. Volume1:1-3 Dec, 2021
Relation: 2021 13th International Symposium on Antennas, Propagation and EM Theory (ISAPE)
-
8Conference
Authors: Lee, G.G., Huang, C.-W., Chen, J.-H., Chen, S.-Y., Chen, H.-L.
Source: TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON) Region 10 Conference, TENCON, 2019 - 2019 IEEE. :802-805 Oct, 2019
Relation: TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)
-
9Report
-
10Report
Authors: Wu, K. Y., Chen, S. Y., Sun, G. A., Peng, S. M., Peng, M., Yan, H.
Subject Terms: Nuclear Experiment
Access URL: http://arxiv.org/abs/2109.13847
-
11Report
Authors: Wu, K. Y., Chen, S. Y., Gong, J., Peng, M., Yan, H.
Subject Terms: High Energy Physics - Experiment, Nuclear Experiment
Access URL: http://arxiv.org/abs/2109.06866
-
12Periodical
Authors: Tang, W. J., Chen, S. Y., Hu, W. K.
Source: AJR. 220(6):817-824
-
13Periodical
Authors: Chen, S.-Y., Chao, C.-N., Huang, H.-Y., Zhao, P.-W., Fang, C.-Y.
Source: Anticancer research. 43(3):1175-1184
-
14Academic Journal
Authors: Srida, M., Chen, S.-Y., Smith, S.M., Ngamcharussrivichai, C., Boonyuen, S., Tateno, H., Mochizuki, T., Luengnaruemitchai, A.
Source: In Materials Today Sustainability December 2023 24
-
15Report
Authors: Xu, Z. Y., Xiao, C. F., Lu, H. Y., Hu, R. H., Yu, J. Q., Gong, Z., Shou, Y. R., Liu, J. X., Xie, C. Z., Chen, S. Y., Lu, H. G., Xu, T. Q., Li, R. X., Hafz, N., Najmudin, Z., Rajeev, P. P., Neely, D., Yan, X. Q.
Source: Phys. Rev. Accel. Beams 23, 091301 (2020)
Subject Terms: Physics - Plasma Physics
Access URL: http://arxiv.org/abs/1905.05096
-
16Academic Journal
Authors: Chen, S. Y.1 chenshuya202310@126.com, Wang, W.2
Source: Chalcogenide Letters. Apr2024, Vol. 21 Issue 4, p293-304. 12p.
Subject Terms: *CONDUCTION bands, *ELASTICITY, *VALENCE bands, *CHALCOGENIDES, *BAND gaps, *ELASTIC constants, *CHALCOGENIDE glass, *PEROVSKITE
-
17Conference
Authors: Chen, S. Y., Lin, C. C., Hsieh, C. L.
Source: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :144-147 Jul, 2016
Relation: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
-
18Conference
Authors: Pan, C. T., Lin, C. H., Huang, Y. S., Chen, S. Y., Yang, T. L., Ou, C. H., Chen, L. Y., Huang, J. C., Lin, D. Y., Jang, J. S. C., Lin, H. K.
Source: 2016 International Conference on Applied System Innovation (ICASI) Applied System Innovation (ICASI), 2016 International Conference on. :1-4 May, 2016
Relation: 2016 International Conference on Applied System Innovation (ICASI)
-
19Conference
Authors: Lee, M. H., Kuo, C.Y., Tang, C.-H., Chen, H.-H., Liao, C.-Y., Hong, R.-C., Gu, S-S., Chou, Y.-C., Wang, Z.-Y., Chen, S.-Y., Chen, P.-G., Liao, M.-H., Li, K.-S.
Source: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2018 IEEE 2nd. :271-273 Mar, 2018
Relation: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
-
20Conference
Authors: Lin, C. C., Chen, S. Y., Wang, J., Hsieh, C. L.
Source: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :193-196 Jun, 2015
Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)