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1Academic Journal
Authors: Petralia, S., Castorina, S., Maugeri, L., Messina, M.A., Ruggieri, M., Neri, G., Ferlazzo, A., Sardini, E., Serpelloni, M., Bellitti, P., Ando, B.
Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(20):31741-31753 Oct, 2024
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2Academic Journal
Authors: Ando, B., Baglio, S., Castorina, S., Graziani, S., Tondepu, S.V.G., Petralia, S., Messina, M.A., Maugeri, L., Neri, G., Ferlazzo, A.
Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-11 2022
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3Conference
Authors: Ando, B., Baglio, S., Castorina, S., Crispino, R., Marletta, V.
Source: 2020 IEEE Sensors Applications Symposium (SAS) Sensors Applications Symposium (SAS), 2020 IEEE. :1-6 Mar, 2020
Relation: 2020 IEEE Sensors Applications Symposium (SAS)
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4Academic Journal
Authors: Ando, B., Baglio, S., Castorina, S., Crispino, R., Marletta, V.
Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 70:1-10 2021
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5Conference
Authors: Ando, B., Baglio, S., Castorina, S., Crispino, R., Marletta, V.
Source: 2019 IEEE International Symposium on Measurements & Networking (M&N) Measurements & Networking (M&N), 2019 IEEE International Symposium on. :1-6 Jul, 2019
Relation: 2019 IEEE International Symposium on Measurements & Networking (M&N)
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6Academic Journal
Authors: Ando, B., Baglio, S., Castorina, S., Crispino, R., Marletta, V.
Source: IEEE Instrumentation & Measurement Magazine IEEE Instrum. Meas. Mag. Instrumentation & Measurement Magazine, IEEE. 23(4):33-40 Jun, 2020
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7Conference
Authors: Ando, B., Baglio, S., Castorina, S., Crispino, R., Marletta, V.
Source: 2019 IEEE Sensors Applications Symposium (SAS) Sensors Applications Symposium (SAS), 2019 IEEE. :1-5 Mar, 2019
Relation: 2019 IEEE Sensors Applications Symposium (SAS)
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8Conference
Authors: Ando, B., Baglio, S., Castorina, S., Crispino, R., Marletta, V.
Source: 2019 IEEE Sensors Applications Symposium (SAS) Sensors Applications Symposium (SAS), 2019 IEEE. :1-6 Mar, 2019
Relation: 2019 IEEE Sensors Applications Symposium (SAS)
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9Academic Journal
Authors: Zeng, Jianming1, Wang, Zhengzhen2, wangzz@lut.edu.cn, Chen, Xuwei2, Lian, Na2, Li, Feng1, Vieira, Castorina S., cvieira@fe.up.pt
Source: Advances in Civil Engineering; 9/16/2024, Vol. 2024, p1-10, 10p
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10Conference
Authors: Badalà, P., Smecca, E., Rascunà, S., Bongiorno, C., Carria, E., Bassi, A., Bellocchi, G., Castorina, S., Tringali, C., La Magna, A.
Source: Materials science forum. 1062:417-421
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11Periodical
Authors: Andò, B., Baglio, S., Castorina, S., Graziani, S., Trigona, C.
Source: Lecture notes in electrical engineering. 918:322-332
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12Academic Journal
Authors: Zhang, Yurong1, Zhang, Wen1,2, 516061874@qq.com, Fan, Yanbin3, Liu, Shiyi1, He, Yunxiu1, Zou, Yi1, Vieira, Castorina S., cvieira@fe.up.pt
Source: Advances in Civil Engineering; 6/28/2024, Vol. 2024, p1-12, 12p
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13Academic Journal
Source: E3S Web of Conferences, Vol 544, p 10005 (2024)
Subject Terms: pullout test, soil-geogrid interaction, cyclic and post-cyclic interface response, residual soil from granite, Environmental sciences, GE1-350
File Description: electronic resource
Relation: https://www.e3s-conferences.org/articles/e3sconf/pdf/2024/74/e3sconf_is-porto2024_10005.pdf; https://doaj.org/toc/2267-1242
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14Conference
Authors: Baglio, S., Castorina, S., Ganci, G., Savalli, N.
Source: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE. 2:1542-1545 Vol.2 2004
Relation: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference
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15Conference
Authors: Baglio, S., Castorina, S., Sacco, V., Savalli, N., Tringali, C.
Source: Proceedings of IEEE Sensors, 2004. IEEE sensors 2004 Sensors, 2004. Proceedings of IEEE. :103-106 vol.1 2004
Relation: Proceedings of the IEEE Sensors 2004
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16Conference
Authors: Baglio, S., Bulsara, A.R., Castorina, S., In, V., Sacco, V.
Source: Proceedings of IEEE Sensors, 2004. IEEE sensors 2004 Sensors, 2004. Proceedings of IEEE. :1573-1576 vol.3 2004
Relation: Proceedings of the IEEE Sensors 2004
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17Conference
Authors: Baglio, S., Castorina, S., Fortuna, L., Bernstein, G.H., Porod, W.
Source: 2003 Third IEEE Conference on Nanotechnology, 2003. IEEE-NANO 2003. Nanotechnology, IEEE-NANO 2003 Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on. 1:303-306 vol.2 2003
Relation: IEEE Conference on Nanotechnology
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18Conference
Authors: Ando, B., Baglio, S., Bulsara, A.R., Caruso, V., Castorina, S.
Source: Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE. 1:600-604 2003
Relation: 2003 Instrumentation and Measurement Technology Conference (IMTC 2003)
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19Conference
Authors: Baglio, S., Savalli, N., Castorina, S.
Source: Proceedings of IEEE Sensors Sensors 2002 Sensors, 2002. Proceedings of IEEE. 2:1069-1074 vol.2 2002
Relation: Proceedings of IEEE SENSORS 2002
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20Conference
Authors: Baglio, S., Castorina, S., Fortuna, L., Savalli, N.
Source: Proceedings of IEEE Sensors Sensors 2002 Sensors, 2002. Proceedings of IEEE. 1:192-197 vol.1 2002
Relation: Proceedings of IEEE SENSORS 2002