Investigation of Cryogenic Current-Voltage Anomalies in SiGe HBTs: Role of Base-Emitter Junction Inhomogeneities

Authors: Naik, Nachiket R., Gabritchidze, Bekari, Chen, Justin H., Kooi, Jacob, Cleary, Kieran A., Minnich, Austin J.

Subject Terms: Physics - Instrumentation and Detectors, Physics - Applied Physics

Access URL: http://arxiv.org/abs/2302.14210

Investigation of cryogenic current–voltage anomalies in SiGe HBTs: Role of base–emitter junction inhomogeneities.

Authors: Naik, Nachiket R.¹, Gabritchidze, Bekari², Chen, Justin H.¹, Cleary, Kieran A.², Kooi, Jacob³, Minnich, Austin J.¹, aminnich@caltech.edu

Source: Journal of Applied Physics; 4/28/2024, Vol. 135 Issue 16, p1-7, 7p

Experimental Investigation of Drain Noise in High Electron Mobility Transistors: Thermal and Hot Electron Noise

Authors: Gabritchidze, Bekari, Chen, Justin H., Cleary, Kieran A., Readhead, Anthony C., Minnich, Austin J.

Source: IEEE Transactions on Electron Devices; October 2024, Vol. 71 Issue: 10 p5925-5932, 8p

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